Cryostream 700 low temperature device

Diffraction data for samples 1-4 were collected using Bruker SMART APEXII (1) or Rigaku Oxford Diffraction SuperNova (2-4) diffractometers with MoK α (1, 2 & 4) and CuK α (3) radiation, and are given in Table S1 in the ESI. ‡ An Oxford Cryosystems Cryostream 700+ low temperature device was used to maintain a crystal temperature of 120.0 K for all experiments. The structures were solved using ShelXT and refined with ShelXL interfaced through Olex2. 33, 34 All non-hydrogen atoms were refined using anisotropic displacement parameters. H atoms were placed in calculated positions geometrically and refined using the riding model. Unit cell parameters for 2 were also obtained at T = 3.4 Ksee the ESI ‡ for details. CCDC: 1819131-1819134. ‡

Single crystal X-ray diffraction data for samples 1-6 were collected using a Rigaku Oxford Diffraction SuperNova diffractometer with MoK α (1 & 5-6) or CuK α (2-4) radiation. Experimental details are given in Table S1 in the ESI. † An Oxford Cryosystems Cryostream 700+ low temperature device was used to maintain a crystal temperature of 120.0 K for all experiments. The structures were solved using ShelXT and refined with version ShelXL interfaced through Olex2 (1-2, 4-6), or Superflip and refined using ShelXL (3). [21] [22] [23] All nonhydrogen atoms were refined using anisotropic displacement parameters. H atoms were placed in calculated positions geometrically and refined using the riding model except for some in compound 6 which were refined freely. CCDC 1855222-1855227. †