TEM was performed on samples prepared site-specifically from the Sn1−xCaxS and Mn1−xZnxO combinatorial libraries using standard focused ion beam thinning and in situ lift-out techniques. Specific regions of interest corresponding to compositions of interest were identified using an FEI Co. Nova 200 dual-column instrument operating at electron energies of 5 keV. An electron beam–induced Pt deposition of ~50 nm thickness was used to protect the sample surface followed by a thicker Pt deposition using a Ga ion accelerating voltage of 30 kV. The same Ga ion energies were used to perform rough milling and in situ extraction to a Cu grid. The final thinning was completed at Ga ion accelerating voltages of 5 kV before examination in an FEI Co. Talos F200X (S)TEM operating at 200 keV. Energy-dispersive spectroscopy was performed using a nominally 1.5-nA STEM probe at count rates of up to 125 kilocounts per second using four windowless detectors to obtain the spectral images (1000 × 1000 pixels), which were then analyzed using the Esprit version 1.9 software package (Bruker Inc.). Quantification of the compositional profiles extracted from the 2D spectral images was completed using Cliff-Lorimer correction factors and by fixed referencing of the anion concentration to 50 atomic %.
Talos f200x s tem
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Talos F200X S/TEM is a high-performance scanning/transmission electron microscope (S/TEM) designed for materials science research and analysis. It provides advanced imaging and analytical capabilities for studying the structure and composition of a wide range of materials at the nanoscale level.
Automatically generated - may contain errors
Lab products found in correlation
Nova 200, by Thermo Fisher Scientific (1 mentions)
Esprit software, by Bruker (1 mentions)
Phosphotungstic acid, by Merck Group (1 mentions)
Super x eds system, by Thermo Fisher Scientific (1 mentions)
Avizo 9, by Thermo Fisher Scientific (1 mentions)
D max 2500, by Rigaku (1 mentions)
Axis ultra dld system, by Shimadzu (1 mentions)
Verios 460l, by Thermo Fisher Scientific (1 mentions)
Icap rq icp ms, by Thermo Fisher Scientific (1 mentions)
U 4100 uv vis nir spectrophotometer, by Hitachi (1 mentions)
Escalab xi x ray photoelectron spectrometer xps, by Thermo Fisher Scientific (1 mentions)
Titan g2 60 300 tem, by Thermo Fisher Scientific (1 mentions)
Sonorex super rk 100 h, by Bandelin (1 mentions)
D2 phaser diffractometer, by Bruker (1 mentions)
Icp ms, by Agilent Technologies (1 mentions)
Jsm 7600f sem, by JEOL (1 mentions)
Asap 2020 analyzer, by Micrometrics (1 mentions)
X ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Ni nta nanogold particles, by Nanoprobes (1 mentions)
Cary 60, by Agilent Technologies (1 mentions)
19 protocols using talos f200x s tem
1
Site-Specific TEM Analysis of Combinatorial Oxides
2
Compositional Analysis of Cr-rich Precipitates
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A FEI Talos F200X S/TEM with Super X Energy Dispersive X-rays detectors operated at 200 kV has been used to provide independent composition analyses of the Cr-rich precipitates in the CuCrZr TEM specimens. Energy Dispersive spectroscopy (EDS) spectrum images presented were generated by using the Bruker ESPRIT software and have the background subtracted using the standard build-in function available in the software.
3
TEM Imaging of LNP Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
For TEM imaging of LNP-Trap and LNP-Trim, samples dissolved in water were drop-cast onto a carbon-coated copper grid (400 mesh) and negatively stained with 1% phosphotungstic acid (Sigma-Aldrich (St. Louis, MO) in DIW for three minutes. The grids were blotted and air- dried before TEM imaging using FEI Talos F200X S/TEM. The actual LNP core diameter from the images was determined by measuring 100 individual nanoparticles from several images using Image J software.
4
STEM and EDS Characterization of Catalyst
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDS) were performed on an FEI Talos F200X S/TEM with a super-X EDS system and a high brightness field emission electron source. The microscope was operated at 300 keV and STEM images were recorded using a high angle annular dark field (HAADF) detector. Ground catalyst powder was physically mixed with a copper 300 mesh lacey carbon coated TEM grid (SPI supplies). Reported particle size distributions are number average particle sizes and were determined by measuring more than 250 particles. Measurement of particles was done using the FIJI distribution of ImageJ.31 (link)
5
Electron Microscopy for Nanomaterial Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Electron-transparent thin foils were prepared for (scanning) STEM by using an FEI Helios NanoLab G3 FIB-SEM. The FIB-SEM was also used to acquire several slice-and-view series for 3D volume reconstructions. Slice imaging was carried out in BSE mode at 3 kV and 3.2 nA with a pixel size of 8 × 8 nm2 (voxel size of 8 × 8 × 30 nm3). All FIB-SEM nanotomography volumes were reconstructed and analyzed using FEI Avizo 9. Thin foils were investigated in an FEI Talos F200X (S)TEM equipped with four energy-dispersive x-ray spectroscopy detectors (Super-EDX). All FIB-SEM and TEM analyses were carried out at the Electron Microscopy Square, Utrecht University.
6
Comprehensive Characterization of Catalytic Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
XRD patterns were collected using an x-ray diffractometer (Rigaku D/max 2500) at a scan rate of 10° min−1 in the 2θ range of 10° to 90°. SEM observations were performed using a field emission gun (FEG) SEM instrument (Verios 460 L of FEI). Low-magnification HAADF-STEM images were recorded using an FEI Talos F200X S/TEM with a FEG. Atomic-resolution HAADF-STEM images and EDS elemental maps were taken using an FEI Titan Cubed Themis G2 300 S/TEM with a probe corrector. XPS measurements were performed using a Kratos AXIS Ultra DLD system with the Al Kα radiation as the x-ray source. N2 sorption/desorption measurements were performed at 77 K using an autosorb iQ instrument (Quantachrome, US) with the Brunauer-Emmett-Teller method. Pore size distribution was obtained from the N2 sorption/desorption isotherm. The Ru and Ni K-edge XAFS spectra were recorded at beamline TPS 44A of the National Synchrotron Radiation Research Center. Metal contents of the samples were analyzed by ICP-MS (Thermo Fisher iCAP RQ ICP-MS).
7
Comprehensive Structural and Compositional Analysis of Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images were collected on an FEI Titan G2 60-300 TEM operating at 300 kV. High angle annular dark-field scanning TEM (HAADF-STEM) images and STEM energy-dispersive spectroscopy (STEM-EDS) maps were collected on an FEI Talos F200X S/TEM at an accelerating voltage of 200 kV. All the samples for TEM analysis were drop-cast from a nanoparticle/hexane suspension onto 400-mesh molybdenum (Mo) grids with carbon/formvar film. Before the TEM measurements, all samples were treated with a plasma cleaner. A Bruker D8 Advance X-ray diffractometer using Cu Kα radiation (λ = 0.15418 nm) was employed to record the powder X-ray diffraction patterns of the samples. The chemical compositions of the samples were analyzed on a Thermo Scientific ESCALAB Xi X-ray photoelectron spectrometer (XPS). The absorption spectra of the samples from the ultraviolet (UV) to near-infrared (NIR) region were recorded on a Hitachi U-4100 UV-vis-NIR spectrophotometer.
8
TEM Characterization of Catalysts
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A Talos F200X (S)TEM (ThermoFisher, high-brightness X-FEG emitter) equipped with a Ceta 16 Megapixel CMOS camera was used to record micrographs of the samples at 200 kV acceleration voltage. The samples were prepared by dispersing ∼100 μg catalyst powder in isopropyl alcohol, followed by brief sonication (Bandelin Sonorex super RK 100 H). Copper-based TEM grids (lacey carbon film, 3–4 nm nominal thickness, 200 quadratic mesh, ScienceServices GmbH) were loaded by dipping the grids into the solution and then dried in air. A model 2020 tomography holder (Fischione Instruments) was used for both acquisitions of 2D TEM micrographs and bright-field (BF)/high-angle annular dark-field (HAADF) tilt series image pairs (1024 × 1024 pixels, ± 72–75°, 2° tilt increment) in the STEM imaging mode. EDX mappings were acquired with a field of view of 300 nm. Elemental distributions were obtained with 100 scans and 15 μs dwell time per scan.
9
Comprehensive Characterization of Nanostructured Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
HAADF-STEM images were taken using a JEOL3100R05 Double Cs Corrected S/TEM operated at 300 kV, with a collection angle of 59–200 mrad. The EDS mapping was carried out on a Thermo Fisher Scientific Talos F200X S/TEM equipped with a Super-X EDS detector. The TEM specimens were prepared by drop-casting wet gel onto carbon-coated 200-mesh Cu grids. The particle size distribution was estimated using Nano Measurer 1.2 software. The crystalline phase was characterized by PXRD using a Bruker D2 Phaser diffractometer. PXRD patterns were analyzed by comparison to the powder diffraction file database of the International Center for Diffraction Data. The chemical state and elementratio were analyzed by X-ray photoelectron spectroscopy (Thermo Fisher Scientific NEXSA UV and X-ray Photoelectron Spectrometer). XPS peaks were fitted using a composite function (30% Lorentzian + 70% Gaussian) and calibrated according to the C1s peak at 284.8 eV via the Avantage software. The elementary ratio of Pb/Cd was also identified by ICP-MS (Agilent 7700x ICP-MS). The surface area and pore size determined from nitrogen physisorption data (Micrometrics ASAP 2020 analyzer) using the BET and Barrett–Joyner–Halenda models. The surface and cross-section morphology of the xerogel film were analyzed by field-emission scanning electron microscopy (JEOL JSM 7600F SEM).
10
Visualizing His-CYGB Translocation and Distribution
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The translocation and distribution of His‐CYGB were determined using His‐CYGB unlabeled and labeled with Alexa tetrafluorophenyl (TFP) esters, which were obtained from Molecular Probes and included Alexa Fluor 488 and Alexa Fluor 647. TFP esters react efficiently with the primary amines in proteins to form stable dye–protein conjugates. Proteins were labeled following the manufacturer’s protocol. For transmission electron microscopy (TEM) (Talos F200X S/TEM; Thermo Fisher Scientific) analysis, His‐CYGB was performed after embedding labeling using 5‐nm nickel–nitrilotriacetic (Ni‐NTA) nanogold particles (Nanoprobes). See the Supporting Information for details.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!