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Xplora confocal raman spectrometer

Manufactured by Horiba
Sourced in Japan

The XploRA confocal Raman spectrometer is a versatile laboratory instrument designed for high-resolution Raman spectroscopy analysis. It features a confocal optical system that allows for precise focusing and spatial resolution, enabling detailed analysis of samples at the microscopic level. The XploRA provides accurate and reliable data collection for a wide range of applications.

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4 protocols using xplora confocal raman spectrometer

1

Comprehensive Structural and Optical Characterization of AlxGa1-xN Thin Films

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Synchrotron radiation HRXRD measurement were performed at 33IDD beamline at the Advanced Photon Source, Argonne National Laboratory. It is equipped with a standard six-circle Kappa-type diffractometer and Pilatus 100 K area detector. A deep ultraviolet (DUV) PL spectroscopy (excitation at 224 nm) was used to measure the optical properties of the AlxGa1−xN thin films. Micro-Raman spectroscopy was performed using a Horiba Jobin-Yvon Xplora confocal Raman spectrometer in a backscattering configuration with a 532 nm excitation laser and a grating of 1800 lines/mm.
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2

Structural Characterization of Nanomaterials

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Raman spectroscopy was used to structurally characterize both nanomaterials (MWCNTs and GFs) in powder form. 10 µg of each sample was placed on an XploRA confocal Raman spectrometer (Horiba Scientific, Kyoto, Japan; located at Universidad de Los Andes). The Raman spectrum was collected between 101 and 2801 cm−1.
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3

TERS Imaging and AFM Characterization

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AFM characterization and TERS imaging were carried out in air on an OmegaScope-R system (Horiba Scientific), coupled to XploRA confocal Raman spectrometer (Horiba Scientific). A linearly polarized 638 nm laser (100 μW/μm2) was incident onto the sample through a 100x objective (Mitutoyo, NA = 0.7) at a 65° with respect to the surface normal. An OMNI-TERS AFM probe (silver coated, with a thin protective gold overlayer; k = 3 N/m, f = 73.5 kHz, APPNano, Horiba Scientific) was used to record the TERS maps shown herein, and the laser polarization was set along the long axis of the tip. A dedicated TERS imaging mode (SpecTop) was employed for fast and efficient TERS mapping. Using this mode, TERS signals are collected when the tip is in direct contact with the surface, with a typical force in the 2–10 nN range. A semicontact mode is used to move the sample relative to the tip (pixel to pixel) to preserve the sharpness and optical properties of the tip and to minimize the lateral forces that otherwise perturb the sample or contaminate the tip in conventional constant contact mode feedback.
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4

Confocal Raman Imaging of Tumor Margins

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To further validate the tumour margins and infiltration, an in vitro confocal Raman imaging study was performed. Tissues were processed and sectioned with the same procedures as those used for histological analysis. Confocal Raman imaging was conducted using an XploRA confocal Raman spectrometer (HORIBA, Japan) with a 50X objective lens. The 785-nm excitation laser was kept at a power output of approximately 80 mW, and Raman spectroscopic mapping images were obtained by quantifying the intensity of the characteristic Raman peak of nanoparticles at 510 cm−1, with steps of 10 µm and an acquisition time of 1.0 s. Tumour margins delineated via confocal Raman imaging were compared with H&E staining images.
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