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Xpert 3 x ray diffractometer

Manufactured by Malvern Panalytical

The XPERT-3 X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to provide detailed information about the atomic and molecular structure of a wide range of materials. The core function of the XPERT-3 is to collect and analyze X-ray diffraction patterns, which can be used to identify unknown crystalline substances, determine the crystal structure of materials, and quantify the composition of multi-phase samples.

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3 protocols using xpert 3 x ray diffractometer

1

XRPD Analysis of Palbociclib Solid Dispersion

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Example 11

The palbociclib solid dispersion prepared with PVP-VA64 in Example 4 was sent for XRPD test. The XRPD test was performed with Panalytical's XPERT-3 X-ray diffractometer. About 10 mg of sample was evenly tiled on a monocrystalline silicon sample tray and subjected to the XRPD test with the following parameters: scanning range (2θ°): 3-40; scanning step (2θ°):0.0263; scanning time (seconds): 46.665; K-Alpha wavelength (Å): 1.54060; K-Alpha2 wavelength (Å): 1.54443; Power setting: 40 mA, 45 kV. The obtained XRPD pattern was shown in FIG. 8.

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2

XRPD Characterization of Palbociclib Solid Dispersion

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Example 10

The palbociclib solid dispersion prepared with PVP-K30 in Example 3 and the API of palbociclib both were sent for XRPD test. The XRPD test was performed with Panalytical's XPERT-3 X-ray diffractometer. About 10 mg of sample was evenly tiled on a monocrystalline silicon sample tray and subjected to the XRPD test with the following parameters: scanning range (2θ°): 3-40; scanning step (2θ°):0.0263; scanning time (seconds): 46.665; K-Alpha wavelength (Å): 1.54060; K-Alpha2 wavelength (Å): 1.54443; Power setting: 40 mA, 45 kV. The obtained XRPD pattern of the API of palbociclib was shown in FIG. 6; and the XRPD pattern of the solid dispersion prepared with PVP-K30 was shown in FIG. 9.

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3

Comprehensive Characterization of Nanomaterials

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The surface morphology was observed by Zeiss EVO MA10 scanning electron microscope (SEM) and FEI Tecnai F20 field-emission transmission electron microscope (TEM). The elemental mapping was collected by the FEI Tecnai F20 equipped with an energydispersive X-ray spectroscope (EDS) under STEM mode. X-ray diffraction (XRD) patterns were measured with PANalytical X'Pert3 X-ray diffractometer. X-ray photoelectron spectroscopy (XPS) was performed by the Thermo Scientific K-Alpha + XPS spectrometer. All binding energies were calibrated with respect to C 1 s peak at 284.8 eV. Electron paramagnetic resonance (EPR) spectra were measured with a Bruker A300 spectrometer. Raman spectra were collected by a HORIBA iHR320 Raman microscope with a 514-nm laser. UV-visible absorption spectra were measured using Shimadzu UV-3600 spectrophotometer with an integrated sphere. Photoluminescence (PL) spectra were analyzed using Shimadzu RF-5301PC spectrometer. Time-resolved photoluminescence (TRPL) spectra were measured by the PicoQuant Fluo Time 200 spectrometer coupled with a TimeHarp 260 time-correlated single-photon counting (TCSPC) system.
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