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Spectrum two fourier transform infrared ftir spectrometer

Manufactured by PerkinElmer
Sourced in United Kingdom, United States

The Spectrum Two Fourier transform infrared (FTIR) spectrometer is a compact and robust analytical instrument designed for a wide range of applications. It uses infrared light to identify and quantify organic and inorganic compounds in solid, liquid, and gas samples. The Spectrum Two FTIR spectrometer provides accurate and reliable measurements with high sensitivity and resolution.

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3 protocols using spectrum two fourier transform infrared ftir spectrometer

1

Infrared Spectroscopy Analysis of Milk Samples

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The IR fingerprints were recorded by using a Spectrum Two Fourier transform infrared (FTIR) spectrometer (Perkin Elmer), equipped with an attenuated total reflection (ATR) accessory consisting of a flat top‐plate fitted with a 25 reflection, 45°, 50 mm ZnSe crystal. The ATR system was cleaned before each analysis by using dry paper and scrubbing it with hexane and ethanol, and spectra acquisition was performed without using cover apparatus. The room air FTIR‐ATR spectrum was used as background to verify the cleanliness and to evaluate the instrumental conditions and room interferences due to H2O and CO2. FTIR spectra of the milk samples, placed on the ATR surface, were recorded between 4,000 and 450 cm−1. Scan number and resolution were optimized at 16 scans and 4 cm−1, respectively. The Unscrambler X software version 10.3 from CAMO (Computer Aided Modelling) was used for the chemometric treatment of the spectral data.
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2

Morphological Characterization of Magnetic Nanoparticles

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Morphology and structure of the products Fe3O4, Fe3O4@SiO2, Fe3O4@SiO2-NH2, Fe3O4@SiO2-NH2-RAFT, Lys-PMNP and Lys-PMNP-TEMED were observed in a FEI Tecnai G2 20 X-Twin transmission electron microscope (TEM) (FEI, Hillsboro, OR, USA) using 200 kV accelerating voltage and a Hitachi S-4800 scanning electron microscope (SEM) (Hitachi High-Tech Co., Ltd., Fukuoka, Japan) using 30 kV accelerating voltage. Infrared spectra were taken by a Spectrum Two Fourier-transform infrared (FTIR) spectrometer (Perkin Elmer) (Liantrisant, UK). Thermogravimetric (TG) analysis was carried out using a Q600 thermal analyzer (TA Instruments Inc., New Castle, DE, USA) in air. X-ray diffraction (XRD) patterns were recorded by an X’pert Pro MPD X-ray diffractometer using CuKα radiation (PANalytical, Almelo, The Netherlands). The zeta potential of the NPs in aqueous solution was measured with a Zetasizer Nano-ZS instrument (Malvern Instruments, Malvern, UK). To quantify the amino groups on the particles during synthesis, a BioTek instrument (Winooski, VT, USA) was used.
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3

FTIR Spectroscopy of Chemical Samples

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MIR spectra were collected with the Spectrum Two Fourier Transform Infrared (FT-IR) Spectrometer (Perkin Elmer Corp, Waltham, MA, USA). The spectral range scanned was from 4000 to 500 cm−1 (2500–20000 nm) with a spectral resolution of 1 cm−1. The spectrometer was configured as follows.

The IR source used in the spectrometer is a silicon carbide-based infrared lamp, and the detector used is a deuterated triglycine sulfate (DTGS) detector.

The Spectrum Two FTIR spectrometer was fitted with a Horizontal Attenuated Total Reflectance (HATR) accessory containing Zince Selenide (ZnSe) crystal trough plate (PIKE Technologies, Madison, WI, USA) instead of a constant path transmission liquid cell. This was to increase the maximum sensitivity of low concentration components through internal reflections in the crystal. The ZnSe crystal is 4 mm thick, 80 mm in length, and has a refractive index of 2.4. The effective angle of incidence is 45°, thus producing 10 reflections in the crystal.

Background spectrum without a sample was acquired every 20 minutes or between every three samples, whichever came first to remove instrumental and atmospheric contributions to the spectrum of a sample. The HATR accessory was removed while acquiring the background spectra.

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