The size and shape of the synthesized AgNP were also determined by transmission electron microscopy (TEM) as described by Singhal et al. (2011 (link)). A JEOL electronic microscope (model JEM-2100) operated at 200 kV was used for TEM analysis. The average nanoparticle sizes were measured by counting approximately 100 nanoparticles in different regions of each sample, which were then used for the construction of histograms and determination of the average size of the nanoparticles. Energy dispersive X-ray spectroscopy (EDX), model JEOL-JSM 5410 LV (JEOL, USA). To prepare each sample, AgNP were sonicated for 5 min, and a drop of a diluted sample was placed onto a carbon-coated copper grid for analysis.
Jsm 5410lv
Manufactured by JEOL
Sourced in Japan, United States
The JSM-5410LV is a low-vacuum scanning electron microscope (SEM) designed for materials analysis. It provides high-resolution imaging and elemental analysis capabilities for a wide range of samples, including those that are non-conductive or require minimal sample preparation.
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Lab products found in correlation
Quanta 250, by Thermo Fisher Scientific (3 mentions)
Ftir 8300 spectrometer, by Shimadzu (2 mentions)
Nanodrop nd 1000 v 3.3.1 spectrophotometer, by Thermo Fisher Scientific (2 mentions)
Jem 1400plus, by JEOL (2 mentions)
Eos 5ds r, by Canon (2 mentions)
Smz745t, by Nikon (2 mentions)
Isis 300, by Oxford Instruments (2 mentions)
Lsm 510, by Zeiss (2 mentions)
Jem 2100, by JEOL (1 mentions)
Polaron sc7640, by Quorum Technologies (1 mentions)
Quorum k850, by Quorum Technologies (1 mentions)
Poly l lysine (pll), by Merck Group (1 mentions)
Confocal microscope, by Bio-Rad (1 mentions)
Link isis 300, by Oxford Instruments (1 mentions)
Nanoscope 4, by Veeco (1 mentions)
S 450, by Hitachi (1 mentions)
Scd 040, by JEOL (1 mentions)
Energy dispersive x ray detector, by Oxford Instruments (1 mentions)
Axiovert 2000, by Zeiss (1 mentions)
Mg 63, by European Collection of Cell Cultures (1 mentions)
88 protocols using jsm 5410lv
1
Characterizing AgNP Size and Shape
2
SEM Analysis of Extracted PHBV
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Surface analysis of the extracted PHBV was carried out using SEM (JEOL-JSM-5410LV, JEOL LTD., Tokyo, Japan). Prior to analysis, a sputter coater (Polaron-SC7640, Quorum Technologies, Lewes, UK) was used to apply a gold coating to the sample.
3
Correlative SEM and Confocal Microscopy of Chick and Mouse Embryonic Hindbrains
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Chick and mouse embryos (HH18 and E10.5, respectively) were harvested and fixed for 1 h at room temperature with 2% PFA and glutaraldehyde in 0.1 M phosphate buffer pH 7 and 1% sucrose (all from Sigma-Aldrich). Next, the hindbrains were removed and placed on a coverslip coated with poly-l-lysine (Sigma-Aldrich). Samples were dehydrated in increasing ethanol concentrations (20%, 50%, 70%, 90% and 95%), then washed four times in 100% ethanol. The hindbrain samples were then moved to a Critical Point Dryer (Quorum K850) and were coated with gold in a gold sputter coating unit (Quorum Technologies). Samples were observed by low-vacuum scanning electron microscopy (SEM; JSM 5410 LV, Jeol). For correlative SEM-confocal analysis, hindbrains were taken to immunofluorescence staining as mentioned above, before the dehydration step. Hindbrains were first imaged using a confocal microscope (Zeiss LSM-510, with Argon-Ion and 2 He-Ne Lasers), then processed for SEM preparation.
4
Biomass Surface Morphology Analysis
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The changes in the surface morphology of C and D samples for different biomass types were scanned and photographed using a scanning electron microscope (SEM) (Jeol, JSM-5410LV, Tokyo, Japan). The biomass samples were attached to aluminum stubs using double-sided carbon tape. The C and D samples of RS, SB, and NG were sputter-coated with gold alloy. The scanned images of C and D samples were then studied and compared.
5
Cell Imaging: SEM and CLSM Protocols
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SEM and CLSM imaging were carried out as per previously described methods19 (link) with some modifications. The sample preparation steps for both SEM imaging (fixation, dehydration, critical point drying, and sputter coating) and CLSM imaging (fixation, staining of cytoskeleton actin filaments with phalloidin, and counterstaining of nucleus with propidium iodide) were performed in situ. SEM and CLSM images were obtained with a scanning electron microscope (model JSM 5410LV, JEOL, Japan; operating voltage = 10 kV) and confocal microscope (Biorad, USA), respectively.
6
Scanning Electron Microscopy of Fractured Surfaces
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Fractured surfaces of the bar-shaped specimens of the control, 5Si, and 5Nosi groups after the three-point bending test were randomly selected, gold-sputter coated, and observed using SEM (Quanta 250; FEI Company, Eindhoven, the Netherlands) under acceleration of 20 kV and magnification of 35,000×.
One specimen was selected from the 5Si and 5Nosi groups, carbon-sputter coated, and observed using the EDX detection system built into the SEM instrument (JSM-5410LV; JEOL Ltd., Tokyo, Japan). Zn-mapping images of the surfaces were captured at an acceleration voltage of 20 kV and a magnification of 2,000×.
One specimen was selected from the 5Si and 5Nosi groups, carbon-sputter coated, and observed using the EDX detection system built into the SEM instrument (JSM-5410LV; JEOL Ltd., Tokyo, Japan). Zn-mapping images of the surfaces were captured at an acceleration voltage of 20 kV and a magnification of 2,000×.
7
Eggshell and Tibia Bone Analysis
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A total of 4 eggs from each treatment (1 egg/replicate) were collected and broken to obtain the eggshell samples before the end of the experimental period. Cleaned eggshell samples were dried in an oven at 95 °C for 24 h, ground into a fine powder, and kept in a dry box until analysis. The dried right tibia was finely ground using an electric grinder. To observe the surface morphology of both the ground eggshell and the tibia specimens, scanning electron microscopy (SEM; model JSM-5410LV, JEOL Ltd., Japan) was performed using high vacuum mode at a working distance of 20 mm and an accelerating voltage of 20 kV. In addition, the quantitative analysis of calcium and phosphorus in the eggshell and tibia bone was conducted by energy-dispersive X-ray spectroscopy (EDS; model Link ISIS 300, Oxford Instruments Ltd., UK), combining SEM with the backscattered electron.
8
Scanning Electron Microscopy of Microcapsules
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The morphology of microcapsules was examined using a scanning electron microscope (JEOL, JSM-5410LV, Tokyo, Japan). Microcapsules were mounted on a stainless-steel stub and sputter-coated with gold at a coating condition of 10 kV, 5 mA for 2 min, with an Argon backfill of 10 Pa. Micrographs were recorded at a magnification of 1000× and 5000× and at a resolution of 1280 × 960 pixel.
9
Crystallinity Analysis of TiO2 Films
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X-ray diffractometry with Cu-Kα1 radiation (λ = 0.15405980 nm) over the range of 20° < 2θ < 60° was used to analyze the crystallinity of the TiO2 films deposited on the HGBs. The step and time sizes were 0.02° and 30 s, respectively. We determined the mass percentages of the anatase and rutile phases using the following formulae, which are based on the intensity of the peak at 2θ values of 25.3° (101-plane) for anatase and 27.4° (110-plane) for rutile, respectively [37 (link),38 (link)].
Here, A and R are the mass percentages of the anatase and rutile phases, respectively; IA and IR are the intensities of the (101) anatase and (110) rutile peaks.
Scanning electron microscope (SEM, JSM5410LV, JEOL®, Tokyo, Japan) equipped with energy dispersive X-ray spectrometer (EDS, Link ISIS-300, Oxford®, Abingdon, UK) was employed to analyze the surface morphologies of the HGBs before and after the formation of the TiO2 coating, and to determine the thickness of the TiO2 layer. Palladium sputtering was used in advance to impart conductivity to the samples, and further analysis was carried out by operating at an accelerating voltage of 20 kV under high vacuum mode while maintaining a working distance of 20 mm.
Here, A and R are the mass percentages of the anatase and rutile phases, respectively; IA and IR are the intensities of the (101) anatase and (110) rutile peaks.
Scanning electron microscope (SEM, JSM5410LV, JEOL®, Tokyo, Japan) equipped with energy dispersive X-ray spectrometer (EDS, Link ISIS-300, Oxford®, Abingdon, UK) was employed to analyze the surface morphologies of the HGBs before and after the formation of the TiO2 coating, and to determine the thickness of the TiO2 layer. Palladium sputtering was used in advance to impart conductivity to the samples, and further analysis was carried out by operating at an accelerating voltage of 20 kV under high vacuum mode while maintaining a working distance of 20 mm.
10
Crystallinity Analysis of TiO2 Films
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X-ray diffractometry with Cu-Kα1 radiation (λ = 0.15405980 nm) over the range of 20° < 2θ < 60° was used to analyze the crystallinity of the TiO2 films deposited on the HGBs. The step and time sizes were 0.02° and 30 s, respectively. We determined the mass percentages of the anatase and rutile phases using the following formulae, which are based on the intensity of the peak at 2θ values of 25.3° (101-plane) for anatase and 27.4° (110-plane) for rutile, respectively [37 (link),38 (link)].
Here, A and R are the mass percentages of the anatase and rutile phases, respectively; IA and IR are the intensities of the (101) anatase and (110) rutile peaks.
Scanning electron microscope (SEM, JSM5410LV, JEOL®, Tokyo, Japan) equipped with energy dispersive X-ray spectrometer (EDS, Link ISIS-300, Oxford®, Abingdon, UK) was employed to analyze the surface morphologies of the HGBs before and after the formation of the TiO2 coating, and to determine the thickness of the TiO2 layer. Palladium sputtering was used in advance to impart conductivity to the samples, and further analysis was carried out by operating at an accelerating voltage of 20 kV under high vacuum mode while maintaining a working distance of 20 mm.
Here, A and R are the mass percentages of the anatase and rutile phases, respectively; IA and IR are the intensities of the (101) anatase and (110) rutile peaks.
Scanning electron microscope (SEM, JSM5410LV, JEOL®, Tokyo, Japan) equipped with energy dispersive X-ray spectrometer (EDS, Link ISIS-300, Oxford®, Abingdon, UK) was employed to analyze the surface morphologies of the HGBs before and after the formation of the TiO2 coating, and to determine the thickness of the TiO2 layer. Palladium sputtering was used in advance to impart conductivity to the samples, and further analysis was carried out by operating at an accelerating voltage of 20 kV under high vacuum mode while maintaining a working distance of 20 mm.
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