Surfaces of the sensors without and with pellicle formed during QCM-D experiments were scanned in tapping mode using an atomic force microscope (AFM; Bruker Nanoscope V Multimode 8 AFM, Billerica, MA, USA) and silicon probes with tip radius of curvature < 10 nm and nominal force constant of 42 N/m (PPP-NCHR-10, Nanosensors, Neuchâtel, Switzerland). The scanning rate was 1 Hz and the scanning area was 1 μm × 1 μm. Roughness (Ra) was calculated using Gwyddion software (version 2.52, gwyddion.net ).
Ppp nchr 10
Manufactured by Nanosensors
Sourced in Switzerland
The PPP-NCHR-10 is a high-resolution atomic force microscope (AFM) probe designed for imaging and nanoscale characterization. It features a non-contact, high-frequency cantilever with a sharp diamond-like carbon (DLC) tip, enabling high-resolution topographic and force measurements on a variety of sample types.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using ppp nchr 10
1
Atomic Force Microscopy Analysis of Sensor Surfaces
2
Atomic Force Microscopy of Dried Sensors
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