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Fls980 spectrofluorometer

Manufactured by Edinburgh Instruments
Sourced in United Kingdom

The FLS980 spectrofluorometer is a high-performance instrument designed for accurate and sensitive fluorescence measurements. It features a xenon lamp source, dual monochromators, and a photomultiplier tube detector. The FLS980 is capable of performing excitation and emission spectroscopy, as well as time-resolved fluorescence measurements.

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10 protocols using fls980 spectrofluorometer

1

Luminescence Characterization of Europium-Doped Materials

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Y2O3, Eu2O3, Htta, and Hdbt were obtained from J&K Chemicals. BR IX was obtained from Sigma-Aldrich (USA). All chemicals and reagents in this study were of analytical grade and were used directly without further purification. Luminescence spectra were recorded on a FLS-980 spectrofluorometer (Edinburgh Instruments, UK) equipped with a quartz cuvette (1.0 cm × 1.0 cm) using 1 nm-wide slits for excitation and emission. The UV-vis absorption spectra were recorded on an Agilent Cary UV-8000 spectrophotometer (Tianmei, China). The photoluminescence decays of the sensing films were recorded on an FLS-980 spectrofluorometer (Edinburgh Instruments, UK) equipped with 356 and 367 nm lasers.
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2

UV-vis and Photoluminescence Characterization

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Absorption spectra were measured
by a PerkinElmer Lambda 365 UV–vis spectrophotometer. PL spectra
were measured by Edinburgh Instruments FLS980 spectrofluorometer with
a xenon lamp as excitation source. PL lifetimes were recorded on an
Edinburgh LifeSpec-ps spectrometer with a fixed excitation wavelength
of 404 nm.
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3

Photophysical Characterization of Solid Samples

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The excitation and emission
spectra for the solid samples were recorded with an Edinburgh FLS980
spectrofluorometer. Photoluminescence quantum yields and the absorption
spectra of solid materials were measured by an integrating sphere
(F-M01, Edinburgh) set in the sample chamber of the spectrometer (Edinburgh
FLS980). Emission lifetimes within 1 ns–20 μs were collected
by an inbuilt, time-correlated single photon counting (TCSPC) system
(Edinburgh FLS980) coupled with a synchronized diode laser (EPL-375)
as the pumping source. For phosphorescence lifetimes longer than 50
μs, an intensified charge-coupled detector (PI-MAX ICCD) coupled
with a Q-switch laser was used instead. Both timings of ICCD and tunable
laser are triggered by a pulse generator (DG-535, Stanford Research
System) with signal jittering less than 5 ns. The excitation pulse
was generated by an LT-2134 (532 nm, SHG of Nd:Yag laser, LOTIS Tii)
followed by an LT-2211 tunable laser (345–532 nm, LOTIS Tii),
and 365 nm was chosen as the excitation source with an fwhm of ∼20
ns.
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4

Comprehensive Characterization of Th-SINAP-200

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PXRD data were collected from 2 to 40° with a step of 0.02° on a Bruker D8 Advance diffractometer with Cu Kα radiation (λ = 1.54178 Å). The calculated PXRD pattern was produced from the CIFs using the Mercury 1.4.2 program. The N2 adsorption isotherms were recorded at 77 K by using a Micromeritics ASAP 2020. The freshly prepared TOFs were directly evacuated under vacuum for 6 h at 200 °C before measurement. Thermogravimetric analysis (TGA) was carried out in a N2 atmosphere with a heating rate of 10 °C min−1 on a NETZSCH STA 449 F3 Jupiter instrument. SEM images and EDS data were obtained on a Zeiss Merlin Compact LEO 1530 VP scanning electron microscope. The IR spectra with a range of 400 to 4000 cm−1 were recorded on a Thermo Nicolet 6700 FTIR spectrometer equipped with a diamond attenuated total reflectance (ATR) accessory. The solid-state PL spectrum of Th-SINAP-200 was recorded on a Craic Technologies microspectrophotometer. The excitation and emission spectra, decay curves, and PL quantum-yields were collected on an Edinburgh Instruments FLS 980 spectrofluorometer.
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5

Photophysical Characterization of TADF Emitters

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Photophysical studies were performed in a solution as well as for emissive layers. All compounds were diluted in chlorobenzene. Thin films of PVK + TADF + Ir blends were prepared on quartz substrates by means of spin-coating. Absorption spectra were detected by a Cary 5000 (Varian Inc.) spectrometer (Palo Alto, CA, USA). The emission spectra were recorded on an Edinburgh Instruments FLS980 spectrofluorometer (Livingston, UK) equipped with an integrating sphere used to determine the photoluminescence quantum yield.
Samples of thick layers (few µm), required for spectrally resolved thermoluminescence (SRTL) experiments, were prepared by drop-casting and spin-coating from chlorobenzene solutions onto aluminum substrates. The samples for SRTL studies were placed in the vacuum chamber on a thermostated holder and covered by a sapphire plate. After sample photoexcitation at 15 K by pulsed nitrogen laser (λ = 337 nm) (PTI, model GL–3300T), the thermoluminescence (TL) measurements were carried out in the temperature range of 20–300 K with a heating rate of 7 K/min. Sample thermoluminescence was recorded by a detection system contained an optical collector, an optical-fiber, a Micro HR Imaging Spectrograph and a CCD 3500 camera (Horriba Jobin–Yvon).
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6

Characterization of Fluorescent Nanoparticles

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The shape and size of the prepared FNs and FNs-Ca(II) were characterized by transmission electron microscopy (TEM) using a JEM-2100 from JEOL Ltd. (Tokyo, Japan). A Lambda 35 spectrophotometer (PerkinElmer, Waltham, MA, USA) was used for the analysis of the ultraviolet-visible (UV-Vis) spectra of FNs and FNs-Ca(II). Fluorescence spectra were analysed by a F-2700 fluorescence spectrometer (Hitachi, Tokyo, Japan). An FLS 980-spectrofluorometer from Edinburgh Instruments (Edinburgh, UK) was used to measure lifetime with a 320 nm laser as the excitation source. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FT-IR), and zeta potential analysis were conducted using previously reported methods [15 (link)]. The microstructure and local element composition of the FNs and FNs-Ca(II) were characterized by a JSM-7800F scanning electron microscope from JEOL Ltd. (Tokyo, Japan). The 1H NMR spectra were obtained using a Bruker AV-400 analyser (Daltonics, Germany) with dimethyl-d6 sulfoxide as the solvent.
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7

Multimodal Characterization of Samples

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The morphologies of the samples were
observed by a Hitachi HT-7700 transmission electron microscope. The
ultraviolet–visible (UV–vis) absorption spectra were
characterized by a Shimadzu UV-2600 spectrophotometer. An Edinburgh
Instruments FS5 fluorescence spectrometer was used to measure the
fluorescence spectra of the samples. The FTIR spectra were recorded
using a Thermo Fisher spectrum Nicolet 6700 FTIR instrument. A Thermo
Fisher Scientific ESCALAB 250 XPS system was used for the analysis
of the surface properties of the samples. The XRD patterns were obtained
with a Rigaku 2500VB2+PC X-ray diffractometer. The fluorescence QY
was acquired using an integrating sphere incorporated into an Edinburgh
Instruments FLS980 spectrofluorometer.
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8

Luminescent Rare-Earth Compound Characterization

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The following chemicals of analytical purity were obtained from J&K Chemicals and were used directly without further purification: yttrium oxide (Y2O3), terbium oxide (Tb4O7), concentrated nitric acid, sodium benzoate, ethanol, pyridine-2,6-dicarboxylic acid (DPA), benzoic acid (BA), o-dibenzoic acid (o-PA), m-dibenzoic acid (m-PA), p-dibenzoic acid (p-PA), trimesic acid (TMA), glycine (Gly), d-aspartic acid (ASP), and the peptide glutathione (GSH). Luminescence spectra were recorded on a FLS-980 spectrofluorometer (Edinburgh Instruments, UK) equipped with a quartz cuvette (1.0 cm × 1.0 cm) using 1 nm slit widths for excitation and emission. UV-vis absorption spectra were recorded using an Agilent Cary UV-8000 spectrophotometer (Tianmei, China).
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9

Comprehensive Optoelectronic Characterization

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The current–luminance–voltage characteristics were measured by using a computer-controlled source meter (Keithley 2400) equipped with a light intensity meter LS-110 under ambient atmosphere without encapsulation. The EL spectra were measured by a Spectrascan PR650 spectrophotometer. The EQEs were calculated from the luminance, current density, and EL spectrum, assuming a Lambertian distribution. The photophysical properties, including UV/vis absorption, photoluminescence (PL), and excitation spectra were measured by a Shimadzu UV-2600 spectrophotometer, and an Edinburgh Instruments FLS 980 spectro-fluorometer. Additionally, the PL transient decay curves of the films were performed on Quantaurus-Tau fluorescence lifetime measurement system (C11367-03, Hamamatsu Photonics Co.). All the results of devices were measured in the forward-viewing direction and all the measurements were carried out under an ambient atmosphere without encapsulation.
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10

Upconversion Luminescence Characterization of BYF:Yb3+,Tm3+ Phosphors

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The X-ray powder diffraction (XRPD) patterns of the BYF:Yb3+,Tm3+ phosphors were recorded using a Bruker D8 Advance X-ray diffractometer in the 2θ ranging from 10 to 70o with X-ray wavelength (λ) of 1.54 Å. The scanning electron microscope (SEM) images were obtained on a JSM-7800 F JEOL field emission scanning electron microscope (FE-SEM). The UCL spectra and the UC decay curves were recorded on a Edinburgh FLS 980 spectrofluorometer. The Commission Internationale de L’Eclairage (CIE) color coordinates were plotted using the Osram-Sylvania color calculator software. The temperature dependent UCL spectra were recorded using Horiba Jobin Yvon iHR320 Fully Automated Imaging Spectrometer. A 980 nm continuous-wave (CW) laser diode was used for pumping the phosphors while recording the UCL spectra, whereas a pulsed 980 nm laser was used for recording the UC decay curves.
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