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Tecnai g2 polara electron microscope

Manufactured by Ametek
Sourced in United States

The Tecnai G2 Polara electron microscope is a high-resolution imaging system designed for advanced structural and analytical studies. It features a field emission gun, providing a stable and bright electron beam for high-resolution imaging. The microscope is capable of operating at accelerating voltages up to 300 kV, enabling the visualization of a wide range of samples at the nanoscale level.

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2 protocols using tecnai g2 polara electron microscope

1

Cryo-EM Imaging and Tomography

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Specimens were plunge-frozen onto a Quantifoil R2/2, Cu/Rh holey carbon grid using an FEI Vitrobot (FEI Company, USA) and imaged with an FEI Tecnai G2 Polara electron microscope operating at 300 kV and equipped with a Gatan energy filter and 4 × 4 k Gatan Ultrascan CCD camera (binned to 2 × 2 k). For tomography, samples were imaged using an FEI Titan Krios TEM operating at 300 kV, equipped with a 4k × 4k K2 Summit direct electron detector at a magnification of 26 k, corresponding to a pixel size of 0.45 nm (for K2) at the specimen level. Tilt series were acquired using SerialEM software 58 (link) between ± 55° with 1° increment. The defocus was set to between 5 and 8 μm, and the total dose for each tilt series was around 120 e/Å2. Tilt series was aligned using the fiducial markers and IMOD software package and reconstruction was computed using simultaneous iterative reconstruction technique (SIRT) 59 (link),60 (link).
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2

Cryo-EM Imaging and Tomography

Check if the same lab product or an alternative is used in the 5 most similar protocols
Specimens were plunge-frozen onto a Quantifoil R2/2, Cu/Rh holey carbon grid using an FEI Vitrobot (FEI Company, USA) and imaged with an FEI Tecnai G2 Polara electron microscope operating at 300 kV and equipped with a Gatan energy filter and 4 × 4 k Gatan Ultrascan CCD camera (binned to 2 × 2 k). For tomography, samples were imaged using an FEI Titan Krios TEM operating at 300 kV, equipped with a 4k × 4k K2 Summit direct electron detector at a magnification of 26 k, corresponding to a pixel size of 0.45 nm (for K2) at the specimen level. Tilt series were acquired using SerialEM software 58 (link) between ± 55° with 1° increment. The defocus was set to between 5 and 8 μm, and the total dose for each tilt series was around 120 e/Å2. Tilt series was aligned using the fiducial markers and IMOD software package and reconstruction was computed using simultaneous iterative reconstruction technique (SIRT) 59 (link),60 (link).
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