All measurements including the four-terminal AC differential conductance measurements and the DC current-voltage (I–V) measurements were performed over a wide range of temperature (2.5 K to 120 K) using a Quantum Design Physical Properties Measurement System (PPMS). Samples were mounted on a commercial PPMS puck and all measurements were performed in a low-noise screen room. For AC measurements, we used 23.3 Hz as the AC output frequency. The DC source voltage was supplied by a Keithley 2400 source meter and the AC source was supplied by a Agilent 33120 A AC generator with ΔV ~ 0.2 mV. The DC and AC source signals were added using a homemade DC + AC adder and then applied to the junction. The DC bias across the junctions was measured with HP 3456A multimeter, the AC voltage signal with a SR830 DSP lock-in amplifier, and the AC current signal with a second SR830 lock-in amplifier after converting the current to a voltage using a SR570 current preamplifier.
2400 source meter
Manufactured by Agilent Technologies
Sourced in Germany
The 2400 Source Meter is a versatile instrument designed for accurate sourcing and measurement of voltage, current, and resistance. It features programmable sourcing and measurement capabilities, enabling precise control and monitoring of electrical parameters.
Automatically generated - may contain errors
Lab products found in correlation
Physical properties measurement system (ppms), by Quantum Design (1 mentions)
34420 a nanovolt meter, by Agilent Technologies (1 mentions)
E4980a lcr meter, by Agilent Technologies (1 mentions)
Surlyn, by Solaronix (1 mentions)
H2so4, by Merck Group (1 mentions)
Dh 2000 bal, by OceanOptics (1 mentions)
5 protocols using 2400 source meter
1
Wide-Range Transport Characterization of Quantum Materials
2
Electrical Characterization of Au Microelectrodes
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Au microelectrodes for electrical
characterization were prepared by standard ultraviolet contact photolithography
and sputtering of an 8 nm Cr adhesion layer, followed by 250 nm Au
for general substrates and 75 nm Au for the microelectrodes on SiO2 (300 nm)/p-Si substrates (CrysTec GmbH; Germany).
In
situ two-point electrical transport measurements were carried out
inside the SEM microscope after FEBID/FIBID.59 (link) Standard measurements were performed using a Keithley 2400 source
meter and an Agilent 34420A nanovoltmeter.
characterization were prepared by standard ultraviolet contact photolithography
and sputtering of an 8 nm Cr adhesion layer, followed by 250 nm Au
for general substrates and 75 nm Au for the microelectrodes on SiO2 (300 nm)/p-Si substrates (CrysTec GmbH; Germany).
In
situ two-point electrical transport measurements were carried out
inside the SEM microscope after FEBID/FIBID.59 (link) Standard measurements were performed using a Keithley 2400 source
meter and an Agilent 34420A nanovoltmeter.
3
Electrochemical Characterization of UO2/FTO
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All electrochemical measurements were performed using a one-compartment, 3-electrode cell with the UO2/FTO sample as the working electrode, platinum (Pt) wire as the counter electrode and a saturated calomel electrode (SCE) as the reference electrode. 0.1 M Na2SO4 was used as the electrolyte. The Keithley 2400 source meter applied the potential and an Agilent E4980A LCR meter recorded the capacitance controlled by the Lab View software.
4
Fabrication of Flexible Micro-Supercapacitors
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The compressed WO3/PVDF/MWCNT film (∼60 μm) was first attached onto a
layer of Surlyn (25 μm, Solaronix) by heating at 110 °C
for 20 min. Then, the flexible composite was adhered through the same
heating process to the surface of a low tack PE tape (75 μm)
which had been preliminarily covered on a glass slide as shown inFigure 7 A. The thickness
of electrodes used was determined by the power of our laser system.
The WO3/PVDF/C electrode with substrates was then patterned
by the laser to form interdigital structures (Figure S15 ). The WO3/PVDF/C films functioned as
both active materials for energy storage and electron collectors.
PVA/H2SO4 hydrogel, as an electrolyte, was prepared
by mixing 6 g of PVA (Mw = 89,000–98,000,
Sigma-Aldrich) powder, 6 g of H2SO4 (Sigma-Aldrich),
and DI water (60 mL). The mixture was heated at 85 °C under stirring
until the solution turned clear. WO3/PVDF/C electrodes
and MSCs were characterized by CV and electrochemical impedance spectroscopy
using a BAS 100B Electrochemical Analyzer. Galvanostatic charge/discharge
measurements were conducted using a Keithley 2400 source meter and
an Agilent 34411A 61/2 digital multimeter. The CV of electrodes was
measured in a three-electrode system (vs an Ag/AgCl reference electrode).
A platinum foil was placed 1 cm away from WO3/PVDF/C electrodes
as the counter electrode.
layer of Surlyn (25 μm, Solaronix) by heating at 110 °C
for 20 min. Then, the flexible composite was adhered through the same
heating process to the surface of a low tack PE tape (75 μm)
which had been preliminarily covered on a glass slide as shown in
of electrodes used was determined by the power of our laser system.
The WO3/PVDF/C electrode with substrates was then patterned
by the laser to form interdigital structures (
both active materials for energy storage and electron collectors.
PVA/H2SO4 hydrogel, as an electrolyte, was prepared
by mixing 6 g of PVA (Mw = 89,000–98,000,
Sigma-Aldrich) powder, 6 g of H2SO4 (Sigma-Aldrich),
and DI water (60 mL). The mixture was heated at 85 °C under stirring
until the solution turned clear. WO3/PVDF/C electrodes
and MSCs were characterized by CV and electrochemical impedance spectroscopy
using a BAS 100B Electrochemical Analyzer. Galvanostatic charge/discharge
measurements were conducted using a Keithley 2400 source meter and
an Agilent 34411A 61/2 digital multimeter. The CV of electrodes was
measured in a three-electrode system (vs an Ag/AgCl reference electrode).
A platinum foil was placed 1 cm away from WO3/PVDF/C electrodes
as the counter electrode.
5
Electrical Characterization of Pressure Sensors
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Electrical characterization of the pressure sensors was carried out using a Keithley 2400 SourceMeter and an Agilent 4155c semiconductor parameter analyser under a bias voltage of 1 V. Static loads and continuous loading and unloading cycles were applied with an automatic force test stand (ASM-1000, a length resolution of 10 μm, Digitech) with a computer controller. The sheet resistances and transmittances of the CNNs were measured using an ohm meter with a four-point probe (FPP-RS 8, DASOL ENG) and a spectrometer (DH-2000-BAL, Ocean optics), respectively.
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