Selected samples of fumarolic mineralization were prepared in thin section for their textural and mineralogical study at the Laboratory of Geological and Paleontological Preparation (LPGiP) of the Natural Sciences Museum of Barcelona (Barcelona, Spain). A representative selection of the samples was examined in a field emission scanning electron microscope (FE-SEM) model JEOL JSM-7100 at the Scientific and Technological Centres of the University of Barcelona (CCiT-UB). This FE-SEM system is also equipped with an Oxford Instruments EDS (energy dispersive spectroscopy) detector model Pentafex-INCA, which was used to acquire semi-quantitative analyses of fumarole mineral phases as well as to obtain semi-quantitative compositional maps. General operating conditions were 15–20 kV accelerating voltage and 5 nA of beam current.
Jsm 7100
Manufactured by JEOL
Sourced in Japan, Belgium
The JSM-7100 is a high-resolution scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-quality images and data for a wide range of applications. The core function of the JSM-7100 is to generate and detect electron beams, which interact with the surface of a sample to produce images and gather information about its topography, composition, and other properties.
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Lab products found in correlation
7 protocols using jsm 7100
1
Fumarolic Mineral Characterization by SEM-EDS
2
Nitinol Powder Characterization via PREP
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The employed PREP equipment is produced by Nissin Giken Corporation in Japan. It has a stainless steel atomization tank of 1500 mm in diameter with 300 mm in width. Argon gas flow plasma discharge of 6–9 kVA power under10−3Pa was produced between the tungsten-tip (cathode) and the nitinol rod of 20 mm in diameter and 200–240 mm in length (anode), starting from the edge of the spinning rod. Rotation speed range is from 8,000~12,000 rpm and the electric current ranges from 60 to 80 A.
Nitinol powders were sieved in three sizes range of about ≧500 μm, 300~500 μm, and ≦300 μm. To get the weight percentage of the each size range nitinol powders at different PREP parameters, three size ranges were weighted. Weight percentage analysis was the weight ratio between the total PREP powder and particular size at every experimental. The microstructure was studied by optical microscopy, and by scanning electron microscopy (SEM) in JEOL JSM-7100 equipment. The powders for SEM were pasted in the carbon tap. In addition, X-ray diffraction (XRD) was carried out in Bruker D8 equipment employing Cu Kα radiation.
Nitinol powders were sieved in three sizes range of about ≧500 μm, 300~500 μm, and ≦300 μm. To get the weight percentage of the each size range nitinol powders at different PREP parameters, three size ranges were weighted. Weight percentage analysis was the weight ratio between the total PREP powder and particular size at every experimental. The microstructure was studied by optical microscopy, and by scanning electron microscopy (SEM) in JEOL JSM-7100 equipment. The powders for SEM were pasted in the carbon tap. In addition, X-ray diffraction (XRD) was carried out in Bruker D8 equipment employing Cu Kα radiation.
3
Characterization of Ti and NTAs
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The surface morphology of the Ti and NTAs was characterized by field-emission scanning electron microscopy (FE-SEM, JSM-7100, JEOL) at an accelerating voltage of 15 kV. The average diameter of NTAs was determined by the Digimizer. The 3D profile was determined by the plugin-surface plot in ImageJ software.
4
Characterization of Transparent Solar Absorber
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The cross‐sectional image of the CWO film was obtained with a scanning electron microscopy (SEM, JSM‐7100, JEOL). The UV–vis–NIR (0.3–2.5 µm) transmittance (T) and absorption (A) spectra of the transparent solar absorber, transparent photovoltaic cell, and their integrated window were measured using a spectrometer (Lambda 950, Perkin Elmer) equipped with a 150 mm integrating sphere. For the temperature response measurement, a solar simulator (Oriel Sol2A, Newport) was used to provide standard and stable 1‐sun power (1 kW m−2), and T‐type thermocouples were used to measure the steady–state temperature and connected to a data acquisition device (NI 9213, National Instrument) for data recording. For the TPV electrical characterization, a Keithley 2420 SourceMeter was used to obtain I–V characteristics under simulated AM 1.5G solar illumination. The photovoltaic cell layouts,[15 ] in which a matte black background was placed on the back of the TPV device, were used so that illumination from the environment or reflection could be eliminated for both I–V measurements.
5
Evaluating Titanium Implant Surfaces
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Pristine implants (uncontaminated and untreated) were evaluated by scanning electron microscope (SEM, Thermal Field Emission SEM, JEOL JSM-7100, Tokyo, Japan) to provide a baseline surface assessment and description prior to group allocation. The samples were rinsed with 0.1 M of phosphate-buffered solution (PBS) at pH 7.1 and fixed overnight with a 4% PBS–paraformaldehyde solution at 4 °C. Samples were further washed with PBS buffer and dehydrated using an ascending alcohol series before mounting onto aluminum stubs and gold sputtering in an Emitech K550 (Emitech Ltd., Ashford, Kent, UK).
A SEM with 10 kV and 3.3 A was used to capture images of the implants surface before and after the treatments. These images were used to examine any alteration on the Ti surface and were captured at 3, 6, 9, and 12 o’clock positions, at a distance of 300 mm from the center of the implant. Two magnifications of micrographs were used: ×270 and ×2700.
A SEM with 10 kV and 3.3 A was used to capture images of the implants surface before and after the treatments. These images were used to examine any alteration on the Ti surface and were captured at 3, 6, 9, and 12 o’clock positions, at a distance of 300 mm from the center of the implant. Two magnifications of micrographs were used: ×270 and ×2700.
6
Extruding Entangled Microstrands for SEM
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Entangled microstrands were extruded as straight lines through a 410 µm conical needle and collected on a glass plate. Bulk HA‐MA hydrogel and freshly made entangled microstrands were used as control. All samples were frozen in liquid nitrogen and lyophilized. For SEM analyses, the lyophilized samples were coated using Pt/Pd (80/20) at a thickness of 10 nm by a sputter coater (CCU‐010 HV, Safematic). The imaging was performed using a SEM instrument (JSM‐7100, JEOL).
7
Cryo-SEM and CLSM Analysis of Thymol Emulsions
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The morphology and formation of thymol emulsions was evaluated using a Cryo-SEM (JSM-7100, Jeol Europe, Belgium) equipped with a PP3000T device (Quorum Technologies, East Sussex, UK). A small amount of sample was placed on a copper grid. The sample was frozen in a nitrogen slush (-190°C) followed by fracturing. Then, it was sublimated and sputter coated with platinum prior to photograph recording.
Confocal laser scanning microscopy (CLSM) (Leica TCS-SP5, Germany) was utilized to visualize thymol Pickering stabilized emulsions. WPI-SFAG nanoparticles (3:2, pH 4.5, TC = 0.4) and oil phase were stained by Rhodamine B and Nile red, respectively. The excitation and emission wavelengths of Rhodamine B were set as 560 and 625nm, respectively. Nile red was excited at 488nm and detected at 680-700nm. The emulsions after staining were diluted by the appropriate acetate buffer in order to have individual emulsion droplet. The images were processed using Image J software.
Confocal laser scanning microscopy (CLSM) (Leica TCS-SP5, Germany) was utilized to visualize thymol Pickering stabilized emulsions. WPI-SFAG nanoparticles (3:2, pH 4.5, TC = 0.4) and oil phase were stained by Rhodamine B and Nile red, respectively. The excitation and emission wavelengths of Rhodamine B were set as 560 and 625nm, respectively. Nile red was excited at 488nm and detected at 680-700nm. The emulsions after staining were diluted by the appropriate acetate buffer in order to have individual emulsion droplet. The images were processed using Image J software.
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