Ttrax 3

The top-view morphology and crystallographic structures of the IMCs were observed using SEM and X-ray diffraction (XRD), respectively. The alloy sample was chemically etched to remove the excess solder and expose the IMCs. This allowed us to observe the top-view morphology and identify the crystallographic structures of the IMCs. A high-power X-ray diffractometer (18 kW) (Rigaku, TTRAX3, Tokyo, Japan) with a Cu-Kα source was used to identify the crystallographic structures of the IMCs.

The XRD spectra for PCL/G scaffolds were produced on a high-power (18 kW) XRD (Rigaku, TTRAX3, Japan). The determinations were carried out using radiation of λ = 1.54 Å in a range of 2θ = 10~50° at a scan rate of 4°/min. They were then analyzed by fitting a Lorentzian curve for height (intensity) using Origin Pro 2022 software [23 (link)].

The crystal structure of the synthesized C-doped TiO₂ was determined by X-ray diffraction (XRD; Rigaku TTRAX 3) with Cu Kα radiation at a speed of 2° per minute at 40 kV and 30 mA from 20° to 60°.The surface morphology and particle size of C-doped TiO₂ were characterized by a scanning electron microscope (SEM; Nova Nano SEM 450). The structure and diffraction pattern of the material were analyzed by a transmission electron microscope (TEM; JEOL 2010F). The particle size of the material was reconfirmed via Zetasizer (Malvern Nano ZS). The chemical composition of the material was analyzed by an energy dispersive spectrometer (EDS; Nova Nano SEM 450) SEM attachment. To confirm that carbon had been doped in titanium dioxide and formed the bonding, C-doped TiO₂ was measured by auger electron spectroscopy (AES; JEOL JAMP 9510F) and X-ray photoelectron spectroscopy (XPS; Theta Probe).

A scanning electron microscope with an EDS detector (JEOL JSM6510, Tokyo, Japan, accelerating voltage 0.5–30 kV, magnification 5×–300,000×) was used to analyze the surface and cross-section of the MAO film. An X-ray diffractometer (XRD; Rigaku TTRAX 3, Rigaku Co., Ltd., Tokyo, Japan) using a characteristic wavelength of λ = 1.542 Å, a scanning rate of 1.4 degrees/min, and a diffraction angle 2θ range of 20° to 80° was employed to analyze the phase composition. The operating voltage of the diffractometer was set at 15 kV, and the operating current was 300 mA. The average center line roughness (Ra) was measured using the machine (model Mitutoyo SJ-201, Mitutoyo Co., Aurora, IL, USA).

The crystal structure of the eggshell was analyzed via eggshell powder, prepared as described in the acid-base titration, with a Rigaku TTRAX 3 high-power X-ray diffractometer. The Cu Kα emission spectrum was used, which corresponded to an X-ray wavelength of 1.5406 Å, and the diffraction angle 2θ ranged from 20 to 60 degrees using a 0.02° step width. Comparing the XRD patterns with the database (Powder Diffraction File, JCPDS), we can determine the eggshell crystal structure. We used ostrich and chicken eggshells as representatives. We also measured the XRD pattern of synthetic single-crystal calcite (MTI Corporation) for reference.

The local crystal and atomic structures of the prepared electrodes were examined using X-ray diffraction (XRD) (RIGAKU TTRAX III) and X-ray absorption spectroscopy (XAS) (BL. 2.2, SLRI, Thailand), respectively. The morphological and microstructural characteristics of the prepared materials were studied using transmission electron microscopy (TEM) (FEI, TECNAI G2 20) and scanning electron microscopy (FEI, Helios Nano Lab G3 C). To estimate the domain sizes of Li₂MnO₃ and LiCoO₂, HRTEM images showing clear Li₂MnO₃ and LiCoO₂ domains were selected. Then, the selected domains were carefully traced. Afterwards, the areas inside the traced figures were determined using the measuring function of ImageJ software. The 2D areas, obtained from several Li₂MnO₃ and LiCoO₂ domains of at least five individual particles with sizes of around 100 nm were averaged. Moreover, X'Pert HighScore Plus software was used to identify the phases of the synthesized materials from the obtained x-ray diffraction patterns. Rietveld refinement was done to calculate lattice parameters. Mn–O, Mn-TM, Co–O, and Co-TM bond lengths were obtained by EXAFS fitting using Artemis software.

The microstructure of the fabricated samples were observed using scanning electron microscopy (JEOL JSM 7800 Prime, Japan). Porosity and pore size were determined by a mercury porosimeter (AutoPore V 9600, Micromeritics Instrument Cooperation, USA) using pressure between 0.10 and 61,000 psia at 20–21 °C. Next, the samples' phase composition was examined using an X-ray diffractometer (XRD, Rigaku TTRAX III, USA) with Cu source Kα line focused radiation (λ = 0.15406 nm) operating at 300 mA and 50 kV. The measurement was conducted at 2–42° 2θ using a scan speed of 3° per minute and a step angle of 0.02°. The XRD pattern was then analyzed for phase composition using the powder diffraction file (PDF), which allowed searching for the ICDD database product. The phase content percentage was then calculated using the Rietveld refinement method (JADE software).