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Nanoscope 5 multimode 8 afm

Manufactured by Bruker
Sourced in United States

The Nanoscope V Multimode 8 AFM is a scanning probe microscope that utilizes atomic force microscopy (AFM) technology to provide high-resolution imaging and characterization of surfaces and materials. The instrument allows for the measurement of topography, adhesion, stiffness, and other surface properties at the nanoscale.

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3 protocols using nanoscope 5 multimode 8 afm

1

Atomic Force Microscopy Analysis of Sensor Surfaces

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Surfaces of the sensors without and with pellicle formed during QCM-D experiments were scanned in tapping mode using an atomic force microscope (AFM; Bruker Nanoscope V Multimode 8 AFM, Billerica, MA, USA) and silicon probes with tip radius of curvature < 10 nm and nominal force constant of 42 N/m (PPP-NCHR-10, Nanosensors, Neuchâtel, Switzerland). The scanning rate was 1 Hz and the scanning area was 1 μm × 1 μm. Roughness (Ra) was calculated using Gwyddion software (version 2.52, gwyddion.net).
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2

Ultrastructural Analysis of Fungal Conidia

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TEM and AFM analysis was carried out at the Korea Basic Science Institute. For TEM analysis, conidia were fixed in 2.5% glutaraldehyde in 0.1 M phosphate, washed three times with 0.1 M phosphate, post-fixed in 1% osmium tetroxide, incubated for 1 h in 0.1 M phosphate, and dehydrated for 15 min in a graded methanol series from 50% to 100%. Samples were embedded in Epon resin 812. The sections were examined with a Tecnai G2 Spirit Twin Bio-Transmission Electron Microscope (FEI, Hillsboro, OR, USA), with an accelerating voltage of 120 KV. Conidial surfaces were analyzed by a Nanoscope V Multimode 8 AFM (Bruker, Santa Barbara, CA, USA). Conidia were immobilized by mechanically trapping them into porous polycarbonate membranes. After filtering a concentrated suspension of conidia, the filter was rinsed with deionized water, carefully cut, and attached to a metallic puck using double-sided sticky tape. Images were performed in soft tapping mode using a silicon AFM probe (k = 42 N/m, f = 320 kHz, NCHR, Nanoworld, Neuchâtel, Switzerland).
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3

Atomic Force Microscopy of Dried Sensors

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The sensors after the QCM-D experiments were dried with N2 and stored in a vacuum desiccator. The sensor surfaces were scanned with a Bruker Nanoscope V Multimode 8 AFM (Billerica, MA, USA) using a silicon probe with tip radius < 10 nm and nominal force constant of 42 N/m (PPP-NCHR-10, Nanosensors, Switzerland). Surfaces were scanned in tapping mode of a surface area of 10 μm × 10 μm or 2 μm × 2 μm with a scanning rate of 1 Hz.
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