7401f field emission scanning electron microscope

Manufactured by JEOL

Sourced in Japan

The JEOL 7401F is a field emission scanning electron microscope. It is designed to produce high-resolution images of microscopic samples.

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Lab products found in correlation

Ion beam coater 610, by Ametek (2 mentions) Samdri 795 critical point dryer, by Tousimis (2 mentions) Tepon 812 epoxy resin, by Tousimis (1 mentions) Em uc7 ultramicrotome, by Leica (1 mentions) 12 well transwell insert, by Corning (1 mentions) Pan alytical x pert pro diffractometer, by Malvern Panalytical (1 mentions)

Spelling variants of this product

Scanning electron microscope (93 citations) Field-emission scanning electron microscope (11 citations) JSM-7401F Field Emission Scanning Electron Microscope (8 citations)

5 protocols using 7401f field emission scanning electron microscope

Ultrastructural Analysis of Laser-Treated Skin

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Laser-treated skin was fixed in Karnovsky’s fixative followed by washing and dehydrating with ascending concentrations of alcohol. Samples were then critical-pointdried, coated with Chromium, and analyzed in a JEOL 7401F Field Emission Scanning Electron Microscope.

Chen X., Kositratna G., Zhou C., Manstein D, & Wu M.X. (2014). Micro-fractional epidermal powder delivery for improved skin vaccination. Journal of controlled release : official journal of the Controlled Release Society, 192, 310-316.

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Scanning Electron Microscopy of Mesh Samples

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Sterile uninfected mesh, untreated infected mesh, and treated infected mesh were processed for Scanning Electron Microscopy (SEM). Samples were placed in ½ strength Karnovsky’s fixative immediately after treatment and imaging. Samples remained in fixative for 24 h prior to embedding.
After fixing the samples for 24 h, they were dehydrated in a series of graded ethanol concentrations. A Tousimis Samdri semi automatic Critical Point Dryer was used to completely dehydrate the samples. The mesh was then mounted on aluminum stubs and coated with Chromium with a GATAN 610 Ion Beam Coater. Samples were then viewed in the SEM at a voltage of 5 kV. For image scanning, a JEOL 7401F Field Emission Scanning Electron Microscope was used. Magnification of images ranged from 25× to 10000×. One to three fields were obtained at each magnification.

Khan S.I., Blumrosen G., Vecchio D., Golberg A., McCormack M.C., Yarmush M.L., Hamblin M.R, & Austen WG J.r. (2015). Eradication of Multidrug-Resistant Pseudomonas Biofilm with Pulsed Electric Fields. Biotechnology and bioengineering, 113(3), 643-650.

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Scanning Electron Microscopy Protocol

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Cell cultures were grown on 12 mm diameter glass coverslips, fixed in ½ strength Karnovsky’s fixative, dehydrated through an ethanol series, critical point dried with a SamDri-795 critical point dryer (Tousimis) and coated with chromium using an Ion Beam Coater 610 (Gatan). Samples were photographed on a JEOL 7401F Field Emission Scanning Electron Microscope (JEOL).

Gipson I.K., Spurr-Michaud S., Tisdale A, & Menon B.B. (2014). Comparison of the Transmembrane Mucins MUC1 and MUC16 in Epithelial Barrier Function. PLoS ONE, 9(6), e100393.

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Histological and Ultrastructural Analysis of Cell Cultures

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Histological assessment was carried out in cell cultures grown on 12‐well Transwell inserts (Corning). The samples were fixed with half strength Karnovsky's fixative, post‐fixed in 2% osmium tetroxide, dehydrated with graded ethyl alcohol solutions and embedded in tEPON‐812 epoxy resin (Tousimis) in a Llynx II EM Tissue Processor (Electron Microscopy Sciences). Semi‐thin (1 μm) sections were cut on a Leica EM UC7 ultramicrotome (Leica Microsystems), stained with toluidine blue and imaged by brightfield microscopy. For scanning electron microscopy, cell cultures were grown on 12 mm diameter glass coverslips, fixed in half strength Karnovsky's fixative, dehydrated through an ethanol series, critical point dried with a SamDri‐795 critical point dryer (Tousimis) and coated with chromium using an Ion Beam Coater 610 (Gatan). Samples were photographed on a JEOL 7401F Field Emission scanning electron microscope (JEOL). The area of cells with unambiguous cell–cell borders was outlined and quantified using ImageJ software (National Institutes of Health).

Woodward A.M., Feeley M.N., Rinaldi J, & Argüeso P. (2021). CRISPR/Cas9 genome editing reveals an essential role for basigin in maintaining a nonkeratinized squamous epithelium in cornea. FASEB BioAdvances, 3(11), 897-908.

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Comprehensive Material Characterization Protocol

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Powder X-ray powder diffraction patterns for all samples were collected with a Panalytical X’pert Pro diffractometer (Malvern Panalytical Ltd., Malvern, United Kingdom) using CuKα radiation, (λ = 1.5418740 Å). Scanning electron microscopy (SEM) micrographs and energy-dispersive spectroscopy (EDS) data were acquired with a JEOL 7401F Field-Emission Scanning Electron Microscope (JEOL Ltd, Tokyo, Japan) and a JEOL 7400F analytical SEM setup (JEOL Ltd, Tokyo, Japan), and a Hitachi TM3000 table top SEM (Hitachi Ltd, Tokyo, Japan) was used for particle size assessments. For the cross-section imaging, the powder samples were mixed with a conductive carbon cement and polished using a JEOL SM-09010-CP cross-section polisher.

Shen Y., Svensson Grape E., Noréus D., Widenkvist E, & Starborg S. (2020). Upcycling of Spent NiMH Battery Material—Reconditioned Battery Alloys Show Faster Activation and Reaction Kinetics than Pristine Alloys. Molecules, 25(10), 2338.

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