Keithley 2450 source meter
The Keithley 2450 source meter is a versatile instrument designed for precision electrical measurement and sourcing applications. It provides accurate and stable voltage, current, and resistance measurements, as well as the ability to source and sink these parameters. The Keithley 2450 is suitable for a wide range of testing and characterization tasks in various industries and research environments.
Lab products found in correlation
7 protocols using keithley 2450 source meter
Photoelectric Properties of MoS₂/GaSe Heterojunction
Electrical Characterization of Stretchable Electronics
Structural and Functional Characterization of Functionalized SWCNTs
morphology of the as-grown SWCNT random networks and PEI-starch-functionalized
SWCNTs was explored by employing a field-emission scanning electron
microscope (Nova Nano SEM 450, FEI) at an accelerating voltage of
10 kV. The microstructure, SWCNT interlayer spacing, and selected
area electron diffraction (SAED) pattern of the as-grown SWCNTs were
observed with a transmission electron microscope (JEOL JEM F-200).
The comparison of Raman modes for pristine SWCNT networks and PEI-starch-functionalized
SWCNTs was probed by the micro-Raman spectrophotometer (Lab RAM HR800,
HORIBA J.Y.) at a laser wavelength of 532 nm. The chemical functionalization
of the examined materials was characterized by a Nicolet iS50 FTIR
spectrometer (Thermo Scientific). The electrical characterization
of the fabricated sensor device was analyzed using a Keithley 2450
Source Meter by SMU Instrument (Tektronix).
Wearable Sensor Platform Performance Evaluation
Characterization of Ag NPs-PVA Nanocomposite Mats
Stretching Characterization of Stretchable Electrodes
Electrical Conductivity of Pyrolyzed Ceramics
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