The SmartLab JD3643 N diffractometer performed the powder X-ray diffractometer (XRD) for crystal structure characterization. The water contact angle (WCA) of treated SiO2 substrates was determined by using SEO PHX300. X-ray Photoelectron Spectrometer (XPS) spectra were obtained from Thermo ESCALAB250 with a twin-crystal, micro-focusing monochromator. And, before the XPS measurements, the samples are loaded in the chamber and initiated the vacuum. For the sake of XPS measurement accuracy, the top few layers of samples are sputtered away to avoid the typical surface carbon contamination. JEOL JSM7600F SEM was utilized to obtain the coated film surface and cross images. The microwave coated TiO2 film binding force was analyzed by a Mecmesin MultiTest 2.5 Tester. The electron paramagnetic resonance (EPR) analysis was conducted by X-band CW-EPR, QM09 under room temperature with 2.97 mW, 100 KHz modulation frequency and 1G modulation amplitude conditions. FTIR spectra were measured with a Bruker Vertex 70/80 FTIR spectrometer.
Vertex 70 80 ftir spectrometer
Manufactured by Bruker
The Vertex 70/80 FTIR spectrometer is a high-performance Fourier Transform Infrared (FTIR) spectrometer manufactured by Bruker. It is designed for a wide range of analytical applications, providing users with a versatile and reliable instrument for qualitative and quantitative analysis of various samples.
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2 protocols using vertex 70 80 ftir spectrometer
1
Comprehensive Characterization of Microwave-Coated TiO2 Films
2
Comprehensive Characterization of Novel Materials
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The XRD data were measured by Rigaku Smart Lab JD3643N diffractometer with Cu Kα radiation (λ = 1.5406 Å). The investigated samples' elemental compositions and valence states were checked through XPS (ESCA 2000, VG Microtech) and Raman spectroscopy (Renishaw 2000 system). Additionally, FTIR spectra were collected by a Bruker Vertex 70/80 FTIR spectrometer. ICP-OES measurement was conducted by Agilent Technologies 5100 ICP-OES with 189.9 nm wavelength for Sn and 336.1 nm for Ti element. The materials’ morphologies and microstructures were acquired by SEM (JSM 7000F, JEOL) and TEM (JEOL JEM-2100F). BET measurements were determined using nitrogen sorption at a liquid-nitrogen temperature and a BELSORP-max (MP) instrument.
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