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F 7000 luminescence spectrometer

Manufactured by Hitachi
Sourced in Japan

The F-7000 Luminescence Spectrometer is a laboratory equipment designed for the measurement and analysis of luminescent properties of samples. It is capable of performing fluorescence and phosphorescence spectroscopy.

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2 protocols using f 7000 luminescence spectrometer

1

Fluorescent DNA Hybridization Assay

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The resultant suspensions prepared in Section 2.4 and Section 2.5 were mixed at different ratios. CdTe/SiO2-ssDNA and AuNPs-ssDNA were hybridized in a buffer solution of 20 mM Tris-HCl, 50 mM NaCl, and 5 mM MgCl2 (pH = 8.0) at 37 °C, for 12 h under shaking. For detection, an amount of target ssDNA was introduced into the detection solution under shaking for 12 h. The fluorescence spectra of the probe system were measured with an F-7000 Luminescence Spectrometer (Hitachi, Japan). According to Foster’s theory, the FRET efficiency (quenching efficiency, Qe) can be measured experimentally and is commonly defined as [16 (link)]: Qe=(1FDAFD)×100%
where FDA is the integrated fluorescence intensity of the donor in the presence of the acceptor(s) and FD is the integrated fluorescence intensity of the donor alone (no acceptors present).
When the complementary DNA was present, the hybridized structure of probes opens and the fluorescent intensity of detection system recovers. The fluorescent recovery efficiency (Fr) is given as: Fr=(FF0F0)×100%
where F0 is the fluorescent intensity of the DNA probe, and F is the fluorescent intensity of the DNA probe with target ssDNA.
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2

Characterization of Uranium Nanoparticles

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The phase composition was determined using a Stoe-Stadi MP X-ray diffractometer operating in transmission mode using Mo-Kα1 (λ = 0.7093 Å) radiation. The morphologies of nanoparticles were investigated with a scanning electron microscope (SEM, Hitachi S-4800) and a transmission electron microscope (TEM, Zeiss LEO 912, 120 kV). The X-ray photoelectron spectra (XPS) were recorded with a Surface Science Instruments ESCA M-Probe using monochromatic Al-Kα radiation ( = 1486.6 eV). The spectra were fitted and analysed with CasaXPS software. The X-ray absorption fine structure (XAFS) spectra at the uranium L3-edge (E0 = 17 166 eV) were collected at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility (SSRF). The energy was calibrated according to the absorption edge of the Zr foil at the K-edge (17 997 eV). Rheological experiments were performed on a rheometer (MCR301, Anton Paar): frequency sweep tests were carried out at a fixed strain of 0.5%; amplitude sweep tests were performed at a fixed frequency of 1 Hz. The UV-Vis measurements were performed on a PerkinElmer Lambda 750 spectrophotometer. The photoluminescence (PL) emission spectra were recorded with a Hitachi F-7000 luminescence spectrometer with an excitation wavelength of 375 nm. A light response test was performed by illumination under Xe light of 150 W.
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