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Keithley 2450 source meter

Manufactured by Tektronix
Sourced in United States

The Keithley 2450 source meter is a versatile instrument designed for precision electrical measurement and sourcing applications. It provides accurate and stable voltage, current, and resistance measurements, as well as the ability to source and sink these parameters. The Keithley 2450 is suitable for a wide range of testing and characterization tasks in various industries and research environments.

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7 protocols using keithley 2450 source meter

1

Photoelectric Properties of MoS₂/GaSe Heterojunction

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The photoelectric properties tests of the MoS2/GaSe heterojunction in darkness and under light illumination were performed though a Keithley 2450 source meter (Tektronix, USA). The power density of the light‐emitting diode (LED) light sources was modulated by a power supplier and calibrated by a silicon photodiode sensor (Thorlabs, USA, S120VC). All the gas sensing tests were performed in a home‐built gas sensing system. For the photovoltaic self‐powered gas sensing tests, the LED light sources were assembled with the gas sensing chamber through a standard optical fiber at dark room. The details of gas sensing tests are shown in the Supporting Information.
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2

Electrical Characterization of Stretchable Electronics

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A parameter analyzer (Agilent 4155C, Solon, OH, USA) was used to evaluate the transfer/output characteristics of all devices. A PBS 1X solution was used as the liquid electrolyte for all measurements. Each pad of the Au S/D electrodes was electrically contacted with each probe using a liquid metal (EGaIn). A digital Keithley 2450 source meter (Tektronix, Inc., Clackamas, OR, USA) was used to characterize the electrical stability test of all samples during the various stretching tests. In the first stretching test of our d-ECT, the custom-built manual stretcher stage was covered with double-sided adhesive tape (3M commercial tape). The encapsulation tape was applied to the interconnect part, and the PBS solution was dropped after the fabricated d-ECT was placed on the stretcher on each side. Continuous stretching and cyclic stretching tests of d-ECT without the PBS solution were conducted using a motor-based one-axis stretcher.
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3

Structural and Functional Characterization of Functionalized SWCNTs

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The structural
morphology of the as-grown SWCNT random networks and PEI-starch-functionalized
SWCNTs was explored by employing a field-emission scanning electron
microscope (Nova Nano SEM 450, FEI) at an accelerating voltage of
10 kV. The microstructure, SWCNT interlayer spacing, and selected
area electron diffraction (SAED) pattern of the as-grown SWCNTs were
observed with a transmission electron microscope (JEOL JEM F-200).
The comparison of Raman modes for pristine SWCNT networks and PEI-starch-functionalized
SWCNTs was probed by the micro-Raman spectrophotometer (Lab RAM HR800,
HORIBA J.Y.) at a laser wavelength of 532 nm. The chemical functionalization
of the examined materials was characterized by a Nicolet iS50 FTIR
spectrometer (Thermo Scientific). The electrical characterization
of the fabricated sensor device was analyzed using a Keithley 2450
Source Meter by SMU Instrument (Tektronix).
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4

Wearable Sensor Platform Performance Evaluation

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To assess the performance of the Alg/PAM/CMC-CH as an electrode for a wearable sensor platform, electromyogram (EMG) signal monitoring and a demonstration using an LED were performed. First, the LED demonstration proceeded via a light-emitting diodes Bulb LED Lamp, 5 mm (white color) with a basic breadboard and a Keithley 2450 source meter (Tektronix, Inc., Clackamas, OR, USA) as a power supply. Cyclic stretching was performed from 0% to 200% tensile strain at a speed of 0.3 mm/s. Second, two samples were connected to fine wire and hook-type electrodes, and the EMG signals were monitored in real time via data acquisition equipment (DAQ, PowerLab 8/35). Transparent skin patches (3M Tegaderm, Minnesota, MN, USA) were used to establish contact between the skin and electrodes with a sampling frequency of 200 kHz.
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5

Characterization of Ag NPs-PVA Nanocomposite Mats

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The surface morphology of the electrospun PVA nanofibers mats were examined using SEM (JSM-5300, JEOL, Tokyo, Japan). The samples prior to scanning were sputter-coated with gold, the diameters of fibers in randomly selected SEM micrographs were measured using Image-J software. The image of Ag NPs was taken by transmission electron microscopy (JEM-2100F, JEOL, Tokyo, Japan) Thermal stability was investigated through the Thermogravimetric Analyzer (TGA) using a THASS TGA 1000 instrument (KokBiR, Istanbul, Turkey) for the PVA nanofibers embedded with Ag NPs. Samples of 5 mg for each nanocomposite mat were used, and the rate of heating was 10 °C/min. The surface resistance of the Ag NPs-PVA nanocomposite mats was found through I-V characteristics using a Keithley 2450 source meter (Tektronix, Beaverton, OR, USA) along with a manual four probe station (Lucas Signatone, Gilray, CA, USA).
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6

Stretching Characterization of Stretchable Electrodes

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Stretching tests were performed to characterize the electrical performance of the stretchable surface electrodes under strain using the following protocol: A piece of a polyethylene terephthalate film was attached to the auto-stretching stage (Motorizer X-translation Stages, Jaeil Optical System) to hold both edges of the stretchable device patch. The sample was loaded onto the stretching stage and robustly fixed using tape (3M Co., Ltd.) and silicon epoxy (Sil-poxy, Smooth-On Co., Ltd.). A droplet of liquid metal (gallium indium eutectic, Sigma Aldrich) was applied to the electrode channel and contact pad, followed by wiring cables up to a measurement instrument. A source meter (Keithley 2450 SourceMeter, TEKTRONIX, Inc.) was used to measure the electrical performance of the stretchable electrodes. The resistance of the stretchable electrode was measured according to the stretching range using LabVIEW customized software (National Instrument Corp.).
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7

Electrical Conductivity of Pyrolyzed Ceramics

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Room temperature DC electrical conductivities of the pyrolyzed ceramics were measured using a four point collinear probe (Microworld, Grenoble, France) connected to a Keithley 2450 source meter (Tektronix UK Ltd., Berkshire, England). A current of 1 µA was applied through the outer probes and the corresponding voltage between the inner probes was used for measurement of the resistance values.
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