Inspect s 50 scanning microscope
The Inspect S 50 is a scanning electron microscope (SEM) designed for high-resolution imaging of samples. It provides detailed surface information and analysis of materials at the micro- and nanoscale. The Inspect S 50 is capable of magnifications up to 300,000x and offers a range of analytical functions for various applications.
Lab products found in correlation
4 protocols using inspect s 50 scanning microscope
Characterization of MS Particles
Characterization of Microparticle Size, Zeta Potential, and Morphology
Characterization of Lipid-based Microparticles
The copyright holder for this preprint (which this version posted May 24, 2020. ; https://doi.org/10.1101/2020.05.22.111633 doi: bioRxiv preprint 6 dispersing 1 mg of unloaded-MS or LTB 4 -loaded MS in 0.4 mL of purified water containing 10 mM NaCl and then analyzed at 25 °C. Morphology of MS samples was assessed by scanning electron microscopy (SEM) using a FEI Inspect S 50 scanning microscope (FEI; Oregon, USA).
Characterization of Polymeric Microspheres
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!