Representative scanning electron microscope (SEM) images of the samples, including the physical mixture of drugs with excipients and the SRSDs, were taken using a JSM-5900LV SEM (Jeol, Tokyo, Japan) at 20 kV acceleration voltage without Au or Pt coating. For the SEM observations, each sample was fixed on an aluminum sample holder using double-side carbon tape.
Jsm 5900lv sem
Manufactured by JEOL
Sourced in Japan
The JSM-5900LV SEM is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a large specimen chamber, high-performance electron optics, and advanced imaging capabilities. The JSM-5900LV SEM is capable of producing detailed micrographs with high magnification and resolution, making it suitable for a variety of applications in materials science, nanotechnology, and other fields.
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Lab products found in correlation
5 protocols using jsm 5900lv sem
1
SEM Imaging of Drug-Excipient Samples
2
Biofilm Imaging via Scanning Electron Microscopy
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The bSi wafers incubated with B. subtilis or B. cereus spores or B. subtilis intact cells were mounted onto metal stubs using carbon tape, air-dried and sputter coated with gold/palladium. Subsequently, samples were imaged in a JEOL JSM5900LV SEM with a 13 mm working distance at an accelerating voltage of 15 kV and tilt angles ranging from 10–30°.
3
Scanning Electron Microscopy of Polymer Samples
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A representative specimen from each group was observed under a scanning electron microscope (JEOL JSM-5900 LV SEM, Tokyo, Japan). Before the SEM analysis, the specimen was gold sputter coated for one minute in a coating machine (Q150R, Quorum Technologies, East Sussex, UK). The SEM micrographs were obtained at a magnification of ×1000, 10 kV in a vacuum, and a working distance of 10 µm.
Figure 2 presents the flowchart illustrating the study process.
4
Surface Morphology Analysis via SEM
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Representative specimens from each specimen group were analyzed for the surface morphological changes (at 1,000× and 2,000×) with a scanning electron microscope (JEOL JSM 5900LV SEM, Tokyo, Japan) operated at 10 kV, in vacuum.
5
Scanning Electron Microscopy of Zein Films
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The surface morphology of zein alone and HAS/Zein free films as well as morphology of coated tablets were studied using SEM. Samples were mounted onto stubs using double-sided tape and were gold coated by a Polaron SC7640 sputter gold coater manufactured by Quorum Technologies (UK). The thickness of the gold coating was about 15 nm. The imaging process was performed in a high vacuum environment with a JEOL JSM5900 LV SEM (Japan), mounted with a tungsten filament with an acceleration voltage of 5-20 kV.
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