S 4800
The S-4800 is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It provides high-resolution imaging capabilities for a wide range of applications. The S-4800 utilizes a field emission electron source to generate a focused electron beam, enabling detailed examination of samples at the nanoscale level.
Lab products found in correlation
83 protocols using s 4800
Scanning Electron Microscopy of Cochlear Mutants
Characterization of Porous Carbons
Multi-Technique Characterization of Materials
Octocoral Specimen Collection and Analysis
Specimens were previously deposited in Miyazaki University, Fisheries Sciences (
Characterization of Nanomaterial Morphology
Sintering Shrinkage and Microstructural Characterization
The Archimedes’ principle density measurements were employed to determine the relative densities of all samples. The phase composition of all samples was determined using XRD (Bruker D8 Advance) with Cu-Kα radiation with a step size of 0.02° 2θ over a scanning range of 15–85° 2θ. Microstructural characterization was performed using FESEM (Hitachi S-4800) and HRTEM (JEOL 200CX) at an accelerating voltage of 200 kV.
FTIR spectra were recorded on a Bruker TENSOR27 spectrometer with sample material embedded in KBr disks. Grind the samples thoroughly with an agate mortar. Transfer weighed amounts of sample powder (particle size <10 μm) approximate 1 mg, and KBr (GR) dry powder approximate 200 mg. The two powders were mixed evenly and ground thoroughly while baked with an infrared heat lamp. Transfer the ground mixture into a mold with 10 mm inner diameter and pressurize to 10 MPa, then remove the pressed translucent disk. The spectrometer runs the background channel without a sample, then puts the disk and runs the sample channel. The scanning range is 3000–400 cm−1.
Characterization of Fe3O4/CNT Nanocomposites
Scanning Electron Microscopy of Dried Specimens
CaCO3 Morphological Characterization
CaCO3 were observed
by field emission scanning electron microscopy (SEM, Hitachi S-4800),
field emission TEM (HR-TEM, JEOL JEM-2100F). Polymorphs of the formed
and undissolved CaCO3 were investigated with 2D-XRD (at
the 4C2 beamline of the Pohang Accelerator Laboratory) and XRD (D/max
2500, Rigaku) with the θ/2θ scan mode and 0.154 nm Cu
Kα radiation.
Characterization of Co3O4@PPy Nanocomposite
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