Fls980 spectrofluorometer
The FLS980 spectrofluorometer is a high-performance instrument designed for accurate and sensitive fluorescence measurements. It features a xenon lamp source, dual monochromators, and a photomultiplier tube detector. The FLS980 is capable of performing excitation and emission spectroscopy, as well as time-resolved fluorescence measurements.
Lab products found in correlation
10 protocols using fls980 spectrofluorometer
Luminescence Characterization of Europium-Doped Materials
UV-vis and Photoluminescence Characterization
by a PerkinElmer Lambda 365 UV–vis spectrophotometer. PL spectra
were measured by Edinburgh Instruments FLS980 spectrofluorometer with
a xenon lamp as excitation source. PL lifetimes were recorded on an
Edinburgh LifeSpec-ps spectrometer with a fixed excitation wavelength
of 404 nm.
Photophysical Characterization of Solid Samples
spectra for the solid samples were recorded with an Edinburgh FLS980
spectrofluorometer. Photoluminescence quantum yields and the absorption
spectra of solid materials were measured by an integrating sphere
(F-M01, Edinburgh) set in the sample chamber of the spectrometer (Edinburgh
FLS980). Emission lifetimes within 1 ns–20 μs were collected
by an inbuilt, time-correlated single photon counting (TCSPC) system
(Edinburgh FLS980) coupled with a synchronized diode laser (EPL-375)
as the pumping source. For phosphorescence lifetimes longer than 50
μs, an intensified charge-coupled detector (PI-MAX ICCD) coupled
with a Q-switch laser was used instead. Both timings of ICCD and tunable
laser are triggered by a pulse generator (DG-535, Stanford Research
System) with signal jittering less than 5 ns. The excitation pulse
was generated by an LT-2134 (532 nm, SHG of Nd:Yag laser, LOTIS Tii)
followed by an LT-2211 tunable laser (345–532 nm, LOTIS Tii),
and 365 nm was chosen as the excitation source with an fwhm of ∼20
ns.
Comprehensive Characterization of Th-SINAP-200
Photophysical Characterization of TADF Emitters
Samples of thick layers (few µm), required for spectrally resolved thermoluminescence (SRTL) experiments, were prepared by drop-casting and spin-coating from chlorobenzene solutions onto aluminum substrates. The samples for SRTL studies were placed in the vacuum chamber on a thermostated holder and covered by a sapphire plate. After sample photoexcitation at 15 K by pulsed nitrogen laser (λ = 337 nm) (PTI, model GL–3300T), the thermoluminescence (TL) measurements were carried out in the temperature range of 20–300 K with a heating rate of 7 K/min. Sample thermoluminescence was recorded by a detection system contained an optical collector, an optical-fiber, a Micro HR Imaging Spectrograph and a CCD 3500 camera (Horriba Jobin–Yvon).
Characterization of Fluorescent Nanoparticles
Multimodal Characterization of Samples
observed by a Hitachi HT-7700 transmission electron microscope. The
ultraviolet–visible (UV–vis) absorption spectra were
characterized by a Shimadzu UV-2600 spectrophotometer. An Edinburgh
Instruments FS5 fluorescence spectrometer was used to measure the
fluorescence spectra of the samples. The FTIR spectra were recorded
using a Thermo Fisher spectrum Nicolet 6700 FTIR instrument. A Thermo
Fisher Scientific ESCALAB 250 XPS system was used for the analysis
of the surface properties of the samples. The XRD patterns were obtained
with a Rigaku 2500VB2+PC X-ray diffractometer. The fluorescence QY
was acquired using an integrating sphere incorporated into an Edinburgh
Instruments FLS980 spectrofluorometer.
Luminescent Rare-Earth Compound Characterization
Comprehensive Optoelectronic Characterization
Upconversion Luminescence Characterization of BYF:Yb3+,Tm3+ Phosphors
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