nanostructure of the material was
determined by a doubly corrected JEOL ARM200F TEM operated under the
scanning mode. The microscope was equipped with CEOS imaging aberration,
probe correction and a Gatan SC1000 ORIUS camera with a 4008 ×
2672 pixel CCD. Imaging was conducted under an acceleration voltage
of 80 and 200 kV, both of which were verified not to cause serious
damage to the carbon structure. The SWCNT samples were loaded onto
the lacey TEM grid by drop-casting. The TEM grids were baked in a
vacuum oven at 100–150 °C for 12 h prior to characterization
in order to remove contaminants such as hydrocarbon molecules. Image
analyses were carried out in the Gatan Microscopy Suite (GMS) software.