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Ultima 4 system

Manufactured by Rigaku
Sourced in Japan

The Ultima IV system is a multipurpose X-ray diffraction (XRD) instrument designed for analytical applications. It is capable of performing various XRD techniques, including powder diffraction, thin-film analysis, and single-crystal diffraction. The system provides accurate and reliable data for material characterization and phase identification.

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10 protocols using ultima 4 system

1

Synthesis and Characterization of Tryptophan-Capped Gold Nanoparticles

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A typical growth solution of the AuNPs was prepared as follows: 3-mL of the aqueous solutions tryptophan (6.25 mM) was added in different glass bottles containing diluted NaOH (5 mM). This solution was brought to 95 °C and the synthesis of the AuNPs was initiated by adding 1.0 mL of 20 mM HAuCl4. The AuNPs synthesis reaction was allowed to run for 48 hours at 95 °C. Centrifugation of the AuNPs solution was carried out at 10,000 rpm for 15 min to remove unbound tryptophan molecules and NaOH used in the synthesis. UV-Vis spectrophotometer (Optizen-2120) was used to record UV-Vis spectrum of the AuNPs in the wavelength range from 400 to 900 nm, with a resolution of 5 nm. Transmission electron microscope (TEM) images of the AuNPs were obtained from a Hitachi HF-3300. TEM samples were prepared by adding 100 μL of the AuNPs solution onto the 200-mesh Formvar-coated copper grid. X-ray diffraction (XRD) spectrum of the of the AuNPs thin film was measured by using Rigaku Ultima-IV System by operating at voltage 40 kV and current of 30 mA using Cu K radiation. FT-IR spectra of the centrifuged AuNPs was collected by using an infrared spectrometer (Thermo Electron Nicolet-6700).
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2

Comprehensive Structural and Chemical Analysis

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The morphologies of the samples were investigated by field‐emission SEM (FESEM, ZEISS SIGMA 500) and TEM (FEI Tecnai G20). Crystal structures of the samples were conducted by XRD using a Rigaku Ultima IV system with Cu Κα radiation. The surface chemistry was analyzed by XPS spectra using an AXIS Supra facility while the ISI‐XPS spectra were detected under UV light irradiation at 365 nm. The UPS spectra were recorded with a He I radiation ( = 21.22 eV) source. A platinum wire and Ag/AgCl were employed as the counter electrode and reference electrode, respectively. The electrolyte was a 1 mol L−1 Na2SO4 aqueous solution and the Mott–Schottky test frequency was 1000 Hz.
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3

Comprehensive Characterization of Carbides

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The infrared pyrometer (IMPAC IMGA 740) was applied for noncontact temperature measurement during the CR. The pressure variation during low-pressure CR was measured by a vacuum gauge (INFITECH VCT160). The phase structure and crystallinity of the as-prepared carbides were analyzed by using XRD on a Rigaku Ultima-IV system with Cu Kα radiation (λ = 1.5406 Å). The BET tests were carried out using a TRISTAR II 3020M BET surface area analyzer. TGA–DSC of samples was performed by using an NETZSCH TG209F1 system with an atmosphere of Ar. XPS measurements were performed with an Escalab 250Xi system, and the spectra were acquired with a monochromatic Al Kα source. Raman spectra were acquired by a Renishaw inVia confocal microscope Raman system. The morphologies, HAADF-STEM, EDX elemental mapping analysis, and microstructures of the prepared catalysts were determined by an FEI Tecnai TF20 system that operated at an accelerating voltage of 200 kV.
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4

Catalyst Characterization Techniques

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XRD patterns of the catalysts were measured using a Rigaku Ultima IV system to estimate the presence of crystals. N2 adsorption and desorption isotherms were measured using a BELSORP mini II (Microtrackbel) system to estimate the pore structures of the catalysts. The total surface area of a catalyst was calculated by the Brunauer–Emmett–Teller (BET) method. The mesoporous surface area and pore volume for pore sizes larger than 3.3 nm were calculated by the Barrett–Joyner–Halenda (BJH) method. The temperature-programmed desorption of NH3 (NH3-TPD) was measured by a gas chromatography–thermal conductivity detector (GC–TCD, Shimadzu GC-8A) to estimate the amount and the strength of the acid sites. Thermogravimetric–differential thermal analysis (TG–DTA) measurements were carried out to calculate the amount of coke formed using a TG–DTA (Shimadzu, DTG-60AH) system. Details of these experiments are reported elsewhere.6,27 (link)
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5

Comprehensive Material Characterization

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X-ray diffraction (XRD) analysis was performed using a Rigaku Ultima IV system with Cu Kα radiation (λ = 1.5418 α), operating voltage of 45 kV, and current of 200 mA in steps of 0.02°. The morphology was investigated using field-emission scanning electron microscopy (FE-SEM, SU8020, Hitachi, Tokyo, Japan) at an acceleration voltage of 5 kV and transmission electron microscopy (TEM, JEL-2500SE, JEOL, Tokyo, Japan) at an acceleration voltage of 200 kV. The Brunauer–Emmett–Teller (BET) surface area and Barrett–Joyner–Halenda (BJH) pore size distributions were analyzed using an ASAP 2020 (Micromeritics). X-ray photoelectron spectroscopy (XPS) measurement was carried out through the NEXSA system. The particle size distributions of length and width were evaluated using ImageJ software (version 1.53t).
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6

Characterization of Magnetic Nanoparticles

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Transmission electron microscopy (TEM) images were taken on JEOL JEM-2100 at 200 kV. The X-ray diffraction (XRD) patterns were obtained on the Rigaku Ultima IV system. The iron and gadolinium concentrations in NPs were measured with inductively coupled plasma atomic emission spectroscopy (ICP-AES). The absorbance was measured using a microplate reader (MultiSkan FC microplate reader, Thermo scientific). The MRI testing and T1 relaxation time measurements were tested at a 0.5 T NMR120-Analyst NMR Analyzing&Imaging system (Niumag Corporation, Shanghai, China).
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7

Characterization of TiO2 Thin Films

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All reagents used in this study were of analytical grade and used without further purification. The material composition and chemical bonding were examined by recording the Fourier-transform infrared spectra (FT-IR, IFS 66V/S, Germany). Phase identification of the TiO2 films was carried out using powder X-ray diffraction patterns collected on a Rigaku Ultima IV system with the diffraction angle range from 10° to 80°. The morphology of the as-prepared TiO2 films was studied by scanning electron microscopy (SEM, JSM-6510). UV-vis diffuse reflectance spectra of all the samples were obtained on a U-4100 UV-vis spectrophotometer. The elemental analysis and chemical states of different atoms were examined through X-ray photoelectron spectroscopy (XPS, ESCALAB 250). The photoluminescence (PL) emission and excitation (PLE) properties of the prepared materials were studied using an F-7000 photoluminescence spectrometer (Hitachi, Japan). The photodegraded samples of MO and 4-CP were analyzed using a UV-vis spectrophotometer (UVmini-1240, SHIMADZU) and high-performance liquid chromatography (HPLC, LC-20, SHIMADZU), respectively.
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8

XRD Analysis of Fishbones, HA, and CHA

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XRD analysis was conducted on the fishbones, HA and CHA using an Ultima IV system (Rigaku Co., Tokyo, Japan) with Cu-Kα radiation. The X-ray diffraction intensities were recorded within the range of 5 to 80°, at a scanning rate of 2° min−1.
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9

Characterizing Prepared Material Phases

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The phase structure of the as-prepared samples was analyzed by using X-ray diffraction (XRD) patterns on a Rigaku Ultima-IV system with Cu Kα radiation (λ = 1.5406 Å). UV-vis absorption spectroscopy was conducted at room temperature on a T2602S spectrophotometer.
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10

Comprehensive Characterization of Nanoparticles

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Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images were obtained by using a JEM-2100 microscope with an accelerating voltage of 200 kV. The X-ray diffraction (XRD) patterns were acquired on a Rigaku Ultima IV system. The energy-dispersive X-ray (EDX) element mapping analysis was performed on a Tecnai F30 microscope at an accelerating voltage of 300 kV. The hysteresis loops (at 300 K) were recorded on a Quantum Design MPMS-XL-7 system. The samples ready for magnetization measurement were washed three times and then treated with plasma clean-ing (PDC-32G, Harrick Plasma) to remove the surfactants. The metal concentration of the samples was detected by inductively coupled plasma atomic emission spectroscopy (ICP-AES). The dynamic light scattering (DLS) measurements were performed on a Malvern Zetasizer nano ZS instrument.
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