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Dra 2500

Manufactured by Agilent Technologies
Sourced in United Kingdom, United States

The DRA-2500 is a digital reference analyzer from Agilent Technologies. It is designed to measure and analyze electrical signals with high accuracy and precision. The device provides essential measurement capabilities for various applications, including electronics, telecommunications, and power systems.

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10 protocols using dra 2500

1

Characterization of UV-blocking Textile Fibers

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Ultraviolet-visible (UV-vis) reflectance absorption spectra were obtained from a Varian Cary 5000UV-VIS-NIR spectrophotometer with a diffuse reflectance accessory (DRA-2500). The morphologies of fibers were observed on a Supra 55 VP field emission scanning electron microscope (SEM). A Datacolor Spectraflash SF600 Plus-CT spectrophotometer was used for the measurement of color strength (K/S). A YG902 Fangyuan UV measurement system was used for testing the UV-blocking properties. The light irradiation test was conducted with a Suntest instrument (SUNTEST XLS+ from Atlas Material Testing Technology LLC). The temperature of the coloration process was monitored by an instrument equipped with needle-type temperature probes (from ICT SFM, a sap flow meter produced by ICT international Pty. Ltd.). X-ray diffraction (XRD) data were collected from fabrics on a Panalytical X’Pert Powder instrument using a CuKa radiation source (λ = 1.54181 Å). Rubbing color fastness was tested by a Gellowen G238BB electronic crockmeter instrument.
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2

Characterization of Noble Metal Nanoparticles in Ramie Fibers

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The UV-vis diffuse reflectance absorption spectra of fibers were recorded by a Varian Cary 5000 UV-VIS-NIR spectrophotometer with a diffuse reflectance accessory (DRA-2500). Scanning electron microscopy (SEM) measurements were performed with a Supra 55 VP field emission SEM. The color strength (K/S) of ramie fibers/fabrics with noble metal nanoparticles was calculated using the Kubelka–Munk equation as follows: K/S=1R22R where K is the absorption coefficient of the substrate, S is the scattering coefficient of the substrate, and R is the reflectance of the fibers/fabrics at maximum absorption, measured using a Datacolor Spectraflash SF600 Plus-CT spectrophotometer. Heating reaction was performed in a Ratek shaking water bath. A Varian AA-140 atomic absorption spectrophotometer was employed to analyze the concentration of silver and gold ions.
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3

TEM and Spectroscopic Analysis of Photocatalysts

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Transmission electron microscopy (TEM) images were collected by a FEI Tecnai G2 Twin operating at 200 kV. The TEM samples were prepared by dispersing the photocatalysts in ethanol with sonication and depositing on a copper grid coated with a carbon film (Ted Pella, 01813). Diffuse-reflectance ultraviolet–visible extinction spectra were obtained on an Agilent Cary 5,000 equipped with an external diffuse-reflectance accessory (DRA-2500). The composition of the photocatalysts was measured by a Kratos Analytical Axis Ultra X-Ray Photoelectron Spectrometer.
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4

Temperature-Dependent Optical Properties

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UV–vis spectra between 400 and 800 nm were measured using a Cary 5000 (Agilent, USA) UV–vis spectrophotometer. The total reflectance of the films was measured in air using an integrating sphere (DRA 2500, Agilent) and the temperature of the sample was controlled using a TMS94 temperature controller (Linkam, UK). The transmittance of the films in water was measured as a function of temperature, which was controlled by a dual cell Peltier sample holder. The LCST was defined as the temperature at which the transmittance reached 50%. For the CIELAB color space, the total reflectance spectra were measured between 360 and 830 nm, and the calculation of the color space was conducted using the Scan program (version 6.2.0.1588) of the instrument.
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5

Diffusive Transmittance of Modified Wood

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Diffusive transmittance of modified
wood was measured with a Cary 5000 UV–vis–NIR spectrophotometer
(Agilent Technologies) involving an integrating sphere (DRA 2500,
Agilent) at a scan rate of 600 nm/min and a data interval of 1 nm,
between 800 and 300 nm.
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6

Spectrophotometric analysis of PC fabrics

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The PC coated fabrics were analyzed with a spectrophotometer (Cary 5000, Agilent, Santa Clara, CA, USA) equipped with an integrating sphere (DRA 2500, Agilent, Santa Clara, CA, USA), within the wavelength range from 250 to 2500 nm (NUV-VIS-NIR). However, only the wavelength region 350–750 nm (VIS) was analyzed in this work. Directional Hemispheric Reflectance (DHR) was both measured at a fixed angle of incidence of 8 degrees (total DHR, without polarizer) and at different angles of incidence ( αi ), from 12 to 80 degrees, for both s- and p-polarized light.
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7

Optical Characterization of Nanomaterials

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Reflectance measurements were performed with a Cary 5000 UV–vis–NIR spectrometer (Agilent Technologies) equipped with an integrating sphere (internal DRA 2500). Particles were measured as a dispersion in IPA (c = 2–2.5 g/L) in standard cuvettes made of special optical glass (OS, Hellma) in the range of 400 to 850 nm. At 800 nm, the detector of the instrument changed, which caused a small artifact at this wavelength. While this artifact is visible in Figure 7a, it becomes negligible in Figure 7b and 7c because it corresponds to an energy of 1.55 eV, which is not in a relevant range for the band gap analysis of the measured samples, and the intensity decreases to an invisible level. The estimation of the accuracy of the Tauc method was based on a study by Viezbicke et al., who evaluated the accuracy of the Tauc plot for 120 individual analyses of polycrystalline ZnO and found a deviation of about 0.03 eV [52 (link)].
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8

Optical Characterization of CdSe/CdS Nanorods

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The UV/vis absorption
spectra of the CdSe/CdS NR solutions and the CdSe/CdS NR gel electrodes
were recorded with an Agilent Cary 5000 absorption spectrophotometer
equipped with an Agilent DRA-2500 integrating sphere. Emission spectra
and photoluminescence lifetime measurements of the solution and the
substrates were recorded using a Fluoromax-4 spectrometer from Horiba.
The photoluminescence quantum yield (PLQY) was measured in an absolute
mode using a DUAL-FL spectrometer from Horiba equipped with a Quanta-Phi
integrating sphere.
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9

Optical Characterization of CdSe/CdS Nanorods

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UV/Vis absorption spectra of the CdSe/CdS nanorod solutions and the nanoparticle decorated substrates were measured with an Agilent Cary 5000 absorption spectrophotometer equipped with an Agilent DRA-2500 integrating sphere in center mount position. Emission spectra and the PL lifetime of the solution and the prepared ITO samples were recorded with a Fluoromax-4 spectrometer from Horiba equipped with a time correlated single photon counting (TCSPC) accessory. All presented absorption spectra of the ITO/linker/nanoparticle electrodes are obtained under the subtraction of the spectrum of a blank ITO slide from the ones of nanoparticle decorated slides. The non-corrected absorption of a NR decorated substrate and the spectrum of a blank ITO slide are matching well at wavelengths were the particles are not optical absorbing (SI Figure 1).
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10

Photoluminescence and Angular Optical Response

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The photoluminescence spectra were recorded using a spectrophotometer, using two different lasers at 450 nm and 530 nm for the excitation of MAPbBr 3 and MAPbI 3 , respectively. The R T and T T measurements were carried out inside an integrating sphere (DRA-2500, Agilent) connected to a commercial spectrophotometer (Cary 5000 UV-Vis-NIR). For the angular characterization, we made use of an accessory of the spectrophotometer, which is the Universal Measurement Accessory, allowing the analysis of the angular optical response of the composite films.
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