Axs d8 discover

The AFM images were acquired in tapping mode with Veeco DI3100. The XRD data were taken using a monochromated Cu-K_α source on a Bruker AXS D8-Discover. Cross-sectional specimens for STEM investigations were prepared by a FEI Quanta 3D FEG Focused Ion Beam. STEM images were acquired using a spherical aberration-corrected microscope equipped with four Super-X EDS detectors (FEI Titan G2 80-200 Chemi STEM, 30 mrad convergence angle).

The optical transmittance of the ZnO films deposited on glass substrates was analyzed using a UV-Vis spectrometer (VE-5100UV, VELAB, CDMX, México). The structural properties of the ZnO films deposited on glass and mPS substrates were investigated by an X-ray diffractometer (XRD) (AXS D8 Discover, Bruker, Karlsruhe, Germany) employing CuKα radiation and λ = 1.54 Å. The morphological surface and topography were analyzed with scanning electron microscopy (SEM) (JEOL JSM 7401F, Hitachi High-Tech Canada. Inc., Toronto, Ontario, Canada) and an atomic force microscope (AFM) (Park NX10, Park Systems Inc., Suwon, Corea). AFM measurements were conducted at room temperature in non-contact mode. The cantilever was made out of silicon with a spring constant of 42 N/m and a nominal tip apex radius of 10 nm. Measurements were performed for a scan size of 10 × 10 µm² with a resolution of 256 × 256 pixels. The analysis of AFM measurements was analyzed with the help of the XEI program.

The X-ray diffraction scans of the SDSS powder, LCS substrate, and the as printed clad surfaces were done using Bruker-AXS D8 Discover, X-Ray diffractometer. A copper target operating at 40 kV and 40 mA was used for X-ray source (K_α radiations: λ=1.54 Å). All the X-ray scans were performed with the diffraction angles range (2θ) set in the range of 20° − 110° with a step size of 0.05° and a scan speed of 4°/min.

The phase composition and crystal structure of LMO/MnO were identified by an X-ray diffractometer (XRD, Bruker AXS D8-discover, Karlsruhe, Germany), which was conducted directly on the deposited sample. The excitation light source was CuKα radiation with λ = 0.154056 nm, and the scan rate was 2°·min⁻¹ at the 2θ range of 10°–90°. Samples were cut into small pieces (3 mm × 3 mm), and stick to a sample stage with conductive adhesive for surface morphology observation, which was performed by field emission scanning electron microscopy (FE-SEM) (ULTRA-55, Zeiss, Oberkochen, Germany). Samples for transmission electron microscopy (TEM) were prepared by dissolving LMO/MnO in acetone and dispersing the suspension onto a holey carbon 200 mesh TEM grid. TEM investigations were performed on 200 kV electron microscopy (Tecnai G2 F20 S-TWIN, FEI Co., Hillsboro, OR, USA) equipped with an X-ray spectrometer (EDAX Analyzer (DPP-П), Edax Inc., Mahwah, NJ, USA) for energy dispersive spectroscopy (EDS) analysis. The surface electronic states were characterized by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Fisher, Waltham, MA, USA) in the range of 0 eV to 1350 eV, with a binding energy resolution of 0.1 eV.

The out-of-plane interplanar distance and hence the out-of-plane epitaxial strain of the film were determined by x-ray diffraction (XRD) using Cu-Kα radiation (Fig. 1(a)). In-plane epitaxial strains of the film were determined from X-ray reciprocal space maps (RSMs) around asymmetric reflections that were collected using a four-circle diffractometer (Bruker AXS D8-Discover). Au layers were vapor deposited on both the top and bottom of the PSMO/PMN-PT heterostructure as electrodes. The magnetic properties of the samples were measured using a superconducting quantum interference device (SQUID–MPMS) with in situ electric fields applied across the PSMO/PMN-PT structure by a Keithley 6517A electrometer. The leakage current was below 5nA under a 7.8 KV/cm electric field. A detailed circuit diagram is represented in the inset of Fig. 1(a).