Pananalytic x pert pro
The PanAnalytic X'Pert Pro is a versatile X-ray diffractometer designed for materials analysis. It is capable of performing qualitative and quantitative phase analysis, crystallite size and strain determination, and other advanced X-ray diffraction techniques.
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7 protocols using pananalytic x pert pro
Characterization of Green-Synthesized Ag NPs and Ag/RGO NCs
Multi-Technique Characterization of Prepared Samples
Characterization of Copper Oxide Nanoparticles
Comprehensive Characterization of SnO2-ZnO/rGO Nanocomposites
Characterization of Zinc-doped Bismuth Oxide Nanoparticles
and crystalline nature of prepared pure and Zn-doped (1 and 3%) Bi2O3 NPs were assessed by X-ray diffraction (XRD)
(PanAnalytic X’Pert Pro, Malvern Instruments, UK) with Cu-Kα
radiation (λ = 0.15405 nm, at 45 kV and 40 mA). Structural characterization
was carried out by FETEM (JEM-2100F, JEOL, Inc., Tokyo, Japan). In
brief, stock suspension of NPs (1 mg/mL in deionized water) further
diluted into an appropriate working suspension (50 μg/mL in
deionized water). This suspension was sonicated for 15 min at 40 W
in a water bath sonicator (Cole-Parmer, Vernon Hills, IL, USA). Then,
a drop of working suspension of NPs was poured onto TEM grid and air-dried,
and the TEM measurements were carried out. Elemental composition assessed
by EDS. Surface morphology and elemental mapping were assessed by
FESEM (JSM-7600F, JEOL, Inc.). The photoluminescence spectra were
observed using a fluorescent spectrophotometer (Hitachi F-4600).
Aqueous behavior of prepared NPs in deionized water and complete
culture medium (DMEM + FBS) was carried out by dynamic light scattering
(DLS) (ZetaSizer, Nano-HT, Malvern Instruments). In brief, NPs were
suspended in deionized water and culture medium at a concentration
of 400 μg/mL and incubated for 24 h at 37 °C. Then, suspensions
were sonicated for 15 min at 40 W in a water bath sonicator (Cole-Parmer)
and the DLS measurements were carried out.
Comprehensive Characterization of Prepared Samples
and crystalline phase of prepared samples were investigated by recording
XRD patterns (PanAnalytic X’Pert Pro, Malvern Instruments,
UK) with Cu Kα radiation (=0.15405 nm, at 45 kV and 40 mA).
Scanning electron microscopy (SEM) was employed to study the morphologies
of the synthesized samples. The chemical elements and states of the
prepared samples were examined by EDX and XPS, respectively. Raman
spectra were recorded using the WITec alpha 300RA Raman Confocal Microscope.
A Fourier transform infrared (FTIR) spectrometer (PerkinElmer Paragon
500) recorded the group function of the obtained samples at the wavenumber
range of 500–4000 cm–1. A UV–visible
spectrophotometer (Hitachi U-2600) and a fluorescence spectrometer
(Hitachi F-4600) were used to analyze the optical properties of the
prepared samples.
Comprehensive Characterization of Nanoparticles
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