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73 protocols using rint 2000

1

Multifaceted Characterization of Composite Materials

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XRD measurements were carried out on X-ray diffraction (XRD, Rigaku RINT-2000) with Cu Kα radiation. SEM studies were carried out on a JSM-6700Femission SEM instrument. TEM studies were carried out on high-resolution transmission electron microscopy (HRTEM Philips TecnaiF20, 200 kV). Thermogravimetric analysis conducted on DTG-60 instrument was used to determine the sulfur content of the composite under an argon flow. Brunauer–Emmett–Teller (BET) measurements were carried out on a JW-BK200C surface area analyzer operating at nitrogen atmosphere and the adsorption temperature of 77 k. Samples were dried for 24 h in vacuum at 60 °C prior to the characterization.
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2

Comprehensive Structural and Elemental Analysis

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The crystalline structure was identified by XRD analysis (Rigaku RINT-2000) using Cu Kα radiation at 40 kV and 40 mA. The surface elemental composition was determined by XPS (ESCALAB 250xi, Thermo Fisher Scientific). SEM and TEM were performed using FE-SEM-Supra 55 (Zeiss, Germany) and JEM-2100F (JEOL, Japan) systems. Ultraviolet (UV)–visible diffuse reflectance spectra were performed on a UV-2600 (Shimadzu) spectrometer using BaSO4 as the reference. The elemental contents were analyzed using ICP-OES-720ES inductively coupled plasma optical emission spectroscopy (Agilent, USA).
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3

Clonidine Powder Stability Analysis

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Clonidine powders stored in the “bottle (closed)” condition for 60, 90, and 120 days were subjected to powder X-ray diffraction (PXRD) analysis. The PXRD analysis was conducted using a RINT 2000 (Rigaku Co., Tokyo, Japan). The crystallinity of the obtained solid phase was measured at 40 kV voltage, 40 mA current, and a 4°/min scan rate with a nickel filter and a CuKα1 radiation source.
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4

Synthesis of Sm1-xYxS Single Crystals

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Single crystals of Sm1−xYxS were grown using Bridgeman method31 (link). Powders of Sm, Y, and S (99.9% or higher purity) weighed at appropriate molar ratios were mixed in a glove box and were sealed in a quartz tube under vacuum (<10−3 Pa). The quartz ampoule was heated at a temperature of T = 873 K for 6 h and was then cooled to 573 K for 24 h. The obtained powder was reground and was then reheated in the same condition. Finally, the obtained powder was reground and was sealed in a tungsten crucible (15 mm diameter, 75 mm long) under vacuum (<10−3 Pa) using an electron beam welding system. The sealed tungsten crucible was heated with an induction heating furnace up to 2453 K for 20 h, held for 2 h, then cooled to 2173 K for 24 h and cooled to 1073 K. Subsequently, the furnace was switched off. We analyzed the compositional ratio between samarium and yttrium using inductively coupled plasma (ICP) method. The obtained crystals were identified as the monosulfide from x-ray powder diffraction measurements at room temperature with Cu Kα radiation (Rint2000; Rigaku Corp.).
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5

Comprehensive Structural Characterization of Samples

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The X-ray diffraction (XRD) patterns of the samples were obtained using a Rigaku RINT 2000 X-ray diffractometer equipped with a monochromatic Cu Kα radiation unit (40 kV, 40 mA). The microstructure of the samples was analyzed by scanning electron microscopy (SEM) using a Hitachi S-8020 scanning electron microscope operated at an accelerating voltage of 10 kV. The microstructure of the samples was further characterized by transmission electron microscopy (TEM) using a transmission electron microscope (JEM-ARM200F “NEO ARM,” JEOL) equipped with aberration correctors for the image- and probe-forming lens systems (CEOS GmbH) and an energy-dispersive X-ray spectrometer (EDS; JED-2300T, JEOL). The TEM and scanning TEM (STEM) observations were conducted at an accelerating voltage of 200 kV.
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6

Characterization of Polymer Composites

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To prepare IR samples, a small amount of VCB and GCB (∼1 mg) was mixed with KBr, which was thoroughly crushed using a mortar and pestle. The mixture was transformed into a thin pellet under a pressure of 104 H2O per m2, which was subjected to molecular vibration measurement by a Fourier transform infrared spectrometer (FTIR; JASCO FTIR-620, Japan). To observe the surface morphology of VCB and GCB, a field emission scanning electron microscope (FE-SEM; JEOL JSM-630F) was utilized at an acceleration voltage of 15 kV.
To determine the presence of the POSS component in the SBR samples, infrared spectra were measured under attenuated total reflection (ATR) conditions. Additional characterizations of POSS were carried out by powder X-ray diffractometry (PXRD; Rigaku RINT 2000, Japan) and nuclear magnetic resonance spectrometry (29Si-NMR, AVANCE III 500; Bruker). A thermogravimetry analyzer (STA 409; Netzsch, Japan) was used to examine the thermal stability of composite materials as a function of time. The temperature-dependent weight loss patterns were monitored under a heating rate of 10 °C min−1 from 25 °C to 600 °C in air.
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7

Characterization of Tamsulosin Pellets

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The morphologies of the drug layer, subsequent SR layer, and final tamsulosin pellet were evaluated using scanning electron microscopy (SEM). Each pellet was fixed using conductive double-sided carbon tape on a brass specimen stub, and SEM analysis was conducted using a tabletop microscope (TM3000; Hitachi, Fukuoka, Japan) operating at a voltage of 15 kV.
DSC was conducted using a Q20 (TA instrument, New Castle, DE, USA) for thermal characterization. Approximately 5 mg of each powder, including tamsulosin, blank pellet, and tamsulosin pellet, was placed in an aluminum crucible and sealed with a hermetic cover. The analysis temperature was increased from 120 to 300 °C at a heating rate of 10 °C/min under a nitrogen purge flow of 20 mL/min.
PXRD was performed using a RINT2000 (Rigaku Corporation, Tokyo, Japan) to obtain the crystallinity of tamsulosin. PXRD analysis was carried out using monochromatic Cu Kα radiation (λ = 1.5406 Å) at 100 mA and 40 kV. Each drug was scanned from 3.0° to 50° (2θ value) with an increment of 0.02°/s.
FT-IR was analyzed to confirm the presence of tamsulosin in the pellet by using a spectrometer (Frontier; PerkinElmer, Waltham, MA, USA). The samples were scanned from 400 to 2000 cm−1 at a resolution of 4 cm−1.
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8

Comprehensive Characterization of Hybrid Structures

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Powder X-ray diffraction (XRD, Rint-2000, Rigaku, Cu Kα radiation, λ = 1.5418 Å) was used to characterize the crystalline structure of the samples. Scanning electron microscope (SEM, JEOL-7100F, 20 kV), transmission electron microscopy (TEM), high-resolution TEM (HRTEM) and HAADF-STEM SAED (JEM-2100F/Titan G260-300 transmission electron microscope) were used to obtain the morphology and structure information. EDX analysis was conducted using an FEI Talos F200X TEM at an acceleration voltage of 200 kV. X-ray photoelectron spectrometer (XPS, Kratos Model XSAM800) equipped with an Mg Kα achromatic X-ray source (1235.6 eV) was used to explore the surface elemental status. Nitrogen adsorption–desorption isotherms (a Tristar-3020 instrument) was used to determine the surface area of the hybrid structures.
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9

Characterization of Y2O3 Phosphor Nanoparticles

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Particles were observed with a transmission electron microscope (TEM, H-7650, Hitachi). Particle size was determined from TEM images using the ‘Analyze particles’ function of ImageJ software (National Institutes of Health). The concentrations of rare-earth elements in the NPs were calibrated with an inductively coupled plasma atomic emission spectroscope (ICP-AES, ICPS-8100, Shimadzu). Structural analyses of the NPs were conducted by using X-ray diffraction (XRD) with Cu Kα1 radiation (Rint2000, Rigaku). Near-infrared luminescent spectra of Y2O3 phosphors excited by a 980 nm NIR diode laser (IRM980TR-500, Laser Century) were measured with a spectrometer (NIRQUEST512, Oceanoptics) as shown in Fig. S1. Cathodoluminescent spectra and images of the NPs were measured with a spectrometer (TRIAX-320, Horiba-Jobin Yvon) and a cooled CCD camera (CCD-1024 × 256-4, Horiba-Jobin Yvon) placed in a CL measurement unit (Horiba) attached to an FE-SEM instrument (JSM-6500F, JEOL) as shown in Fig. S2.
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10

Comprehensive Structural Characterization of MECN and MnMoO4

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X-ray diffraction (XRD) was performed with a Rigaku RINT2000. The surface morphology and microstructure of the MECN and MnMoO4 were examined using field-emission scanning electron microscopy (FE-SEM; JEOL, JSM-7001F, Japan) equipped with an energy-dispersive X-ray spectrometer. The Raman spectra were recorded from 200 to 1000 cm−1 on an Olympus BX41 Raman Microprobe using a 524.4 nm argon ion laser. Transmission electron microscopy (TEM) was conducted with a JEOL JEM-2100 FEF. The onset temperature and energy release were monitored by differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) (Mettler Toledo, TGA/DSC 1).
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