The CNT suspensions developed in the TC reactor were characterized using an optical microscope (OM) (BX53F, OLYMPUS), an ultraviolet-visible-near infrared (UV-vis-nIR) spectroscope (S-3100, Scinco), the zeta-potential (ELSZ-100-, Otsuka Electronics), and a viscometer (DHR-1, TA Instruments). In OM measurements, the thickness of the CNT suspensions was fixed at 0.2 mm. To observe the UV-vis-nIR absorbance, the CNT suspensions were loaded in a quartz cuvette with a 1 cm path length and sealed with a Teflon stopper. A scanning electron microscope (SEM, XL30S FEG, FEI), Raman spectroscopy (LabRam Aramis, Horiba Jobin Yvon), and Fourier-transform infrared (FT-IR) spectrometer (Nicolet iS50, Thermo Scientific) were used to characterize the CNT buckypapers.
Xl30 sfeg
Manufactured by Thermo Fisher Scientific
Sourced in United States
The XL30 SFEG is a scanning electron microscope (SEM) designed for high-resolution imaging of a wide range of materials. It features a field emission gun (FEG) source, which provides enhanced resolution and image quality compared to traditional thermionic emission SEMs. The XL30 SFEG is capable of magnifications up to 1,000,000x and can be used to analyze the surface topography and composition of samples at the nanometer scale.
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Lab products found in correlation
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Sawing microtome, by Leica camera (2 mentions)
H e staining, by Thermo Fisher Scientific (2 mentions)
Picro sirius red staining, by Thermo Fisher Scientific (2 mentions)
Leica 4 sp1600 saw microtome system, by Leica camera (2 mentions)
Ethylene diamine tetraacetic acid (edta), by Merck Group (2 mentions)
Lv100nd, by Thermo Fisher Scientific (2 mentions)
Dimension icon afm, by Bruker (2 mentions)
Bx53f, by Olympus (1 mentions)
Dhr 1, by TA Instruments (1 mentions)
Labram aramis, by Horiba (1 mentions)
S 3100, by Scinco (1 mentions)
Cm200 feg, by Philips (1 mentions)
Dimension icon, by Bruker (1 mentions)
Dimension edge, by Bruker (1 mentions)
Sirion column, by Thermo Fisher Scientific (1 mentions)
Fv1000 confocal microscope, by Olympus (1 mentions)
Ar g2 rheometer, by TA Instruments (1 mentions)
Tecnai 20 electron microscope, by Thermo Fisher Scientific (1 mentions)
Sp8 confocal microscope, by Leica camera (1 mentions)
25 protocols using xl30 sfeg
1
Characterization of CNT Suspensions
2
Microstructural Characterization of Cylindrical Specimens
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Microstructures at the center of the cylindrical specimens on the sections parallel to the compression axis were characterized by a field-emission type scanning electr on microscope (FE-SEM, FEI XL30S FEG) equipped with an electron back-scattering diffraction (EBSD) system operated at an accelerating voltage of 15 kV and a transmission electron microscope (TEM, Philips CM200FEG) at 200 kV. For the EBSD measurement, the specimens were mechanically polished using 4000 grit SiC paper and then electrically polished in a solution of 10% HClO4 and 90% CH3COOH at 20 °C. For the TEM observations, thin-foil specimens were prepared by twin-jet electropolishing using the same solution as that for EBSD.
3
Rapid Freezing and Freeze Substitution of Biofilms
4
Structural Changes in Bacterial Floc Cells
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Structural changes on bacterial cells of the floc samples were screened using scanning electron microscopy (SEM). A drop of unwashed AS was placed on silicon square held onto aluminium stub by double-sided carbon tape and allowed to dry without alteration in the floc morphology. The dried sample was sputter-coated with gold/palladium for 1 min to give a thin layer of about 2–3 nm, and examined using a scanning field emission gun electron microscope (FEI XL30 S-FEG).
5
Silver Electroplating Protocol for Surface Morphology
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All solutions were of analytical grade reagents and deionized water was utilized throughout this work. The silver plating bath was prepared by adding AgNO3 solution into a solution containing DMH, NA, and K2CO3, the pH value of the bath was adjusted to 10.0 ~ 14.0 with KOH solution.
All of the electrochemical measurements were performed in a three-electrode cell using a potentiostat/galvanostat (PARSTAT2273 Electrochemical Integrated Test System, Princeton Applied Research) at 328 K. A glassy carbon electrode (GCE) with a diameter of 3 mm was employed as the working electrode (WE). The counter electrode (CE) was a platinum plate with an area of 1 cm2. A mercuric oxide electrode (Hg/HgO) was used as the reference electrode (RE). Silver electroplating experiments were conducted under galvanostatic conditions, a cell with a silver anode and a copper substrate was employed.
Field emission scanning electron microscopy (FESEM, FEI XL30S-FEG) was used to study the surface morphologies of the silver deposits. Atomic force microscope (AFM) was employed to study the surface roughness of the silver deposits. The AFM analysis was carried out with a Dimension Icon (Bruker), working in contact mode with silicon nitride cantilevers.
All of the electrochemical measurements were performed in a three-electrode cell using a potentiostat/galvanostat (PARSTAT2273 Electrochemical Integrated Test System, Princeton Applied Research) at 328 K. A glassy carbon electrode (GCE) with a diameter of 3 mm was employed as the working electrode (WE). The counter electrode (CE) was a platinum plate with an area of 1 cm2. A mercuric oxide electrode (Hg/HgO) was used as the reference electrode (RE). Silver electroplating experiments were conducted under galvanostatic conditions, a cell with a silver anode and a copper substrate was employed.
Field emission scanning electron microscopy (FESEM, FEI XL30S-FEG) was used to study the surface morphologies of the silver deposits. Atomic force microscope (AFM) was employed to study the surface roughness of the silver deposits. The AFM analysis was carried out with a Dimension Icon (Bruker), working in contact mode with silicon nitride cantilevers.
6
Ablation Morphology Characterization
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The ablation morphology was characterized with a scanning electron microscope (XL30 S-FEG, FEI) and an atomic force microscope (Dimension edge, Bruker). The light focusing ability of the silicon-based crater generated by the first pulse was characterized with an optical system shown in Figure 3(c) . The reflected light of the crater was collected with a lens and imaged on a CCD.
7
Time-Dependent Biofilm Ultrastructural Analysis
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S. epidermidis cultures (MH strain) were cultivated for of 1, 2, 3, 5, 7, 10, 14 and 28-days as described above. 100 µL from the sedimented material at the test tube bottom was removed by gentle suction using cut-off 1 mL pipette tips, spot deposited on a round glass cover slip (12 mm) and rapidly frozen by immersion in liquid propane. The same protocol was repeated with 100 µL media of the supernatant. For freeze substitution, all specimens were quickly transferred, (still frozen) to pre-cooled vials containing 100% ethanol, which were placed in a Styrofoam container with dry ice. Subsequently, the container was left at −20°C overnight and then warmed to 4°C over a period of 8 h. Afterwards, the specimens were critical point dried, mounted on a stub with adhesive carbon tape, sputter coated with a 25 nm layer of platinum and examined in the SEM operating at 5 kV in the secondary electron mode (XL 30 S, FEG, FEI Company, Hillsboro, OR, USA).
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S. epidermidis cultures (MH strain) were cultivated for of 1, 2, 3, 5, 7, 10, 14 and 28-days as described above. 100 µL from the sedimented material at the test tube bottom was removed by gentle suction using cut-off 1 mL pipette tips, spot deposited on a round glass cover slip (12 mm) and rapidly frozen by immersion in liquid propane. The same protocol was repeated with 100 µL media of the supernatant. For freeze substitution, all specimens were quickly transferred, (still frozen) to pre-cooled vials containing 100% ethanol, which were placed in a Styrofoam container with dry ice. Subsequently, the container was left at −20°C overnight and then warmed to 4°C over a period of 8 h. Afterwards, the specimens were critical point dried, mounted on a stub with adhesive carbon tape, sputter coated with a 25 nm layer of platinum and examined in the SEM operating at 5 kV in the secondary electron mode (XL 30 S, FEG, FEI Company, Hillsboro, OR, USA).
8
Bone Tissue Analysis via MMA and Paraffin
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The harvested constructs were cut into two parts; one half was embedded in polymethylmethacrylate (MMA, Sigma-Aldrich, Germany) and the other half was slowly decalcified in formalin and ethylenedi-amine tetra-acetic acid (EDTA, Sigma-Aldrich, Germany) for 3 months and subsequently embedded in paraffin. Samples embedded in MMA were sectioned in 300–400 μm slices using a Leica 4 SP1600 Saw Microtome system (Leica, Germany). After sectioning, the samples were stained with methylene blue/basic fuchsine and evaluated with light microscopy (Olympus BX51, Japan) [34 (link)]. Paraffin-embedded samples were sectioned using a microtome (n = 6) (Leica sawing microtome, Nusslochh, Germany) in 5 μm slices and stained with hematoxylin and eosin (H&E staining, thermo Fisher scientific, USA) for tissue overview analysis, and picro-sirius red staining (Thermo Fisher Scientific, USA) for collagen analysis. Collagen orientation was visualized with polarized light (Olympus BX51, Japan). Backscatter images using a Secondary Electron Detector were analyzed by EDX with a scanning electron microscope (FEI XL30SFEG, USA). Before EDX analysis for newly formed bone and native bone, MMA sections were polished and sputtered with gold.
9
SEM Imaging of Metal Nanoislands
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An FEI XL30 SFEG instrument
with an FEI Sirion
column and Through-Lens Detector was used for SEM micrographs of metal
nanoislands. An accelerating voltage of 10 kV and a spot of 50 μm
were used for imaging.
with an FEI Sirion
column and Through-Lens Detector was used for SEM micrographs of metal
nanoislands. An accelerating voltage of 10 kV and a spot of 50 μm
were used for imaging.
10
Rheological and Microscopic Analysis of NC-Gel
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