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Pananalytic x pert pro

Manufactured by Malvern Panalytical
Sourced in United Kingdom

The PanAnalytic X'Pert Pro is a versatile X-ray diffractometer designed for materials analysis. It is capable of performing qualitative and quantitative phase analysis, crystallite size and strain determination, and other advanced X-ray diffraction techniques.

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7 protocols using pananalytic x pert pro

1

Characterization of Green-Synthesized Ag NPs and Ag/RGO NCs

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UV-visible spectra of green-prepared Ag NPs and Ag/RGO NCs was evaluated between 250 and 750 nm using the Shimadzu UV-1800 spectrophotometer. X-ray diffraction (XRD) (Pan Analytic X’Pert Pro, Malvern Instruments, Malvern, WR14, 1XZ, UK) equipped with Cu-Kα radiation (λ = 0.15405 nm, at 45 kV and 40 mA) was used to assess the crystallinity and phase-purity of green-prepared Ag NPs and Ag/RGO NCs. Morphological analysis, elemental mapping, and other structural characterization were further carried out by field emission transmission electron microscopy (FETEM) (JEM-2100, JEOL, Inc., Tokyo, Japan) and field emission scanning electron microscopy (FESEM) (JSM-7600F, JEOL, Inc., Tokyo, Japan). The characterization of NPs/NCs in aqueous suspension (hydrodynamic size and zeta potential) was carried out by dynamic light scattering (DLS) (ZetaSizer, Nano-HT, Malvern Instruments).
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2

Multi-Technique Characterization of Prepared Samples

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The prepared samples were characterized using XRD, FETEM, FESEM, FTIR, XPS, and PL techniques. Phase-purity and crystallinity were examined by X-ray diffraction (XRD) (PanAnalytic X’Pert Pro, Malvern Instruments, Malvern, UK) with Cu-Kα radiation (λ = 0.15405 nm, at 45 kV and 40 mA) and an angle range from 30° to 80°. Morphological and elemental mapping were identified using field emission transmission electron microscopy (FETEM, JEM-2100F, JEOL, Inc., Tokyo, Japan) and field emission scanning electron microscopy (FESEM, JSM-7600F, JEOL, Inc. Tokyo, Japan). Energy-dispersive X-ray spectrometry (EDS) was employed to determine the elemental composition. The chemical states of elements were investigated by X-ray photoelectron spectroscopy (XPS) (PHI-5300 ESCA PerkinElmer, Boston, MA, USA). Photoluminescence (PL) spectra were measured by a fluorescent spectrometer (Hitachi F-4600). Fourier transform infrared spectroscopy (FTIR) (PerkinElmer Paragon 500, Woonsocket, RI, USA) was used to identify the functional group of the prepared samples.
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3

Characterization of Copper Oxide Nanoparticles

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The crystallinity and phase purity of the prepared CuO NPs were examined by X-ray diffraction (XRD) (PanAnalytic X`Pert Pro) (Malvern Instruments, WR14 1XZ, UK) using Cu-Kα radiation (λ = 0.154 nm at 45 kV and 40 mA). Photoluminescence spectra of CuO NPs were assessed using a fluorescence spectrometer (DW-F97 Drawell, Shanghai, China). Structural characterization (e.g., morphology, shape, and size) was further carried out by field-emission scanning electron microscopy (FESEM, JSM-7600F, JEOL, Inc., Tokyo, Japan) and field-emission transmission electron microscopy (FETEM, JEM-2100F, JEOL). The elemental composition of the prepared CuO NPs was examined by energy-dispersive X-ray spectroscopy (EDS).
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4

Comprehensive Characterization of SnO2-ZnO/rGO Nanocomposites

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Absorption spectra of prepared samples were recorded at the wavelength of 300–900 nm with a resolution of 0.5 nm (Shimadzu UV-1800 spectrometer, Reinach BL, Switzerland). Crystallinity and phase-purity were analyzed at powder X-ray diffraction (PXRD) (PanAnalytic X’Pert Pro, Malvern Instruments, UK) with Cu-Kα radiation (λ=0.15405 nm, at 45 kV and 40 mA). Structural characterization was further assessed through FETEM (JEM-2100F, JEOL, Inc., Tokyo, Japan). Elemental analysis was done by energy dispersive X-ray spectroscopy (EDS). Mapping of elemental distribution of SnO2-ZnO/rGO NCs was further done through FESEM (JSM-7600F, JEOL, Inc.). Hydrodynamic size and zeta potential in distilled water and culture medium were determined by DLS (ZetaSizer, Nano-HT, Malvern Instruments).
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5

Characterization of Zinc-doped Bismuth Oxide Nanoparticles

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The purity of phase
and crystalline nature of prepared pure and Zn-doped (1 and 3%) Bi2O3 NPs were assessed by X-ray diffraction (XRD)
(PanAnalytic X’Pert Pro, Malvern Instruments, UK) with Cu-Kα
radiation (λ = 0.15405 nm, at 45 kV and 40 mA). Structural characterization
was carried out by FETEM (JEM-2100F, JEOL, Inc., Tokyo, Japan). In
brief, stock suspension of NPs (1 mg/mL in deionized water) further
diluted into an appropriate working suspension (50 μg/mL in
deionized water). This suspension was sonicated for 15 min at 40 W
in a water bath sonicator (Cole-Parmer, Vernon Hills, IL, USA). Then,
a drop of working suspension of NPs was poured onto TEM grid and air-dried,
and the TEM measurements were carried out. Elemental composition assessed
by EDS. Surface morphology and elemental mapping were assessed by
FESEM (JSM-7600F, JEOL, Inc.). The photoluminescence spectra were
observed using a fluorescent spectrophotometer (Hitachi F-4600).
Aqueous behavior of prepared NPs in deionized water and complete
culture medium (DMEM + FBS) was carried out by dynamic light scattering
(DLS) (ZetaSizer, Nano-HT, Malvern Instruments). In brief, NPs were
suspended in deionized water and culture medium at a concentration
of 400 μg/mL and incubated for 24 h at 37 °C. Then, suspensions
were sonicated for 15 min at 40 W in a water bath sonicator (Cole-Parmer)
and the DLS measurements were carried out.
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6

Comprehensive Characterization of Prepared Samples

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The crystal structure
and crystalline phase of prepared samples were investigated by recording
XRD patterns (PanAnalytic X’Pert Pro, Malvern Instruments,
UK) with Cu Kα radiation (=0.15405 nm, at 45 kV and 40 mA).
Scanning electron microscopy (SEM) was employed to study the morphologies
of the synthesized samples. The chemical elements and states of the
prepared samples were examined by EDX and XPS, respectively. Raman
spectra were recorded using the WITec alpha 300RA Raman Confocal Microscope.
A Fourier transform infrared (FTIR) spectrometer (PerkinElmer Paragon
500) recorded the group function of the obtained samples at the wavenumber
range of 500–4000 cm–1. A UV–visible
spectrophotometer (Hitachi U-2600) and a fluorescence spectrometer
(Hitachi F-4600) were used to analyze the optical properties of the
prepared samples.
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7

Comprehensive Characterization of Nanoparticles

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X-ray diffraction (XRD) (PanAnalytic X'Pert Pro instrument from Malvern Instruments, UK) was applied to examine the crystalline structures and phases of synthesized NPs and NCs. Morphological and surface properties of prepared samples were further investigated through scanning electron microscopy (SEM) (JSM-7600F instrument from JEOL, Inc). X-ray photoelectron spectroscopy (XPS) (PerkinElmer PHI-5300 ESCA device in Boston, MA, USA) was used to confirm the chemical states and compositions of the produced samples. The functional groups of the obtained samples were recorded at a wavenumber range of 400 to 4000 cm−1 using Fourier transform infrared (FTIR) spectroscopy (PerkinElmer Paragon 500, USA). Dynamic light scattering (DLS) (Malvern Panalytical Ltd, located in Worcestershire, UK) was used to assess the surface charge of synthesized NPs and NCs. The optical properties of the obtained NPs and NCs were studied by UV-vis spectroscopy (Hitachi U-2600).
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