IONP size and morphology were determined by field emission high- resolution scanning electron microscopy (SEM) with a Hitachi- S4800 HR instrument set at 30 kV and by transmission electron microscopy (TEM) imaging with a JEOL TEM-2200FS instrument. Samples were prepared by dropping the nanoparticle suspension on a 400-mesh carbon grid and drying it in a vacuum oven for 2 h. X-ray powder diffraction (XRD) patterns were collected using a Rigaku XRD Ultima IV instrument to study the structural properties of IONPs. X-ray photoelectron spectra (XPS) were taken on a Kratos AXIS 165 electron spectrometer with 150 W monochromatized A1 Kα radiation (1486.6 eV), whereby all peaks were referred to the signature C1s peak for adventitious carbon at 284.8 eV.
Axis 165
The AXIS 165 is a high-performance liquid chromatography (HPLC) system designed for efficient and reliable analytical separations. It features a compact and modular design, allowing for easy integration into laboratory workflows. The AXIS 165 system includes a precise solvent delivery unit, an autosampler, and a sensitive UV-Vis detector, providing the essential components for conducting chromatographic analyses.
Lab products found in correlation
12 protocols using axis 165
Characterization of Iron Oxide Nanoparticles
IONP size and morphology were determined by field emission high- resolution scanning electron microscopy (SEM) with a Hitachi- S4800 HR instrument set at 30 kV and by transmission electron microscopy (TEM) imaging with a JEOL TEM-2200FS instrument. Samples were prepared by dropping the nanoparticle suspension on a 400-mesh carbon grid and drying it in a vacuum oven for 2 h. X-ray powder diffraction (XRD) patterns were collected using a Rigaku XRD Ultima IV instrument to study the structural properties of IONPs. X-ray photoelectron spectra (XPS) were taken on a Kratos AXIS 165 electron spectrometer with 150 W monochromatized A1 Kα radiation (1486.6 eV), whereby all peaks were referred to the signature C1s peak for adventitious carbon at 284.8 eV.
Characterizing Novel Nanoparticle Formulations
Characterization of Cycled Solid-State Electrolytes
Multi-Modal Characterization of Nanostructures
Comprehensive Photocatalyst Characterization
Germanium Nanowire Characterization Protocol
Multimodal Characterization of Nanomaterials
and morphology
of the prepared samples was observed with a Hitachi SU-70 FEG-SEM
at 10 kV, a JEOL 2100 LaB6 TEM operated at 200 kV, and
a JEOL TEM/STEM FEG also operated at 200 kV. A 22 mrad probe convergence
angle was used to perform STEM imaging. HAADF detector in the JEOL
2100 FEG TEM with 90 mrad inner-detector angle was utilized to obtain
the Z-contrast atomic resolution images. For EDS
data collection, an Oxford X-max 100TLE windowless X-ray detector
was utilized. The average particle size and distribution were determined
by ImageJ software using at least three microscopy images per sample.
Raman measurements were performed with a Labram Aramis model by Horiba
Jobin-Yvon using a 532 nm laser and an integration time of 4 s, which
was repeated at least four times per sample. XPS analysis was performed
on a Kratos Axis 165 X-ray photoelectron spectrometer. XRD data was
collected by a D8 Advanced (Bruker AXS, Fitchburg, WI, USA).
Characterization of Nanomaterials Using Spectroscopy
Comprehensive Characterization of Gel Materials
XPS Analysis of Material Composition
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