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347 protocols using lambda 950

1

Measuring Light Reflectance of BaSO4 Sheet

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The light reflectance value of the BaSO4 bifunctional sheet was measured by Lambda 950 reflectance spectrometer manufactured by Perkin Elmer, USA (Lambda 950, Perkin Elmer, Waltham, MA, USA) [10 ]. Scanning speed of the sample was medium speed, with incident angle as 0°.
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2

Photovoltaic Performance Assessment

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Photovoltaic performance measurements were carried out by I–V curve tracing using a Photo Emission Tech AAA class solar simulator under standard test conditions. The microstructural and surface investigations were performed using Innova multimode atomic force microscopy and scanning electron microscopy (tabletop TM3030, Hitachi High-Tech, Tokio, Japan). The optical characterization was based on ellipsometry (SE800 PV, SENTECH Instruments, Berlin, Germany, range = 300–980 nm, incident angle = 70°) and UV–vis–NIR spectroscopy (Lambda 950S, Perkin Elmer, Waltham, MA, USA, range = 300–850 nm).
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3

Perovskite Film Characterization

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Absorption spectra of the perovskite films were collected using a UV–Vis absorption spectrophotometer (PerkinElmer Lambda 950S). X-ray photoelectron spectroscopy measurements were conducted using a VersaProbe II (Physical Electronics Inc.) equipped with a monochromator and Al Kα source (1,486.6 eV). The spectrum was referenced using the C–C-bound component of adventitious carbon.
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4

Optical Characterization of Quantum Dots

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Absorbance measurements were performed using a PerkinElmer Lambda 950S spectrophotometer equipped with an integrating sphere. PL measurements were taken using a PTI Quantamaster 400 system. Quantum dots were excited at 750 nm. Time-resolved PL was taken with a time correlated single photon counting set-up with a pulsed 633 nm laser diode as the excitation light source. Time-resolved PL measurements were taken at the peak PL emission wavelength of the QD sample (1100 nm).
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5

Perovskite Film Optical Properties

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The transmittance and reflectance of the perovskite films were measured using an optical spectrophotometer (Lambda 950S, Perkin Elmer, Waltham, MA, USA). The band gap of the perovskite films was calculated by Tauc’s plot, which uses the values of absorption coefficient α of the film calculated from the transmittance (T) and reflectance (R) data according to the formula: α = −1/d × ln[(1−R)T]. We used the reflectance data in order to increase accuracy.
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6

Synthesis and Characterization of Substituted Anthracenes

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TIPS ANT is synthesized
by literature methods,26 (link) and single crystals
are grown from acetone. TMS ANT is synthesized according to literature
precedent.55 (link) F4 TMS ANT is synthesized
as described in the Supporting Information, and crystals are grown from 2-butanone. Single-crystal X-ray analysis
of F4 TMS ANT is performed on a Bruker-Nonius X8 Proteum diffractometer
using Cu K(α) radiation. The structures are solved using SHELXS
and refined using SHELXL from the SHELX-97 program package.56 (link) Molecular fragment editing, including the construction
of suitable disorder models, is performed using the XP program of
SHELXTL. The comparison between the solid-state structures of single
crystals and films is carried out by a Bruker D8 Discover equipped
with a Göbel mirror for Cu Kα radiation, an Eulerian
cradle, and a scintillation detector. For optical characterization,
the crystalline samples are deposited on 1 × 1 cm2 quartz substrates. Absorption measurements are performed by a UV–visible
spectrophotometer (Lambda 950, PerkinElmer).
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7

Characterizing Diatomite-based Hybrid Reflective Coatings

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The reflectance of the diatomite-based hybrid RCCs in the solar region ( Rsolar ) were measured using the UV/VIS/NIR (ultraviolet–visible–near infrared) spectrophotometer (Lambda 950, PerkinElmer Inc., Waltham, MA, USA) with an integrating sphere setup. The transmittance and reflectance spectra of the hybrid RCCs within the atmospheric transparent window region (8–14 μm) were obtained using a Fourier transform infrared spectrometer (Nicolet 6700, Thermo Fisher Scientific Inc., Waltham, MA, USA) equipped with an infrared integrating sphere. The emissivity/absorptivity of the coatings were then calculated as 1—Reflectance—Transmittance. Since the transmittance of all samples is nearly zero, the emissivity spectra in the atmospheric window can essentially be determined by 1—Reflectance.
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8

Characterization of Core-Shell Nanoparticles

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A field emission scanning electron microscopy (SEM; S4800; Hitachi, Japan) was used to observe the morphology of the TiO2 on the surface of silica nanoparticles. Fourier transform infrared spectroscopy (FTIR; Nicolet 6700; American) of the core–shell nanoparticle was obtained in the region 400–4000 cm−1. The thickness of the shell was investigated by Transmission Electron Microscope (TEM; Tecnai F20; EI, America). The crystalline structure of the core–shell nanoparticle was characterized using TEM selected-area electron diffraction (SAED). The haze of the coating was measured by a haze meter (WGT-S, Shanghai Chenguang Instrument CO. LTD). The transmission and reflection of the coating were measured by an ultraviolet visible near-infrared spectrophotometer (UV-Vis-NIR; Lambda 950; Perkin Elmer, America). The incident angle dependence reflectivity were tested via the spectroscopic ellipsometry measurements (M-2000DI, J.A.Woollam Co, Inc, USA). The photographs of the films were recorded with a Canon EOS 500D digital camera.
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9

Comprehensive Characterization of Ag Nanoparticles

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The morphology of the Ag nanoparticles was observed with a transmission electron microscopy (TEM) (HT770) operating at 80 kV and a scanning electron microscope (SEM) (Hitachi SU-8010) operating at 5.0 kV. The microstructure of the electrodeposited Ag nanoparticles was determined by an X-ray diffraction spectrometer (XRD) (D/Max 2550 pc). The formation efficiency of the Ag nanoparticles was estimated using a thermal gravimetric analyzer (DSCQ1000) through annealing the colloidal solution under the protection of nitrogen. All of the photographs were recorded by a digital camera (Canon EOS750D). SERS measurements were performed on a confocal Raman microscopic system (LabRAM HR Evolution, France). The excitation wavelength was 633 nm generated by an Nd: yttrium-aluminum-garnet laser operating at a power of about 0.25 mW. The accumulation time for the SERS signals was 10 s. Fourier transform infrared spectroscopy (FTIR) and X-ray photoelectron spectroscopy (XPS) measurements were operated on a Nicolet 5700 FTIR spectrometer and an Axis Supra XPS spectrometer, respectively. The absorption spectra were obtained using an ultraviolet-visible-near infrared spectrophotometer (PerkinElmer Lambda 950).
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10

Characterization of CuInS2 Nanostructures

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The phase and crystallographic structure of the prepared products were characterized by X-ray diffraction on a Bruker D8 Advance X-ray powder diffractometer (XRD) with Cu radiation source (λ = 0.15418 nm). Scanning electron microscopy (SEM) images were acquired using a FEI Nova NanoSEM 450 scanning electron microscope (FEI, Hillsboro, OR, USA). Transmission electron microscopy (TEM) images were performed on a JEOL JEM-2010 electron microscope (JEOL, Akishima-shi, Tokyo, Japan) operating at 200 kV. X-ray photoelectron spectroscopy (XPS) analysis was performed with a Kratos Axis Ultra system using monochromatic Al Kα X-rays (1,486.6 eV). The UV-vis absorption spectra were obtained by using UV-vis Spectrometer (Perkin-Elmer, Lambda 950, Waltham, MA, USA). The simulated crystal structures and wurtzite XRD patterns of CuInS2 were obtained by using Diamond 3.2 programs.
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