Asap 2010 automated sorption analyzer

Chromatographic analysis was carried out in an HPLC equipment from Jasco Analytica (Madrid, Spain), composed of a PU-2089 quaternary gradient pump, an AS-2055 autosampler with a 100 µL injection loop and MD-2018 photodiode array detector. The system was controlled using the LC-NETII/AFC interface also supplied by Jasco. Acquisition and data treatment was performed using the ChromNAV software (version 1.17.01). SEM photographs of PTFE surfaces and monolithic materials were performed with a scanning electron microscope (S-4100, Hitachi, Ibaraki, Japan) provided by a field emission gun, an EMIP 3.0 image data acquisition system, and a microanalysis system (Rontec, Normanton, UK). FT-IR spectra of PTFE surfaces were obtained with a Nicolet Magna FT-IR 750 spectrometer (Madison, WI, USA) fitted with a single reflection attenuated total reflectance (ATR) accessory. Spectra were recorded at room temperature between 4000 and 550 cm -1 with 8 cm -1 nominal resolution at 50 scans per spectrum. Nitrogen adsorption surface area analysis of monolithic materials was performed on a Micromeritics ASAP2010 automated sorption analyzer (Rutherford, Germany). Gas chromatography-mass spectrometry (GC-MS) analysis was performed on a Focus DSQ II gas chromatograph provided with an AI 3000 autosampler and single quadrupole MS detector from Thermo Fisher Scientific (Austin, TX, USA).