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Micro raman spectroscopy system

Manufactured by Renishaw
Sourced in United Kingdom

The Micro-Raman Spectroscopy System is a laboratory instrument that uses Raman spectroscopy to analyze and characterize materials at the microscopic level. It provides high-resolution, non-destructive analysis of a wide range of samples, including solids, liquids, and gases. The system combines a high-performance optical microscope with a Raman spectrometer, enabling detailed, localized analysis of materials.

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5 protocols using micro raman spectroscopy system

1

SERS Detection of Organic Analytes

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All Raman spectra were measured by
the Renishaw Micro-Raman Spectroscopy System (U.K.) with a 532 nm
laser and a 50× objective. R6G was dissolved in ethanol with
concentrations ranging from 10–4 to 10–9 mol/L. Five microliters of the analyte solution was dropped on the in situ ZIF-67 nanoplate and further left to dry in the
air. The Raman spectrum was acquired in the region of 500–1800
cm–1. Moreover, the 10–4 M ethanol
was chosen to optimize the in situ ZIF-67 nanoplate.
For the SERS detection of the in situ HKUST-1 nanoplate,
the different concentrations of BTC (from 10–3 to
10–7 mol/L) were chosen as proof. The analyte solution
was dropped on the in situ HKUST-1 nanoplate for
full adsorption and was further dried in air. The Raman spectrum was
acquired in the region 200–1800 cm–1. Raman
spectra were taken from the average of five measurements. All spectral
data were analyzed using the Origin Lab software (OriginLab, U.S.A).
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2

Electrochemical Characterization of Nanomaterials

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All of the electrochemical experiments were performed with an IGS1130 electrochemical workstation (Guangzhou Insens Sensor Technology Co. Ltd, Guangzhou, China). The three-electrode system consisted of a modified GCE (3 mm in diameter) as the working electrode, a platinum wire as the auxiliary electrode, and Ag/AgCl (saturated KCl) electrode as the reference electrode; this system was used in all electrochemical investigations. Transmission electron microscopy (TEM) images were acquired with a Hitachi H-7500 high-resolution transmission electron microscope (Tokyo, Japan) using an accelerating voltage of 200 kV. UV–Vis absorption spectra were acquired on a Cary 50 Scan UV–Vis spectrophotometer (Varian, Australia). X-ray photoelectron spectra (XPS) were obtained with an ESCALAB 250 Xi XPS system from Thermo Scientific (Waltham, MA, USA). Raman spectra were recorded using a Renishaw Micro-Raman spectroscopy system (London, England) with an excitation wavelength of 514 nm.
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3

Comprehensive Material Characterization of Electrodes

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The morphology and crystal lattice of electrodes was imaged with field-emission SEM (JEOL JSM 7001 F) at 20 kV, HR-TEM and SAED was conducted at 200 kV (FEI, Technai 20 F), respectively. The cross-sections of the TEM samples were prepared by focused ion beam thinning (FEI SCIOS). Raman spectrum was acquired on Renishaw Micro-Raman Spectroscopy System at the wavelength of 514 nm. The XPS (Kratos Ultra) was measured for chemical analysis using a mono Al Kα X-ray source. XPS measurement was tested by Kratos Ultra. In-situ synchrotron XRD patterns (high resolution) were collected in transmission mode on powder diffraction beamline of Australian Synchrotron via the MY THEN microstrip detector and Si (111) monochromator (at the wavelength of 0.8265 Å). The 2θ zero-error were determined via a standard 0.3 mm capillary (a LaB 6/Si mixture using transmission geometry). Corresponding battery test was conducted on a Neware electrochemical tester.
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4

Characterization of Graphene and Diamond Thin Films

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The surface morphology of the various films measured over 10 μm × 10 μm and 1 μm × 1 μm regions was measured using scanning atomic force microscopy (AFM, Veeco Dimension V) in tapping mode for the H-terminated NDs. The chemical composition and bonding states of the films were characterized using Fourier transfer infrared spectrometry (FTIR, Perkin Elmer Spectrum One) in transmission mode and X-ray photoelectron spectroscopy (XPS, Thermo Scientific) with the Al K α line as the exciting source. A micro Raman spectroscopy system (Renishaw Invia) operating at 514.5 nm was used to study the film microstructure, where the laser output power used was 1 mW. Impedance spectroscopy was applied in the range of 0.1 Hz to 10 MHz in a vacuum at elevated temperature from room temperature to 500 C using an Autolab electrochemical system. Hall Effect measurements (1T electromagnet, Lakeshore Cryogenics System) were performed to determine graphene carrier mobilities using the “van der Pauw” method, where by four Ohmic metal contacts (10 nm Ti-300 nm Au) were placed on the topside of the graphene layers at room temperature.
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5

Multifaceted Characterization of PAni-based Gels

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All the SEM images were collected on a tungsten thermionic emission SEM system (the Tescan VEGA3). XRD spectra were obtained from the XRD system (Rigaku SmartLab) equipped with a 9 kW rotating anode X-ray source (λ ~ 1.54 Å) coupling with a high-quality semiconductor detector that supports 0D, 1D, or 2D x-ray diffraction measurement. Raman spectra were recorded from Renishaw Micro-Raman Spectroscopy system fully integrated with a confocal microscope spectrometer and a 785 nm laser source. Mechanical tests were conducted on an advanced rheometric expansion system at the Hong Kong University of Science and Technology. All the electrochemical tests were processed on an electrochemical workstation (VersaSTAT3). The measurements of OECT were conducted on a probe station (Micromanipulator) with Keithley 4200A-SCS parameter analyzer. The test of viscosity was conducted by the viscometer (NDJ-5S/9 S/8 S). The probe of viscometer inserted into PAni gels after soaking in solvents, and the viscosity was measured at an increasing shear speed from 10 to 60 Rev.
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