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Eds inca 350

Manufactured by Oxford Instruments
Sourced in United Kingdom, United States

EDS/INCA 350 is an energy-dispersive X-ray spectroscopy (EDS) system designed for elemental analysis of materials. The system is capable of identifying and quantifying the elemental composition of a sample using X-ray detection and analysis.

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8 protocols using eds inca 350

1

Microcapsule Characterization by Microscopy

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Microcapsules size, morphology and topography were analyzed by microscopic techniques: (i) optical microscopy (OM) (Leica MZ16a stereo-microscope, Leica Microsystems Ltd., Switzerland) and (ii) scanning electron microscopy (SEM) (FE-SEM, model JSM-7000 F, Jeol Ltd., Tokyo, Japan). The average diameter of wet and dry microparticles was determined by optical microscopy using Olympus Soft Imaging Solutions GmbH, version E_LCmicro_09Okt2009. Sixty microparticles were randomly selected from batches produced in triplicate, to determine the size distribution.
Microcapsule formulations for SEM analysis were put on the high-conductive graphite tape. FE-SEM was linked to an EDS/INCA 350 (energy dispersive X-ray analyzer) manufactured by Oxford Instruments Ltd. (High Wycombe, UK). The ImageJ software was used for the determination of the size of pores on a microparticle surface.
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2

Characterizing Gold Nanoparticles by SEM

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The final dried new AuNPs were examined using a scanning electron microscope (SEM), Sirion 400 NC (FEI Sirion 400 NC, FEI Technologies Inc., Hillsboro, OR, USA), with an EDS INCA 350 (Oxford Instruments, Oxford, UK). The samples were prepared by applying the dried AuNPs onto an SEM stub holder with graphite tape.
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3

SEM Analysis of PLA/Ni/Y2O3 Composite

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A scanning electron microscope (SEM), Sirion 400 NC (FEI Sirion 400 NC, FEI Technologies Inc., Hillsboro, OR, USA), with an EDS INCA 350 (Oxford Instruments, UK), was used for the investigations of the fracture surface for the prepared PLA/Ni/Y2O3 composite and pure PLA. The samples for SEM examination were prepared by breaking directly in liquid N2, thus preserving the authenticity of the surface for microscopic observation. The investigated surfaces of the samples were sputter coated with Au for 60 s, in order to produce a conductive film and improve the SEM imaging of the samples.
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4

Bioglass Powder Sputter-Coating Characterization

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The commercial 45S5 BG and Cu-MBGN powders were sputter-coated with 5 nm Au/Pd layer (90% Au/10% Pd), evaporated with argon plasma at 6 kV using the Precision Etching Coating System (Model 682, Gatan Inc., Pleasanton, CA, USA).
FE-SEM images of prepared samples were taken with a scanning electron microscope JSM7000F (JEOL Ltd., Tokyo, Japan) linked to the energy-dispersive X-ray analyzer EDS/INCA 350 (Oxford Instrument, Abingdon, UK).
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5

Morphological and Compositional Analysis of Ba-TiO2 Samples

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Morphologies of the samples were investigated by field emission scanning electron microscopy (FE-SEM), model JSM-7000F manufactured by JEOL Ltd., Tokyo. Japan using an accelerating voltage of 10 kV, equipped with an energy dispersive X-ray spectrometer (EDS), EDS/INCA 350 (energy-dispersive X-ray analyser) manufactured by Oxford Instruments Ltd., which was used to prove the presence of barium in the samples.
The presence of Ba-species and anatase TiO2 was investigated by the means of X-ray diffraction analysis (XRD) using the Siemens D5000 diffractometer equipped with a Cu anode, Goebel mirror and graphite monochromator in front of the point detector. The experiments were performed in grazing incidence geometry with an incidence angle of 1.3° with respect to the film surface plane.
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6

FE-SEM Analysis of Mesoporous Silica Nanoparticles

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Field emission scanning electron microscope (FE-SEM) JSM-7000F (JEOL) was used for the observation of particle morphology. The FE-SEM was connected to the Oxford Instruments EDS/INCA 350 energy dispersive X-ray analyzer for elemental analysis. Samples dispersed at an appropriate concentration were cast onto a glass sheet at room temperature and imaged. The size distribution was determined using Image-J (Media Cybernetics Inc., Rockville, USA) by measuring diameters of at least 500 MSNs based on FE-SEM images and presented as a histogram of the nanoparticle diameters.
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7

Elemental Analysis of Material Discs

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The previously prepared material sample discs were selected for the analysis (n = 5 per material). After the incubation period, the set material discs were coated with carbon under a CC7650 SEM Carbon Coater Unit (Quorum Technologies Ltd.). The superficial element distribution of the coated discs was then individually examined in a scanning electron microscopy (SEM) unit (Jeol 6100 EDAX; Jeol Inc.) attached to an energy dispersive spectroscopy (EDS) system (INCA 350 EDS; Oxford Instruments) for the elemental analysis.
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8

Surface Morphology and Elemental Analysis of Disc-Shaped Specimens

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Disc-shaped specimens (10 mm in diameter and 2 mm high) were prepared and immersed in Hank’s Balanced Salt Solution (HBSS) for a total of 28 days. Following immersion, the samples were taken out and placed in acetone for 48 h, and dessicated in a vacuum desiccator for an additional 24 h. Subsequently, the surfaces of the samples were ground with progressively finer diamond discs using an automatic polishing machine. Both control and experimental groups were coated with carbon using a CC7650 SEM Carbon Coater Unit (Quorum Technologies Ltd.). The superficial surface morphology and the element distribution of the coated discs was individually examined at two time intervals of one day and 28 days, using a scanning electron microscopy (SEM) unit (Jeol 6100 EDAX; Jeol Inc.) at 150X magnification, coupled with an energy-dispersive spectroscopy (EDS) system (INCA 350 EDS; Oxford Instruments) for elemental analysis.
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