D8 advance xrd system

Manufactured by Bruker

Sourced in United States, Germany

The D8 Advance X-Ray Diffraction (XRD) system is a versatile and reliable instrument designed for comprehensive materials analysis. It provides high-quality X-ray diffraction data for a wide range of applications, enabling the identification and characterization of crystalline and polycrystalline materials.

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Lab products found in correlation

Escalab 250xi, by Thermo Fisher Scientific (1 mentions) Jem 2100f electron microscope, by JEOL (1 mentions) Cary eclipse, by Agilent Technologies (1 mentions) Qe65 pro, by OceanOptics (1 mentions) Quanta 250f, by Thermo Fisher Scientific (1 mentions) Sta7000, by Hitachi (1 mentions) Quantaurus qy absolute photoluminescence quantum yield spectrometer, by Hamamatsu Photonics (1 mentions) Flsp920, by Edinburgh Instruments (1 mentions) Rf 6000 spectrofluorophotometer, by Shimadzu (1 mentions) Genesys 10s uv vis spectrophotometer, by Thermo Fisher Scientific (1 mentions) C9920 02, by Hamamatsu Photonics (1 mentions) Uv 3600 uv vis nir spectrophotometer, by Shimadzu (1 mentions) Agilent 7700, by Agilent Technologies (1 mentions) Eclipse fluorescence spectrophotometer, by Agilent Technologies (1 mentions) Sta 6000, by PerkinElmer (1 mentions) S 4800, by Hitachi (1 mentions) Nicolet 6700 ft ir spectrometer, by Thermo Fisher Scientific (1 mentions)

Close spelling variants of this product

D8 Advance (3394 citations) D8 Advance XRD (59 citations) D8 XRD (19 citations) D8 Advance system (14 citations) D8 XRD system (3 citations)

5 protocols using d8 advance xrd system

Characterization of Fe5Ce5Ti Catalysts

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The Brunauer–Emmett–Teller (BET) method was used to characterize the surface area, pore volume and radius. High-resolution transmission electron microscope (HR-TEM) images were obtained on a JEOL JEM-2100F electron microscope (200 kV accelerating voltage) for morphological characterization of samples. Characterization of the elemental composition of the sample using the X-ray diffraction (XRD) was carried out on a Bruker D8-Advance XRD system using Cu Kα radiation (λ = 0.1543 nm) at 2θ values ranging from 10° to 90°, with a step size of 0.02°. The surface chemical state of the samples was determined using X-ray photoelectron spectroscopy (XPS), Thermo ESCALAB 250 Xi, with an Al Kα source (1486.6 eV photons).
The Debye–Scherrer formula was used to calculate the crystal size of TiO₂ grains of Fe₅Ce₅Ti catalysts prepared at different calcination temperatures. The formula is as follows:D_hkl is the calculated grain size; k is a constant, depending on the shape of the crystal, where k = 0.9; λ is the wavelength of Cu Kα X-ray radiation, λ = 1.5418; β is the half peak width of the diffraction peak of the TiO₂ crystal; θ is the diffraction angle corresponding to the diffraction peak.

Yu H., Zhang Y., Quan H., Zhu D., Liao S., Gao C., Yang R., Zhang Z, & Ma Q. (2023). Simultaneous catalytic oxidation of Hg0 and AsH3 over Fe–Ce co-doped TiO2 catalyst under low temperature and reducing atmosphere. RSC Advances, 13(6), 3958-3970.

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Characterization of Cs3Cu2I5:Mn Perovskite

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Powder X-ray diffraction was characterized by an X-ray diffractometer (Bruker D8 Advance XRD system), and the morphology and elements of Cs₃Cu₂I₅:Mn were detected by a scanning electron microscope (SEM, FEI Quanta 250 F). X-ray photoelectron spectroscopy (XPS) measurements were performed using an achromatic Al Kα source (1486.6 eV) and a double pass cylindrical mirror analyzer (PHI QUANTERA II). The thermal gravimetric analyses were conducted on STA7000, HITACHI. Emission and excitation spectra were collected on Varian Cary Eclipse instrument. The PL lifetimes were measured by FLSP920 (EDINBURGH INSTRUMENTS LTD) equipped with both ns and μs light sources. The absolute quantum yield of the samples was determined using a Quantaurus-QY absolute photoluminescence quantum yield spectrometer (C9920-02G, Hamamatsu Photonics, Japan). The X-ray source is produced from a commercial Amptek mini-x tube with Ag target and a maximum output power of 4W. All the radioluminescence and temperature-dependent spectra were recorded with a fiber spectrometer (QE65PRO, Ocean Optics). The nuclear battery performances were measured with Keithley 2400 under the irradiation of X-ray.

Li X., Chen J., Yang D., Chen X., Geng D., Jiang L., Wu Y., Meng C, & Zeng H. (2021). Mn2+ induced significant improvement and robust stability of radioluminescence in Cs3Cu2I5 for high-performance nuclear battery. Nature Communications, 12, 3879.

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Characterization of Polymer Nanocomposites

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Cross-sectional SEM image was captured by the Thermo Scios2 Dual-Beam SEM/FIB (Thermo Fisher Scientific, USA). TEM image of the PNCs was taken by the FEI Tecnai G2 F20 S-TWIN STEM system (Thermo Fisher Scientific, USA). XRD was measured by the D8 Advance XRD System (Bruker Corporation, USA). The absorbance spectrum was measured by a Genesys 10S UV-VIS spectrophotometer (Thermo Fisher Scientific, USA). The PL emission spectrum was acquired by the RF-6000 spectro Fluorophotometer (Shimadzu Corporation, Japan). The absolute PLQY was determined using a fluorescence spectrometer (Horiba PTI QuantaMaster 400 steady-state fluorescence system) with an integrated sphere (C9920-02, Hamamatsu Photonics, Japan) excited by an LED light source (F5 DIP LED, 3 V, 20 mA) at a wavelength of 450 nm.

Chen C., Wang Z., Wu J., Deng Z., Zhang T., Zhu Z., Jin Y., Lew B., Srivastava I., Liang Z., Nie S, & Gruev V. (2023). Bioinspired, vertically stacked, and perovskite nanocrystal–enhanced CMOS imaging sensors for resolving UV spectral signatures. Science Advances, 9(44), eadk3860.

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Comprehensive Characterization of 2D Perovskite Scintillator

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XRD measurements were carried out with a Bruker D8 Advance XRD system. SEM images were taken by FEI field emission electron microscope, Quanta 250 F. PL spectra are measured by Cary Eclipse Fluorescence Spectrophotometer. The reflectance spectra are measured by SHIMADZU UV-3600 UV-VIS-NIR spectrophotometer. The time-resolved PL spectra were measured using self-built setup with single-photon counter, the excitation wavelength is 375 nm. The contact angle was measured using a contact angle meter. Inductively coupled plasma mass spectrometry (ICP-MS) data were obtained by employing Agilent 7700. Thermogravimetric analysis (TGA) measurements were recorded using Perkin Elmer STA 6000. The temperature-dependent fluorescence spectra were measured using a PG 2000 fiber optic spectrometer. The afterglow curves were measured by using a pulse 375 nm excitation (pulse duration of 50 ps), and were recorded in oscilloscope mode using a SPCM-AQRH-15 APD detector, the 2D perovskite scintillator was placed in total darkness for 24 h before the afterglow measurement was carried out.

Yu D., Wang P., Cao F., Gu Y., Liu J., Han Z., Huang B., Zou Y., Xu X, & Zeng H. (2020). Two-dimensional halide perovskite as β-ray scintillator for nuclear radiation monitoring. Nature Communications, 11, 3395.

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Characterization of Pretreated Switchgrass Biomass

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SEM, X-ray
diffraction, and FT-IR were used to observe the changes in the surface,
crystallinity, and chemical structure of the four optimal pretreatments
of the switchgrass biomass, respectively, using the methods mentioned
by Wang et al.^{46 (link)} The surface structures
of untreated and pretreated switchgrass samples were analyzed with
a SEM (Hitachi S-4800, Hitachi, Ltd.). XRD analysis was conducted
using a Bruker D8 Advance XRD system (Germany). FT-IR analysis was
carried out using a Nicolet 6700 FT-IR spectrometer (Thermo Fisher).
Untreated and pretreated samples mixed with spectroscopic grade potassium
bromide (1:20) were obtained within the spectral range of 400–4000
cm^–1.

Wang F., Shi D., Han J., Zhang G., Jiang X., Yang M., Wu Z., Fu C., Li Z., Xian M, & Zhang H. (2020). Comparative Study on Pretreatment Processes for Different Utilization Purposes of Switchgrass. ACS Omega, 5(35), 21999-22007.

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