A Cu-Kα radiation X-ray diffractometer (Rigaku Inc., Tokyo, Japan) was used for X-ray powder diffractometry (XRD) to verify the formation of the products. A Raman spectrometer (Horiba Inc., Paris, France) was used to analyze the crystal structure of the prepared samples. An X-ray photoelectron spectroscope (Thermo Inc., Waltham, MA, USA) recorded the samples’ X-ray photoelectron spectrum (XPS). A Fourier Infrared Spectrometer (Thermo Inc., Waltham, MA, USA) was used to record the Fourier Transform Infrared (FT-IR) spectrum (S2) of the samples. The SEM micrographs were collected using a field emission environmental scanning electron microscope (FEI Inc., Hillsboro, OR, USA) equipped with an EDX microanalyzer. A field emission high-resolution projection electron microscope (FEI Inc., Hillsboro, OR, USA) was used to characterize the morphology of the prepared samples (S3).
X ray photoelectron spectroscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The X-ray photoelectron spectroscope is an analytical instrument used to measure the elemental composition and chemical state of the surface of a material. It works by irradiating a sample with X-rays and analyzing the energy of the emitted photoelectrons.
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Lab products found in correlation
Raman spectrometer, by Horiba (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
Lambda ez210 uv vis spectrophotometer, by PerkinElmer (1 mentions)
Jem 2100, by Hitachi (1 mentions)
Infinite 200 pro, by Tecan (1 mentions)
Oxford x max, by Oxford Instruments (1 mentions)
Elmasonic p 180 h, by Elma Schmidbauer (1 mentions)
X ray diffractometer, by Thermo Fisher Scientific (1 mentions)
Eos 350d digital camera, by Canon (1 mentions)
5 protocols using x ray photoelectron spectroscope
1
Comprehensive Characterization of Prepared Samples
2
Comprehensive Material Characterization Protocol
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The elemental composition and chemical state of the samples were measured by a Thermo Fisher X-ray photoelectron spectroscope (non-monochromated Al Kα radiation, photon energy 1486.7 eV). And the spectrometer was calibrated by the binding energy of C1s line (284.6 eV). The microstructure of the samples was examined on their surfaces and fractural cross-sections by FE-SEM (LEO-1530). From the obtained SEM images, the grain size and film thickness of the samples were evaluated by the Nano Measurer software. The elemental distribution in the samples was analyzed by an attached EDX system. The phase composition of the samples was identified by grazing incidence XRD (GI-XRD, D/max-RB, Cu Kα radiation, and λ = 1.5418 Å) through a continuous scanning mode at a speed of 6°/min with an X-ray incidence angle of 0.5°.
3
Characterization of Carbon Dots with Beta-Cyclodextrin
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UV-vis absorption spectra were obtained using a Lambda EZ210 UV-vis spectrophotometer (Perkin Elmer, USA). Fluorescence spectra were obtained using an F-7000 Fluorescence Spectrophotometer (Hitachi, Japan). The excitation and emission slits were both maintained at 5.0 nm and 5.0 nm. Versatile disc fluorescence/absorption spectra were recorded on Infinite 200 PRO (Tecan, USA). The morphology and mean diameter of C-dot@β-CD were obtained using a transmission electron microscope (TEM, JEM-2100, Hitachi, Japan). X-ray photoelectron spectroscopy (XPS) was conducted using an X-ray photoelectron spectroscope (K-Alpha, Thermo, USA). Cyclic voltammetry was carried out on the CHI624A electrochemical system (Chenhua Instrument, USA). Cyclic voltammograms were measured using an electrochemical workstation (Chenhua Instrument CHI624A, USA) with a conventional three-electrode system including a glassy carbon electrode as the working electrode. Ag/AgCl and platinum wire were used as the reference electrode and counter electrode, respectively.35 (link)
4
Advanced Characterization of Novel Materials
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This study was carried out with the aid of the following instruments: scanning electron microscope (JEOL JSAM 6300, Jeol, Tokyo, Japan), energy-dispersive X-ray spectroscopy system (X-Max Oxford, Oxford Instruments, Abingdon, UK), Fourier transform infrared spectrometer (Perkin Elmer 2000, Waltham, MA, USA), Sonicator (Elma Sonic P180H, Elma Schmidbauer GmbH, Mannheim, Germany), thermogravimetric analyzer (Mettler Toledo, Greifensee, Switzerland), X-ray diffractometer (Thermo Scientific, Waltham, MA, USA), X-ray photoelectron spectroscope (Thermo Scientific, Waltham, MA, USA) and 4-probe conductivity meter (DMV-001, SES Instrumentation PVT. LTD., Roorkee, India) electrochemical workstation (Autolab AUT85587, Utrecht, The Netherlands).
5
Synthesis and Characterization of Functionalized Nanomaterials
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ρ-Phenylenediamine (ρ-PDA), petroleum ether (PE), silica gel (xSiO2·yH2O), ethyl acetate (EA), citric acid (CA), ethylenediamine (EDA), disodium hydrogen phosphate (Na2HPO4·12H2O), sodium dihydrogen phosphate (NaH2PO4·2H2O), sodium chloride (NaCl), potassium chloride (KCl), ethanol, quartz sand, deionized water, and securities paper were purchased from Aladdin Ltd. All chemicals were used as received and did not require further purification. Deionized water (18.2 MΩ cm) was produced by a Millipore water purification system.
A DZF-6020 vacuum dryer (Shanghai Xinmiao Co., Ltd.), AL-204-IC electronic analysis balance (METTLER-TOLEDO), HP Printer 2050 (China Hewlett–Packard Co., Ltd.), KQ-300DE ultrasound cleaner (Kunshan Instrument Co., Ltd.), H1650-W centrifuge (Hunan Instrument Co., Ltd.), FP-6500 fluorescence spectrometer (Jusco (Shanghai) Trading Co., Ltd), UV-3600 ultraviolet-visible spectrometer (Shimadzu Instruments and Equipment Co., Ltd.), TEM-2100 transmission electron microscope (Japan Electronics Co., Ltd.), FT-IR-5700 (Thermo Co., USA), X-ray photoelectron spectroscope (Thermo Fisher, UK), H-G lamp, Canon EOS 350D digital camera, and USB portable UV lamp (365 nm) were used.
A DZF-6020 vacuum dryer (Shanghai Xinmiao Co., Ltd.), AL-204-IC electronic analysis balance (METTLER-TOLEDO), HP Printer 2050 (China Hewlett–Packard Co., Ltd.), KQ-300DE ultrasound cleaner (Kunshan Instrument Co., Ltd.), H1650-W centrifuge (Hunan Instrument Co., Ltd.), FP-6500 fluorescence spectrometer (Jusco (Shanghai) Trading Co., Ltd), UV-3600 ultraviolet-visible spectrometer (Shimadzu Instruments and Equipment Co., Ltd.), TEM-2100 transmission electron microscope (Japan Electronics Co., Ltd.), FT-IR-5700 (Thermo Co., USA), X-ray photoelectron spectroscope (Thermo Fisher, UK), H-G lamp, Canon EOS 350D digital camera, and USB portable UV lamp (365 nm) were used.
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