Sc7620 sputter coater

Scanning electron microscopy (SEM) micrographs of dry Al–P particles were generated using an FEI Nova Nanolab 200 Dual-Beam system equipped with a 30 kV SEM FEG column and a 30 kV FIB column following the method described by Ubeyitogullari and Ciftci (2016) (link). Specimens were prepared by cutting thin cross-sections from the particles, which were subsequently sputter-coated with a thin gold layer using a sputter coater (EMITECH SC7620 Sputter Coater, MA, USA). SEM images were captured at an acceleration voltage of 15.0 kV, and an electric current of 10 mA.

The free-standing glass patinas were mounted on aluminum stubs by using carbon tape. To ensure electrical conductivity, the stubs were sputtered with ~10 nm of gold using an Emitech SC7620 sputter coater. The top view and the cross-sections of the fragments were imaged using a ZEISS EVO MA10 SEM with a SE detector at 10 kV and 6 to 9 mm as the working distance (WD). The SEM images were analyzed with the software ImageJ to determine the lamellae individual thicknesses. The SEM images reported in Figs. 1 and 4, and SI Appendix, Fig. S3 were collected using a Zeiss Sigma 300 VP microscope, equipped with a SE detector, a BSE detector, and an Oxford Instruments UltimMax 65 EDX detector with the Aztec 6.0 software. Specifically, the detector voltage and the WD were set as follows: Fig. 1 H and I at 2 kV, WD=6 mm WD; Fig. 1J at 5 kV, WD=8.4 mm in high vacuum; Fig. 4A at 15 kV, WD = 8.5 mm in VP; and Fig. 4C at 5 kV, WD=8.6 mm in high vacuum. A Safematic CCU-110 (compact coating unit) was used to apply ~10 nm of carbon coating on the samples to increase their conductivity.

A scanning electron microscope (FEI NovaNanolab200 Dual-Beam system) was used to determine the morphology of rice husk before and after SC-CO₂ extraction. In brief, samples were coated with a gold layer using a sputter-coater (EMITECH SC7620 Sputter Coater, MA, USA). The analysis was conducted at 15 kV and 15 mA with a working distance of 5 mm under low vacuum mode.

The morphology was analyzed using the method described by Kaur and Ubeyitogullari.^{23 (link)} FEI NovaNanolab200 Dual Beam system that was equipped with a 30 kV SEM FEG column and a 30 kV FIB column was used (FEI Company, OR, USA). The samples were coated with a gold layer by the use of a sputter-coater EMITECH (SC7620 Sputter Coater, MA, USA) at a deposition rate of 25 nm min⁻¹. Spot size 4 with a beam current of about 0.6 nA was used with a final aperture of 10 μm. The analysis was conducted at 15 kV and 15 mA with a working distance of 5 mm under low vacuum mode. The SEM images were captured at magnifications ranging between 2000 and 20 000×. The size of the particles/aggregates after drying was determined using ImageJ software (public domain, National Institutes of Health, USA).
The protein powders in the amount of 3 g were introduced to a graduated measuring cylinder (50 mL), and the bulk volume occupied by the protein powders was noted (V₀). Then, the powder was continuously tapped until no further changes in volume occurred. The final volume was recorded (V_f). The densities (g cm⁻³) were calculated by the ratio of mass to volume.