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Phenom xl sem

Manufactured by Thermo Fisher Scientific
Sourced in Japan, United States, Netherlands

The Phenom XL SEM is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It provides accurate and reliable results for a range of applications. The core function of the Phenom XL SEM is to generate high-quality images and data using a focused electron beam.

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5 protocols using phenom xl sem

1

Scanning Electron Microscopy of Nabis rugosus Antennae

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Nabis rugosus specimens preserved in ethanol were used. The antennae were detached from the head with scalpels using an Olympus stereomicroscope (SZX7) and washed using an ultrasound cleaner (Polsonic, Warsaw, Poland) for about a minute. The antennae were dehydrated using ethanol solutions ranging from 80% to 90% for 15 min, bathed twice with absolute ethanol for about 10 min, and then dried at room temperature. These specimens were placed over the carbon tapes and, to enhance the conductivity of these materials, the surfaces were coated with gold spray sputter (20 nm) using a Quorum 150T ES Plus (Quorum Technologies, Laughton, East Sussex, UK). At the Faculty of Natural Sciences of the University of Silesia in Katowice, images of these specimens were captured using a Hitachi UHR FE-SEM SU 8010 (High Technologies, Tokyo, Japan) and Phenom XL SEM (Phenom-World, the Netherlands) [16 (link)].
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2

SEM Imaging of Bromalite Inclusions

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The SEM images of internal inclusions from selected bromalites were taken using the Phenom XL SEM, PhenomWorld (ThermoFisher Scientific, Eindhoven, The Netherlands) equipped with an energy-dispersive X-ray spectroscopy (EDS) detector, installed in the Faculty of Natural Sciences, University of Silesia in Katowice in low-vacuum settings with accelerating voltage 15 kV. Composite images were collected using Phenom SEM software, then stitched and processed using Image Composite Editor by Microsoft Research.
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3

Alginate Hydrosol Coating and Imaging

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Lyophilized 0.5% alginate hydrosols were C-coated using an EMITECH K950X Turbo Evaporator (Quorum Technologies Ltd., UK). All samples were imaged in a Phenom XL SEM (Phenom-World B.V., The Netherlands) under high vacuum at 5 kV and a 5 mm working distance.
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4

SEM Analysis of Dough and Pizza Microstructure

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SEM analyses were conducted for the evaluation of dough samples at selected leavening times. Lyophilized dough slices [25 (link)] were placed on specimen holders and coated with gold by means of DC sputtering (Sputter and Carbon Coater Agar Scientific B7340). The microstructure of samples was observed at a magnification of 2000× with a LEO EVO 40 SEM (Zeiss, Oberkochen, Germany) with a 10 kV acceleration voltage. Representative micrographs from all the samples were selected. The microstructure of lyophilized wood oven pizza base samples was observed at a magnification of 2000× by a Phenom XL SEM (Thermo Scientific, Inc., Waltham, MA, USA) equipped with an ion sputter coater.
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5

SEM Analysis of DPSC-Titanium Interactions

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SEM analyses were then performed to evaluate the relationship between DPSCs and the titanium disc surfaces. Cells were fixed on the titanium with 1.25% glutaraldehyde in 0.1 M cacodylate buffer at pH 7.2 for 30 min. Subsequently, they were dehydrated with alcohol series and dried with hexamethyldisilazane. Images were obtained at 15 kV with a Phenom XL SEM microscope (Thermo Fisher Scientific, Eindhoven, Netherlands).
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