D8 adv

The morphologies and elemental composition of various CNF-derived materials were investigated by the field emission scanning electron microscope (FE-SEM, S-4800, Hitachi, Tokyo, Japan) instrument, equipped with the energy-dispersive spectrometer add-on (EDS, EX-250, HORIBA Ltd., Kyoto, Japan). Molecular and chemical analysis of CNF-derived materials were conducted by a Fourier-transform infrared (FT-IR) instrument (Nicolet 10, Thermo Fisher, Waltham, MA, USA). The crystallinities of materials were characterized by X-ray diffractometer (XRD, D8 Adv., Bruker Co., Billerica, MA, USA) from 10° to 80° (2 theta). Detailed chemical states of materials were analyzed by X-ray photoelectron spectroscopy (XPS, K-alpha, Thermo Fisher Scientific, Waltham, MA, USA).

X-ray diffraction (XRD, Bruker D8 Adv, Germany) was employed to identify the composition and crystal structure of the synthesized samples. Dynamic light scattering (DLS) was conducted on a Malvern zetasizer nanoseries (Nano ZS90) for hydrodynamic particle size determination. FT-IR spectra were collected on a Tensor27 (Bruker, Germany) spectrometer by dispersing completely dried samples in compressed KBr pellets. The wavenumber range was from 400 to 4000 cm⁻¹ at a spectral resolution of 2 cm⁻¹. The microstructures were observed by field emission scanning electron microscopy (FESEM; S4800, Hitachi, Japan). High-resolution transmission electron microscopy (HRTEM) overview images were obtained on a JEM-2000FX (JEOL, Japan) with an acceleration voltage of 200 kV. HRTEM samples were prepared by dispersing the MXene aqueous solution onto copper grids with the excess solvent evaporated. The measurements of reflection spectra were recorded by a miniature spectrometer (FLAME-S-VIS–NIR-ES, Ocean Insight). The microtopography was investigated under an optical microscope (Nikon, ECLIPSE, LV100N POL).