Jsm 7800 f prime with dual eds

High-resolution SEM-EDS images were obtained by FE-SEM (JSM 7800 F PRIME with Dual EDS, JEOL) and EDS (Aztec, Oxford) with an accelerating voltage of 15 kV. SEM analyses of hydroxide precursors and cathode materials were carried out on a TE-SEM (Genesis-1000, EMCRAFT) with an accelerating voltage of 10 kV. Cross-section SEM-EDS images were obtained by FE-SEM (JSM 7100F, JEOL) and EDS (Aztec, Oxford) with an accelerating voltage of 15 kV. The Li₂CO₃ powder sample was casted on Al foil with PVDF binder and polished by a cross-section polisher (SM-09010, JEOL).

The intermediated mixture analysis was conducted. The intermediated mixture sample of LCD was prepared by mixing Bare precursor with LCM lithium precursor. Likewise, the intermediated mixture sample of SSD was prepared by mixing Bare precursor with LCB lithium precursor with a stoichiometric amount of MgCO₃. All the mixtures were then calcinated at 400 °C for 5 h in a tube furnace under O₂ gas flowing. The chemical composition analysis was conducted by SEM-EDS. SEM backscattered electron images and EDS line scan images were obtained by FE-SEM (JSM-7100F) and EDS (Aztec, Oxford) with an accelerating voltage of 15 kV. SEM-EDS mapping images were obtained by FE-SEM (JSM 7800 F PRIME with Dual EDS, JEOL) and EDS (Aztec, Oxford) with an accelerating voltage of 15 kV. The crystal structure analysis was conducted by XRD (D8 ADVANCES, Bruker) with a Cu Kα wavelength of 1.5418 Å.