Diffrac eva

Reacted powders were ground and characterised by powder X-ray diffraction with a Bruker D2 Phaser X-ray diffractometer using Cu Kα radiation. Cu Kβ radiation was filtered using a Ni foil. XRD data were processed using the Bruker DiffracEva software package.
Sintered pellets were characterised by scanning electron microscopy and energy dispersive X-ray spectroscopy (SEM-EDX) using a Hitachi TM3030 SEM equipped with a Bruker Quantax EDX. An accelerating voltage of 15 kV was used for imaging. EDX data were analysed using Bruker Quantax software. Sintered pellets were prepared for SEM analysis by mounting in cold setting resin and polishing with SiC paper and progressively finer diamond pastes to an optical finish (1 μm). Samples were sputter coated with carbon to reduce surface charging effects.

X-ray diffraction was performed using a Bruker D2 diffractometer with a Cu source and Lynx-Eye XE linear array detector. Glass powder samples were analyzed in the region of 10° ≤ 2 θ ≤ 60° with a step width of 0.03 and a step time of 2 s. XRD spectra were analysed using Bruker Diffrac.Eva to assess the relative fraction of crystalline material in the samples (as the ratio of crystalline peaks to amorphous halo in the scan).

Sediment composition and texture has been determined by thin-section analysis (n = 8), using a petrographic microscope (Olympus BH-2) and a Scanning Electron Microscope (Supra55, Zeiss). The relative abundance of different microfossils was estimated using a visual percentage chart⁴⁴ . The resulting values are integrated into an existing dataset including 23 smear slides (shipboard data, IODP Exp. 356). Optic data was complemented by the shipboard derived lightness log, which is a unitless spectrophotometric parameter derived from the reflectance of visible light on split cores⁴³ . Sample mineralogy was analysed using a Siemens D5000 x-ray diffractometer. A total of 43 samples were oven-dried, grounded and mounted on sample holders. Two additional samples have been sieved for their mud (<63 µm) fraction which was then measured separately. The measurements were conducted over an angle field of 66° (4–70°) with a step size of 4 * 10^-30 per second. Identification and quantification of different mineral phases was achieved by standard Rietveld refinement using the software DIFFRAC EVA (ver. 8.0, Bruker) and Profex (ver. 3.14.0). Non-destructive semi-quantitative determination of single component mineralogy was achieved by 2-D XRD measurements^{45 (link)} (D8-Bruker, resident time per spot = 10 Minutes). Measured components include ooids, peloids and a variety of different bryozoa.

The finely powdered samples were fixed onto a Mitegen MicroMeshes sample holder (MiTeGen Co., Ithaca, NY, USA) with a minimal amount of oil. Powder diffraction data of the samples with Debye Scherer geometry were collected using a Bruker-D8 Venture (Bruker AXS. GmbH, Karlsruhe, Germany) diffractometer equipped with INCOATEC IμS 3.0 dual (Cu and Mo) sealed tube micro sources (50 kV, 1.4 mA). A Photon 200 Charge-integrating Pixel Array detector and CuKα (λ = 1.54178 Å) radiation was applied. Several frames were collected with various detector-sample distances in phi rotation scanning mode. Data collection and integration were carried out using the APEX3 and DiffracEva software (Bruker AXS Inc., Madison, WI, USA, Version 4.2.2.3), respectively.

To analyze the crystal form of APIs and polymers, physical mixtures and freeze-dried complexes were prepared, and ultrapure API was used as a control. The finely powdered sample was fixed onto a Mitegen MicroMeshes sample holder (MiTeGen Co., Ithaca, NY, USA) with a minimal amount of oil. Powder diffraction data of the samples with Debye Scherer geometry were collected using a Bruker-D8 Venture (Bruker AXS. GmbH, Karlsruhe, Germany) diffractometer equipped with INCOATEC IμS 3.0 dual (Cu and Mo) sealed tube micro sources (50 kV, 1.4 mA). A Photon 200 Charge-integrating Pixel Array detector and CuKα (λ = 1.54178 Å) radiation was applied. Several frames were collected with various detector-sample distances in phi scan mode. Data collection and integration was performed using the APEX3 and DiffracEva software (Bruker AXS Inc., Madison, WI, USA, Version 4.2.2.3), respectively.

Powder X-ray diffraction data were collected on a Bruker D8 Advance powder diffractometer in a Bragg–Brentano geometry. A qualitative phase analysis was performed using the DIFFRAC.Eva software (Bruker 2015 ). The quantitative phase analysis was carried out using the Rietveld method (Topas 5 Program; Bruker 2014 ). The detection limit of the method was between 0.2 and 1.0 wt.

XRD measurements were performed using
a Bruker APEX II Ultra diffractometer with Mo Kα (λ =
0.7093 Å) radiation at 40 kV and 40 mA or a Bruker 3 circle diffractometer
with Cu Kα (λ = 1.5406 Å) radiation at 45 kV and
50 mA on flame-sealed boron-rich glass capillaries in a Debye–Scherrer
geometry. The diffraction images gathered by the 2D detector within
an angular range of 5–40° for the Mo source and a range
of 10–90° for the Cu source were merged and integrated
with DIFFRAC.EVA (Bruker, 2018) to produce 2D plots. Rietveld refinement
was performed using the FullProf software suite.^{51 (link)}