Jem 2000ex
The JEM-2000EX is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the atomic scale. It features a high-brightness electron source, advanced optics, and a range of analytical capabilities to support materials science research and development.
Lab products found in correlation
95 protocols using jem 2000ex
Isolation and Characterization of Propylene-Assimilating Bacteria
Characterization of Extracellular Vesicles
Characterizing Surface Morphologies of Nanomaterials
Characterization of Enzymatically Hydrolyzed Bamboo LCNFs
The crystalline characteristics of LCNFs were determined using XRD (RINT 2000, Rigaku Corporation, Tokyo, Japan). For X-ray analyses, disks that were 1 cm in diameter, 0.8 mm in thickness, and 0.1 g in weight were prepared from the freeze-dried samples. Ni-filtered Cu Kα radiation (λ = 0.1542 nm) was employed at an accelerating voltage of 200 kV and a current of 40 mA. The diffracted intensity (I) was determined in the 2θ range of 5°–40° at a rate of 2°/min. The crystallinity index (CrI) was calculated using Segal’s method (formula (1)) [29 (link)].
where I200 is the crystalline intensity and Iamor is the amorphous intensity.
Transmission Electron Microscopy of PRECs
Comprehensive Materials Characterization
by XRD using a Bragg–Brentano diffractometer (D8-tools, Germany)
equipped with a Cu Kα (λ = 0.15418 nm) emitting source.
Scanning electron microscope images were taken on a JSM-6700F field-emission
scanning electron microscope from JEOL Co., Japan. TEM, HRTEM, and
SAED were carried out using a JEM-2000EX instrument from JEOL Co.,
Japan. XPS was measured on an Escalab-250 instrument from Thermo Fisher
Scientific, USA with a hemisphere detector and a monochromatic Al
Kα radiation source (1486.6 eV).
Ultrastructural Analysis of Dioscin-Treated Cells
Comprehensive Characterization of Graphitic Materials
Plasma-Derived Extracellular Vesicle Isolation
The morphology of EVs was then observed under a transmission electron microscope (TEM; JEM-2000EX; JEOL, Tokyo, Japan). Nanoparticle tracking analyzer (NS300, Malvern Instruments, Malvern, UK) was used to measure the size distribution of EVs. The expression of EV markers (CD63, CD81, Alix and Calnexin) was detected with the help of western blot analysis, with the used antibodies including anti-CD63 (1:1000, 25682-1-AP, Proteintech ProteinTech Group, Chicago, IL), anti-CD81 (1:1000, 66866-1-Ig, Proteintech), Alix (1:1000, 12422-1-AP, Proteintech) and Calnexin (1:1000, ab133615, Abcam).
TEM Analysis of Nanoparticle Morphology
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