Nanoscope 5 multimode 8 afm
The Nanoscope V Multimode 8 AFM is a scanning probe microscope that utilizes atomic force microscopy (AFM) technology to provide high-resolution imaging and characterization of surfaces and materials. The instrument allows for the measurement of topography, adhesion, stiffness, and other surface properties at the nanoscale.
Lab products found in correlation
3 protocols using nanoscope 5 multimode 8 afm
Atomic Force Microscopy Analysis of Sensor Surfaces
Ultrastructural Analysis of Fungal Conidia
Atomic Force Microscopy of Dried Sensors
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