Octene elite 25

A scanning electron microscope (SEM JEOL JSM-7800 F, JEOL Ltd., Tokyo, Japan) was used to analyze the microstructure. An X-ray energy dispersion spectrometer (EDS) (Octene Elite 25, EDAX, Mahwah, NJ, USA) is an SEM microscope attachment that uses backscattered electrons to determine the chemical composition.

The SEM microscope was used to study the surface structure of the laser-treated Ti13Zr13Nb alloy (JEOL JSM-7800 F, JEOL Ltd., Tokyo, Japan). The chemical composition on the surface of the samples was analyzed using the X-ray energy dispersion (EDS) spectrometer (Octene Elite 25, EDAX, Mahwah, NJ, USA) attached to the SEM microscope. An analysis of the chemical composition was performed for an area of 400 × 300 μm.
The thickness of the remelted surface layers was assessed on cross-sections of samples that were ground, polished, and etched with Kroll’s reagent (0.06 mm³ HF, 0.12 mm³ HNO₃, 50 mm³ distilled water). An optical microscope was used for examination (UC50, Olympus Europa SE&Co. KG, Hamburg, Germany).
Phase composition analysis was performed using a PHILIPS X’PERT-PRO (PHILIPS, Almelo, The Netherlands) diffractometer with a copper lamp. The X-ray method using Cu Kα radiation was performed to analyze the phase composition, with a wavelength of radiation λKα1 = 0.15406 nm and λKα2 = 0.15444 nm.