Rint ultima 3

Manufactured by Rigaku

Sourced in Japan

The RINT-Ultima III is a versatile X-ray diffractometer (XRD) manufactured by Rigaku. As a core function, it is designed to perform high-resolution powder X-ray diffraction analysis to identify crystalline materials and determine their structural properties.

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Lab products found in correlation

Nicolet 6700, by Thermo Fisher Scientific (3 mentions) Miniscope tm3000, by Hitachi (1 mentions) Quanta feg 250, by Hitachi (1 mentions) Sic paper, by Buehler (1 mentions) Spm 9600, by Shimadzu (1 mentions) S 4800, by Hitachi (1 mentions) Nrs 1000, by Jasco (1 mentions) Ft ir 6200, by Jasco (1 mentions) Gemini 7, by Micromeritics (1 mentions) Fp 6600 spectrofluorometer, by Jasco (1 mentions) V 670 spectrophotometer, by Jasco (1 mentions) Eca 600 spectrometer, by JEOL (1 mentions) Su9000 microscope, by Hitachi (1 mentions) Icpe 9000, by Shimadzu (1 mentions) Jem 2010f, by JEOL (1 mentions) Thermo plus tg8120, by Rigaku (1 mentions) Jspm 5200, by JEOL (1 mentions) Su8000, by Hitachi (1 mentions) Irtracer 100, by Shimadzu (1 mentions)

15 protocols using rint ultima 3

Amorphous RBM Stability in Granules

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In order to compare the stability of the amorphous state of RBM in each granule type, 4 g of each sample was placed into containers at 30% RH or 75% RH, with an ambient temperature ca. 20 °C, for the specified time periods (6 months at maximum). The samples were promptly measured by X-ray diffraction (XRD) upon removal of the lid at each time point.
The XRD pattern of each sample was collected using RINT-Ultima III (Rigaku, Tokyo, Japan) with Cu Kα radiation (40 kV × 40 mA). The diffraction angle range was from 5° to 45° in 2-theta, with a step of 0.02° and scanned at 15°/min. Relatively large granules were ground using manual grinding in an agate mortar for adequate XRD analysis.

Tanaka R., Hattori Y., Horie Y., Kamada H., Nagato T, & Otsuka M. (2019). Characterization of Amorphous Solid Dispersion of Pharmaceutical Compound with pH-Dependent Solubility Prepared by Continuous-Spray Granulator. Pharmaceutics, 11(4), 159.

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Accelerated Degradation Test of Sintered Ceramics

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The accelerated degradation test was performed in water at a temperature and pressure of 140°C and 0.4 MPa, respectively. The sintered disk-shaped bodies were placed in a polytetrafluoroethylene (PTFE) container with distilled water. The PTFE container was inserted into a stainless steel airtight container, and the stainless steel container was subsequently heated in a high-temperature oven (model PVH-111, Espec, Japan). The LTD process was measured by the f_m on the specimen surface obtained via the XRD technique. XRD patterns were measured at room temperature using a powder diffractometer (model RINT Ultima III, Rigaku, Japan) equipped with a monochromatic CuKα radiation source. The diffraction patterns were obtained within the 26° ≤ 2θ ≤ 33° range in 0.02° steps at a scan speed of 1°/min. The shape of the diffraction line was fitted using a Pearson VII function28 . The f_m was determined using the formula: where I is the integrated intensity and subscripts m, t, and c denote monoclinic, tetragonal, and cubic, respectively.

Matsui K., Yoshida H, & Ikuhara Y. (2014). Nanocrystalline, Ultra-Degradation-Resistant Zirconia: Its Grain Boundary Nanostructure and Nanochemistry. Scientific Reports, 4, 4758.

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Magnesium Alloy Surface Coatings

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AZ31 disks of 15 mm diameter and 1 mm thickness were cut from extruded rods (Osaka Fuji Co., Amagasaki, Japan). The composition of the AZ31 rod is shown in Table 1. The surface of disks was ground with SiC papers (Buehler, IL, USA) up to #1200 and rinsed ultrasonically in acetone. Mechanically ground AZ31 disks were named Mpol-AZ31.
Coating treatment solutions were prepared with 500 mmol l⁻¹ ethylenediaminetetraacetic acid (EDTA) calcium disodium salt hydrate (C₁₀H₁₂CaN₂Na₂O₈, Ca-EDTA) solution, 500 mmol l⁻¹ potassium dihydrogenphosphate (KH₂PO₄) solution, and 1 mol l⁻¹ sodium hydroxide (NaOH) solution. The same volumes of the Ca-EDTA and KH₂PO₄ solutions were mixed and the pH was adjusted to 6.1 or 8.9 with the NaOH solution. Mpol-AZ31 disks were immersed in the treatment solutions at 90°C for 2 h. The pH of the solutions did not change after the treatment. OCP and HAp coatings were formed at pH 6.1 and 8.9, respectively. OCP- and HAp-coated AZ31 specimens were named OCP- and HAp-AZ31, respectively. The crystal structure was analyzed by X-ray diffraction (XRD) (RINT Ultima III, Rigaku, Tokyo, Japan). The surface and cross-sectional morphology of the coatings was observed by scanning electron microscope (SEM; FEI Quanta FEG250, OR, USA and Miniscope TM3000, Hitachi, Tokyo, Japan). Cross-section specimens were prepared by scraping off the OCP and HAp coatings with a cutter.

Hiromoto S, & Yamazaki T. (2017). Micromorphological effect of calcium phosphate coating on compatibility of magnesium alloy with osteoblast. Science and Technology of Advanced Materials, 18(1), 96-109.

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XRD Analysis of Aluminum Hydroxide and Silicate

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The filter residues of co-precipitation and simple adsorption were analyzed by XRD (RIGAKU, Inc. RINT Ultima III, Tokyo, Japan). For XRD analysis, the initial Al concentration was adjusted to 40 mg·dm⁻³ and the initial Si concentration was varied according to the Si/Al molar ratio. The filter residues from the co-precipitation and adsorption experiments were freeze-dried at −45 °C and 10 Pa for at least 24 h to avoid crystallization or mineralogical transformation.
Powder XRD patterns were obtained using a copper target (Cu Kα), a crystal graphite monochromator and a scintillation detector. The X-ray source was operated at 40 kV and 30 mA by step-scanning from 2° to 80° 2θ at increments of 0.02° 2θ. A crystal sample holder was used and the diffractograms were not corrected by background diffraction. Powder diffraction files (PDF) from the International Centre for Diffraction Data (ICDD) were used as references using Jade 6.0 software for observation of aluminum hydroxide.
Aluminum hydroxide and aluminum silicate were also analyzed as reference materials. Aluminum hydroxide was prepared from a 40 mg·dm⁻³ aluminum solution at pH 9. Aluminum silicate was purchased from Kanto Chemicals Inc.

Tokoro C., Suzuki S., Haraguchi D, & Izawa S. (2014). Silicate Removal in Aluminum Hydroxide Co-Precipitation Process. Materials, 7(2), 1084-1096.

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Rapid Cu Thin Film Deposition

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c Plane sapphire (Kyocera,
Kyoto, Japan) or SiO₂ (50 nm)/Si substrates (2 × 2
cm²) were pre-treated
by dipping into H₂O₂/H₂SO₄ = 1/3 solution for 5 min and rinsing in deionized water. The substrate
was dried by N₂-gas blow, set on a quartz glass stage in
a vacuum chamber with the substrate surface facing down, and evacuated
to 1–5 × 10^–4 Pa by a turbo-molecular
pump. Then, a 1–3 μm thick Cu film was deposited on the
substrate (heated at 400 °C) by RVD for 10–30 s, by heating
of Cu wire (99.9%, 1 mm φ, 20 mm in length, Nilaco; Tokyo, Japan)
to 1700–1800 °C using a tungsten boat. During RVD, the
pressure in the chamber increased to ∼1 × 10^–3 Pa due to gas emission from the hot Cu source. The deposited Cu
films were analyzed by SEM (Hitachi S-4800; Tokyo, Japan) equipped
with EDS (Genesis; AMETEK EDAX, Berwyn, PA), XRD (RINT-Ultima III;
Rigaku, Akishima, Japan), and AFM (SPM-9600; SHIMADZU, Kyoto, Japan).

Nagai Y., Okawa A., Minamide T., Hasegawa K., Sugime H, & Noda S. (2017). Ten-Second Epitaxy of Cu on Repeatedly Used Sapphire for Practical Production of High-Quality Graphene. ACS Omega, 2(7), 3354-3362.

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Catalyst Characterization by Spectroscopic Methods

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FT–IR spectra were recorded on a spectrometer (FT-IR/6200; Jasco Corp.) using a KBr pelletizing method. Raman spectra were recorded on a Raman spectrometer (excitation line λ = 532 nm, NRS-1000; Jasco Corp.). The crystalline structure was characterized using powder X-ray diffraction (XRD, RINT-Ultima III; Rigaku Corp.) operating at 40 kV and 40 mA with Cu-Kα radiation. The specific surface area of the catalyst was measured using N₂ adsorption using the BET method (Gemini VII; Micromeritics Instrument Corp.) after pre-treatment at 473 K in N₂ atmosphere for 2 h. Results of BET measurements are presented in Supplementary Information Table S10. W L₃-edge X-ray absorption fine structure (XAFS) spectra were recorded on BL14B2 in SPring-8 (Hyogo, Japan). Catalysts treated in the reaction condition were ground into powder and were pressed into pellets. Then, pellets were packed into gas-barrier bags. The pellets were diluted with BN to adjust for XAFS measurement. EXAFS analysis and curve fitting were performed using software (Athena ver. 0.8.056; Artemis ver. 0.8.012).

Sugiura K., Ogo S., Iwasaki K., Yabe T, & Sekine Y. (2016). Low-temperature catalytic oxidative coupling of methane in an electric field over a Ce–W–O catalyst system. Scientific Reports, 6, 25154.

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Characterization of CsPbBr3-xIx Perovskite

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The glass/FTO/CsPbBr_3-xI_x substrates (where x varies between 0, 0.1, 0.2, and 0.3 in molar ratio) were characterized by several techniques. The UV-Visible spectra was performed via JASCO V-670 spectrophotometer from 200–900 nm. The emission spectra were obtained from JASCO FP- 6600 spectrofluorometer from 450–600 nm. The valence band of perovskite was measured through Ultraviolet Photo Electron Spectroscopy (UPS) (BUNKOUKEIKI). The X-Ray diffraction (XRD) was conducted through RINT-Ultima III, Rigaku in 2θ range from 14 to 50 degrees using monochromatic CuK_α radiation. The surface morphologies of the perovskite materials were investigated using a Quanta 400F FE-SEM equipped with an EDX feature.

Ng C.H., Ripolles T.S., Hamada K., Teo S.H., Lim H.N., Bisquert J, & Hayase S. (2018). Tunable Open Circuit Voltage by Engineering Inorganic Cesium Lead Bromide/Iodide Perovskite Solar Cells. Scientific Reports, 8, 2482.

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XRD Characterization of S-CP Product

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All the test samples were crystallographically characterized using XRD (RINT-Ultima-III, Rigaku Co., Tokyo, Japan; Cu Kα radiation, 40 kV, 40 mA, scan speed = 4°/min). The XRD area was obtained by integrating the recorded XRD profiles for 2θ = 5–45°. The XRD %area (XRD%) of the ground S-CP product was evaluated based on the total area of the XRD-time profile between 2θ = 5 and 45° using the XRD computer software JADE (Materials Data Inc., Livermore, CA, USA); the XRD% of the initial S-CP was assumed to be 100% crystalline.

Otsuka M., Saito H, & Sasaki T. (2022). Analytical Evaluation of Wet and Dry Mechanochemical Syntheses of Calcium-Deficient Hydroxyapatite Containing Zinc Using X-ray Diffractometry and Near-Infrared Spectroscopy. Pharmaceutics, 14(10), 2105.

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Comprehensive Material Characterization Protocol

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The appearance of the sintered sample was examined by scanning electron microscopy (SEM; Hitachi S-3400N) with a conventional tungsten emitter, while its compositional homogeneity was evaluated using a coupled energy-dispersive X-ray spectroscopy (EDS) system at an accelerating voltage of 15 kV. The chemical properties of the sample were evaluated by ICP-AES using a Thermo Fischer Scientific IRIS Advantage DUO instrument. The phase and structure of the sample were identified by powder XRD measurements (Rigaku Rint-Ultima III) at room temperature with Cu Kα radiation at 40 kV. The diffraction angle (2θ) range was 20–100° with a step size of 0.02°. Rietveld analyses were carried out using “Z-Rietveld 1.1.3” soft wear^{48 (link),49 (link)}. The phase stability of the sample was examined by DSC (SII EXSTAR 6000) from room temperature (293 K) to 1100 K at heating and cooling rates of 10 K/min under a flow of 99.99999% Ar (50 mL/min).
Magnetic measurements were performed at a heating rate of 2 K/min using a superconducting quantum interference device magnetometer and a vibration sample magnetometer equipped with a physical property measurement system (Quantum Design Ltd).

Semboshi S., Umetsu R.Y., Kawahito Y, & Akai H. (2022). A new type of half-metallic fully compensated ferrimagnet. Scientific Reports, 12, 10687.

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Crystal Structure Analysis of Ti-Nb Wires

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Before XRD analysis, specimens with or without PTFE coating had the colored oxide film on their metallic surfaces removed by SiC-paper #400 and #800 to expose their metallic-colored surfaces. The specimens, i.e. bundled wires, were then washed under running water, followed by distilled water, acetone, and ethanol.
The crystal structural changes of the washed wire specimens that had been heated during PTFE-coating were examined by XRD using an X-ray diffractometer (RINT-UltimaIII, Rigaku, Tokyo, Japan). XRD analysis was performed with Cu Kα radiation at 40 kV and 40 mA at 2θ/θ-scanning mode, with the angle of the incident X-ray beam (θ) from 15° to 45° scanned speed at 1.0°/min with scanning step at 0.02°. To evaluate the deduced ω phase of Ti-Nb wires at 75-85°, we obtained the eighttimes integrated data of eight-times measurement at 2θ/θ-scanning mode with 0.02° step for 4s (Fig. 1).

Kameda T., Sato H., Oka S., Miyazaki A., Ohkuma K, & Terada K. (2020). Low temperature polytetrafluoroethylene (PTFE) coating improves the appearance of orthodontic wires without changing their mechanical properties. Dental materials journal, 39(5).

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