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Ccs200 m compact spectrometer

Manufactured by Thorlabs

The CCS200/M Compact Spectrometer is a versatile spectroscopic instrument designed for a wide range of applications. It features a compact and robust design, providing high-resolution optical performance. The spectrometer offers a wavelength range of 200-1100 nm, covering a broad spectrum of light. It is equipped with a high-sensitivity CMOS detector and can be controlled through a USB interface, allowing for easy integration with various systems.

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2 protocols using ccs200 m compact spectrometer

1

Characterization of Liquid Crystalline Polymer Films

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Liquid crystalline phase transition temperature was measured with DSC curves using a differential scanning calorimeter (DSC 2500, TA Instruments) with a temperature ramp rate of 10 °C min−1. Cholesteric textures of LC samples were characterized with Zeiss AXIO polarized optical microscope. Reflection spectra were measured with PerkinElmer Lambda 1050+ photospectrometer and Thorlabs CCS200/M Compact Spectrometer. Keyence laser scanning microscope VK-X250 was used to measure the sample thickness in dry/humid states. The mechanical properties of samples were measured with a tensile machine Instron 5942 using a 10 N load cell with a displacement rate of 0.05 mm s−1. In the tensile test, CLCN films in the size of 10 mm × 20 mm were used. The thickness of films at different states was measured for the calculation of corresponding Young's moduli.
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2

Characterization of Liquid Crystalline Polymer Films

Check if the same lab product or an alternative is used in the 5 most similar protocols
Liquid crystalline phase transition temperature was measured with DSC curves using a differential scanning calorimeter (DSC 2500, TA Instruments) with a temperature ramp rate of 10 °C min−1. Cholesteric textures of LC samples were characterized with Zeiss AXIO polarized optical microscope. Reflection spectra were measured with PerkinElmer Lambda 1050+ photospectrometer and Thorlabs CCS200/M Compact Spectrometer. Keyence laser scanning microscope VK-X250 was used to measure the sample thickness in dry/humid states. The mechanical properties of samples were measured with a tensile machine Instron 5942 using a 10 N load cell with a displacement rate of 0.05 mm s−1. In the tensile test, CLCN films in the size of 10 mm × 20 mm were used. The thickness of films at different states was measured for the calculation of corresponding Young's moduli.
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