Nova nanosem450
The Nova NanoSEM450 is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It features a field emission gun (FEG) electron source, providing high-resolution imaging and analytical capabilities. The instrument is equipped with advanced detectors and has the ability to operate in both high and low vacuum modes, making it suitable for a wide range of sample types and applications.
Lab products found in correlation
2 protocols using nova nanosem450
Characterization of Intrinsic Nanoparticles
Characterization of Ta@CaAlg Microspheres
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