After nano-DMA analysis, specimens were cut in two halves. One half was fixed in a solution of 2.5% glutaraldehyde in 0.1 mol/L sodium cacodylate buffer for 24 h. Samples were subjected to critical point drying (Leica EM CPD 300, Wien, Austria), sputter-coated with carbon by means of a Nanotech Polaron-SEMPREP2 sputter-coating equipment (Polaron Equipment Ltd., Watford, UK). Samples were then observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany). Employed accelerating voltage was 3 kV, and 3.0–3.6 mm was used for working distance. Images were taken with different magnifications at randomized areas, in each specimen. Elemental analysis was done by means of an energy dispersive analysis system (EDX) (Inca 300 and 350, Oxford Instruments, Oxford, UK).
Fesem gemini
Manufactured by Zeiss
Sourced in Germany
The FESEM Gemini is a field emission scanning electron microscope (FESEM) developed by Zeiss. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The FESEM Gemini utilizes a field emission electron source to generate a high-intensity electron beam, enabling the microscope to achieve excellent resolution and imaging quality.
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Lab products found in correlation
5 protocols using fesem gemini
1
Nano-DMA Analysis and SEM Imaging
2
Specimen preparation for FESEM analysis
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After all the previous analyses, two specimens from each experimental group were fixed in a solution of 2.5% glutaraldehyde in 0.1 mol/L sodium cacodylate buffer for 24 h, rinsed three times in 0.1 mol/L sodium cacodylate buffer. Samples were placed in an apparatus for critical point drying (Leica EM CPD 300, Wien, Austria). They were then sputter-coated with carbon by means of a sputter-coating Nanotech Polaron-SEMPRE2 (Polaron Equipment Ltd., Watford, UK) and observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany) at an accelerating voltage of 2.5 to 3 kV.
3
Ultrastructural Characterization of Samples
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Representative specimens of each group were fixed in a solution of 2.5% glutaraldehyde in 0.1 mol/L sodium cacodylate buffer for 24 h, rinsed three times in 0.1 mol/L sodium cacodylate buffer. Samples were placed in an apparatus for critical point drying (Leica EM CPD 300, Wien, Austria). They were, then, sputter-coated with carbon by means of a sputter-coating Nanotech Polaron-SEMPREP2 (Polaron Equipment Ltd., Watford, UK) and observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany) at an accelerating voltage of 3 kV. Energy-dispersive analysis was performed in selected points using an X-ray detector system (EDX Inca 300, Oxford Instruments, Oxford, UK) attached to the FESEM.
4
Ultrastructural Examination of Specimens
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Specimens were then fixed in a solution of 2.5% glutaraldehyde in 0.1 mol/L sodium cacodylate buffer for 24 h, rinsed three times in 0.1 mol/L sodium cacodylate buffer. Samples were placed in an apparatus for critical point drying (Leica EM CPD 300, Wien, Austria).
They were then sputter-coated with carbon by means of a sputter-coating Nanotech Polaron-SEMPREP2 (Polaron Equipment Ltd., Watford, UK) and observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany) at an accelerating voltage of 2.5 to 3 kV. Energy-dispersive analysis was performed in selected points using an X-ray detector system (EDX Inca 300, Oxford Instruments, Oxford, UK)
attached to the FESEM.
They were then sputter-coated with carbon by means of a sputter-coating Nanotech Polaron-SEMPREP2 (Polaron Equipment Ltd., Watford, UK) and observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany) at an accelerating voltage of 2.5 to 3 kV. Energy-dispersive analysis was performed in selected points using an X-ray detector system (EDX Inca 300, Oxford Instruments, Oxford, UK)
attached to the FESEM.
5
Scanning Electron Microscopy and Elemental Analysis
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Representative specimens of each group were fixed in a solution of 2.5% glutaraldehyde in 0.1 mol/L sodium cacodylate buffer for 24 h, rinsed three times in 0.1 mol/L sodium cacodylate buffer. Samples were placed in an apparatus for critical point drying (Leica EM CPD 300, Wien, Austria). They were, then, sputter-coated with carbon by means of a sputter-coating Nanotech Polaron-SEMPREP2 (Polaron Equipment Ltd., Watford, UK) and observed with a field emission scanning electron microscope (FESEM Gemini, Carl Zeiss, Oberkochen, Germany) at an accelerating voltage of 3 kV. Energydispersive analysis was performed in selected points using an X-ray detector system (EDX Inca 300, Oxford Instruments, Oxford, UK) attached to the FESEM. MTBS values were analyzed by two-way ANOVA (independent factors are mechanical loading and adhesive type) and Student Newman Keuls multiple comparisons tests. For all tests, statistical significance was set at a = 0.05.
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