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12 protocols using axis 165

1

Characterization of Iron Oxide Nanoparticles

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To determine the density of DNA probes on the IONPs surface, the reaction was conducted as above, and the supernatant as well as three previous washes were collected right after the reaction was completed. DNA concentration was estimated using Quant-iT OliGreen ssDNA Assay Kit (Thermo Fisher Scientific).
IONP size and morphology were determined by field emission high- resolution scanning electron microscopy (SEM) with a Hitachi- S4800 HR instrument set at 30 kV and by transmission electron microscopy (TEM) imaging with a JEOL TEM-2200FS instrument. Samples were prepared by dropping the nanoparticle suspension on a 400-mesh carbon grid and drying it in a vacuum oven for 2 h. X-ray powder diffraction (XRD) patterns were collected using a Rigaku XRD Ultima IV instrument to study the structural properties of IONPs. X-ray photoelectron spectra (XPS) were taken on a Kratos AXIS 165 electron spectrometer with 150 W monochromatized A1 Kα radiation (1486.6 eV), whereby all peaks were referred to the signature C1s peak for adventitious carbon at 284.8 eV.
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2

Characterizing Novel Nanoparticle Formulations

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AFM and TEM (JEM-2010F, JEOL) were used to measure the sizes and morphologies of the EA-Fe@BSA NPs. The hydrated particle size of the NPs was determined using a Malvern Zetasizer Nano ZS. The surface ion valency and composition of the NPs were measured by XPS (Axis 165, Kratos). Fluorescence spectra were recorded using a fluorescence spectrophotometer (Cary Eclipse, Agilent). NIR absorption spectra were measured using a UV-vis spectrophotometer (DU 730, Beckman Coulter). FT-IR spectra were obtained using a FT-IR spectrophotometer (Nicolet Avatar 370, Thermo).
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3

Characterization of Cycled Solid-State Electrolytes

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Powder XRD results were obtained with a D8 Advance with LynxEye and SolX (Bruker, USA) using Cu Kα radiation. XPS was conducted on a high-sensitivity Kratos AXIS 165 x-ray photoelectron spectrometer using Mg Kα radiation. All binding energy values were referenced to the C 1s peak at 284.6 eV. The content of different species was obtained by fitting the whole XPS spectra using the CasaXPS software. The distributions of different elements in different depths of the cycled LPS SSEs were analyzed using a time-of-flight secondary ion mass spectroscope attached with a Ga+ focused ion beam (FIB)/scanning electron microscope (Tescan GAIA3). The accelerated voltage for FIB/SEM was 20 kV.
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4

Multi-Modal Characterization of Nanostructures

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Scanning electron microscopy (SEM) images were taken with a JSM6330F (JOEL) and a GeminiSEM 300 (Zeiss) at an acceleration voltage of 5 kV. Before measuring, the samples were sputtered with platinum (4 nm thickness). Fluorescence microscopy (FL) pictures were taken with DMi8 (Leica) at different magnifications (20×/40×/63× dry and 100× oil objective). For image processing LAS X software (Version 2.0.0) from Leica was used. Scanning force microscopy (SFM) images were taken with a Bruker Dimension Icon using Tapping Mode with OTESPA-R3 tips (k = 26 N m−1, f0 = 300 kHz). Nanoscope (Version 9.1) and Nanoscope Analysis (Version 1.5) were used for measurements and for the image processing, respectively. X-ray photoelectron spectroscopy (XPS) measurements were carried out using an AXIS165 instrument (Kratos Analytical, UK). Monochromatic Al Kα radiation (300 W) was used for excitation. The instrument was run in electrostatic mode and thermal electrons from a filament were used to neutralize the sample charges. CASA-XPS software (2.3.16) was used for data processing. All quantification was carried out after subtracting a Shirley background and Gaussian–Lorentzian functions (30% Lorentz) were used for peak fitting.
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5

Comprehensive Photocatalyst Characterization

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Morphology of the photocatalysts was determined by scanning electron microscope (SEM) (Tescan, HiPace 10) and HRTEM using JEM-2100F JEOL Japan. The XRD patterns were recorded by using a benchtop X-ray Diffractometer (Model: Rigaku Miniflex II at 30 kV) having a scintillation counter detector. X-ray photoelectron spectroscopy (XPS) analysis has been done by using KRATOS AXIS 165 with Mg Kα irradiation. An Agilent Cary 5000 UV/VIS/NIR spectrophotometer was used to determine the UV/VIS absorption at ambient conditions. Photoluminescence was recorded at Hitachi F-7000 spectrofluorometer. Liquid samples were taken at a different time interval with an airtight syringe and separated by offline GC detected by a flame ionized detector (FID) using helium as carrier gas (Perkin Elmer Clarus 680).
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6

Germanium Nanowire Characterization Protocol

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Pristine wires suspended in toluene are centrifuged in weighed glass vials at Beckman Coulter microfuge 22R for 20 min to form a pellet. The wires are left at room temperature for 24 hrs to remove any excess toluene. Vials are then reweighed and total nanowire mass is calculated. Since the surface is ligand free, this is the true mass of the wires. Samples are then sterilized under UV for 40 min, before adding D-Glutamic acid (0.008 g/L, ≥99% Sigma) which had been sterilized by filtering through a 0.22 µm disposable filter. Germanium nanowires are then sonicated for 5 min in EMAG 20 HC sonicator to produce a (purple/brown) clouded dispersion of nanowires. The surface morphology of the nanowires was characterised using a transmission electron microscope (TEM) JEOL-2010; a scanning electron microscope (SEM) Hitachi SU-70 at 10 KV; and X-ray photoelectron spectroscopy (XPS) Kratos AXIS-165.
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7

Multimodal Characterization of Nanomaterials

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The microstructure
and morphology
of the prepared samples was observed with a Hitachi SU-70 FEG-SEM
at 10 kV, a JEOL 2100 LaB6 TEM operated at 200 kV, and
a JEOL TEM/STEM FEG also operated at 200 kV. A 22 mrad probe convergence
angle was used to perform STEM imaging. HAADF detector in the JEOL
2100 FEG TEM with 90 mrad inner-detector angle was utilized to obtain
the Z-contrast atomic resolution images. For EDS
data collection, an Oxford X-max 100TLE windowless X-ray detector
was utilized. The average particle size and distribution were determined
by ImageJ software using at least three microscopy images per sample.
Raman measurements were performed with a Labram Aramis model by Horiba
Jobin-Yvon using a 532 nm laser and an integration time of 4 s, which
was repeated at least four times per sample. XPS analysis was performed
on a Kratos Axis 165 X-ray photoelectron spectrometer. XRD data was
collected by a D8 Advanced (Bruker AXS, Fitchburg, WI, USA).
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8

Characterization of Nanomaterials Using Spectroscopy

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Optical spectra (absorbance) of the samples were measured using a Varian Cary 300 Bio UV/vis spectrophotometer and photoluminescence spectra were obtained using a custom-designed Fluorolog from HORIBA Jobin-Yvon. Dynamic Light Scattering measurements were performed using a Wyatt Dynapro NanoStar (Wyatt Technology, Santa Barbara, CA, USA) in the University of Chicago Biophysics Core Facility. Transmission electron microscopy (TEM) measurements were obtained using a JEOL JEM-3010 operating at 300 keV. X-ray analyses were performed on D8 Advance ECO Bruker XRD diffractometer using monochromatized Cu Kα (λ = 1.54056 Å) radiation. FisherBiotech FB-SB-710 horizontal electrophoresis system with FB300 power supply has been used for gel electrophoresis studies. XPS analyses were performed on a monochromatic Al Kα source instrument (Kratos, Axis 165, England) operating at 12 kV and 10 mA for an X-ray power of 120 W. Spectra were collected with a photoelectron takeoff angle of 90° from the sample surface plane, energy steps of 0.1 eV, and a pass energy of 20 eV for all elements. All spectra were referenced to the C 1s binding energy at 284.8 eV. Cell cytotoxicity was detected using a flow cytometer (Becton Dickinson, NJ, USA) to identify Annexin V positive and or DAPI positive cells.
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9

Comprehensive Characterization of Gel Materials

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The 1H NMR spectra were recorded at 500 MHz with a JEOL JNM-ECA 500 NMR spectrometer. The FGMAS NMR spectra were recorded at 400 MHz with a JEOL JNM-ECA 400 NMR spectrometer. The sample spinning rate was 8 kHz. In all NMR measurements, chemical shifts were referenced to the solvent values (δ = 2.49 ppm and 4.79 ppm for DMSO-d6 and D2O, respectively). The contact angles were measured by a Dynamic Contact Angle Analyzer (DCA-700, Kyowa Interface Science Ltd.). The IR spectra of the gels were measured using a JASCO FT/IR-410 spectrometer with a KBr disc, while those of the substrates were measured using a JASCO FT/IR-6000 spectrometer via the attenuated total reflection method (ATR). The mechanical properties of the gels were measured by a mechanical tension testing system (Rheoner, RE-33005, Yamaden Ltd.), while the dynamic viscoelasticity was measured using an Anton Paar MCR301 rheometer. X-ray photoelectron spectroscopy (XPS) data were collected with an AXIS 165 (KRATOS ANALYTICAL) using a monochromatic Al-Kα X-ray source.
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10

XPS Analysis of Material Composition

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X-ray photoelectron spectroscopy (XPS) analysis was performed in a Kratos AXIS 165 X-ray photoelectron spectrometer using monochromatic Al Kα radiation of energy 1486.6 eV and operated at beam voltage of 15 kV and beam current of 10 mA. High-resolution spectra of O 1s, C 1s and Si 2p were taken at fixed pass energy of 20 eV. Construction and peak fitting of synthetic peaks in narrow region spectra used a Shirely type background and the synthetic peaks were of a mixed Gaussian-Lorenzian type. Relative sensitivity factors used are from CasaXPS library containing Scofield cross-sections. Binding energies were determined using C 1s peak at 284.8 eV as charge reference.
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