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9 protocols using cellhesion module

1

Simultaneous AFM and Microscopy Imaging

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We used a Nanowizard II AFM (JPK Instruments, Berlin, Germany) mounted on a Zeiss microscope (Carl Zeiss, Jena, Germany). This configuration allows to carry out AFM measurements and simultaneously observe the cells using phase contrast or fluorescence modes. This AFM is also equipped with the 'CellHesion' module (JPK Instruments, Berlin, Germany). This module enables a long-range vertical displacement of the stage up to 100 µm which makes force spectroscopy measurements possible including cell-cell interactions. In parallel, a vertical piezotranslator (PIFOC, Physik Instrumente, Karlsruhe, Germany) is mounted on the microscope objective to move the objective concurrently with the microscope stage and focus on cells while carrying out AFM measurements. All the measurements were carried out at 37°C using the Petri Dish Heater (JPK Instruments, Berlin, Germany).
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2

Adhesion Force Analysis via AFM

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Acquisition of adhesion data was performed using a NanoWizard II AFM (JPK Instruments, UK) employing a CellHesion module (JPK Instruments, UK), operating in force spectroscopy mode at 18°C. The sample and cantilever were immersed in acidic and alkaline aqueous solutions, contained within a clean glass Petri dish. The solutions were manufactured using dH2O and pH adjusted with NaOH 0.01 M or HCl 0.01 M, to achieve solutions of pH 3, 5, 7 and 9. The samples were immobilised using a double-sided Shintron adhesive tape (Agar Scientific, UK).
The vertical deflection and z-axis displacement data were recorded at a frequency of 10 kHz. A grid of 100 force-displacement curves was acquired for each sample/liquid combination, equally spaced over an area of 100 μm × 100 μm. The force-displacement data were analysed using JPK Data Processing software (JPK Instruments, UK).
A schematic of the measured forces is shown in Fig. 1. The out-of-contact repulsion force (Frep) was measured in the first peak from right to left of the approaching curve, the height of the triangle that was formed in the peak from the origin to the highest part of the peak until the signal was stable in the approach curve was measured as the force. The jump to force (FJT) was measured in the minimum point of the approach curve, and the pull-off force (FPO) was measured in the minimum point of the retract curve.
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3

Cell Surface Stiffness Measurement Using AFM

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Cell surface stiffness was examined by indentation assay using an AFM cantilever as described previously55 (link), 56 (link). Briefly, force probe was prepared by attaching a glass bead (ca. 100 μm diameter) to a tipless silicon cantilever (450 μm long, 50 μm wide, 2 μm thick; nominal spring constant 0.02 N/m; TL-CONT, Nanosensors) using two component Araldite epoxy glue. The cells were set on a plastic culture dish, and pressed from the apical side with a force of 20 nN (the approach and retraction speeds were set to 1.0 μm/s) by the force probe. The measurement using a contact mode was carried out with the Nano-Wizard system with the Cell-Hesion module (JPK), and the data analysis was done with the JPK data processing software (JPK Instruments), where the cell elasticity (Young’s modulus) in the apical region was estimated from a force–distance curve using the Hertz model. The cells were cultured in Leibovitz’s L-15 medium (Thermo Fisher). Nocodazole treatments were given for 60 min at 37 °C before the measurements. All measurements were performed at room temperature.
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4

Measuring Cell-Substrate Adhesion Forces

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AFM-based SCFS experiments were performed using a NanoWizard II AFM (JPK) incorporating a JPK CellHesion module with an extended vertical pulling range of 100 μm. All measurements were performed at room temperature using tipless V-shaped cantilevers with a nominal spring constant of 0.06 N m−1 (NP-O, Bruker). To facilitate cell capture, cantilevers were functionalized with concanavalin A44 (link). A single-cell suspension was prepared from dissociated CNC explants as described above and pipetted into a plastic tissue culture Petri dish functionalized with fibronectin and containing 2 ml pond water. The spring constant of the cantilever was determined in situ using the thermal noise method45 . A single cell was then immobilized on the cantilever by approaching the cell with a contact force of 0.5 nN for 3 s. After a recovery period of 5–10 min, SCFS measurements were performed using a 1.5-nN contact force, a 5 μm per second approach and retract speed and a contact time ranging from 5 to 120 s. Usually several force curve per contact time and cell were recorded. The cell–substrate contact position was changed after each force cycle. Maximum detachment forces were extracted from the recorded force curves using the JPK IP software.
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5

Cell Adhesion and Elasticity Measurements

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AFM-indentation and SCFS measurements were performed on cells deriving from different patients (n = 3) and cells were generally used at passage 2. SCFS and nanoindentation measurements were performed using a NanoWizard AFM (JPK Instruments, Berlin, Germany) mounted on top of an Axiovert 200 inverted microscope (Carl Zeiss, Jena, Germany). SCFS was performed using a CellHesion module (JPK Instruments, Berlin, Germany) that enables to extend the vertical range of the AFM from 15 µm up to 100 µm to enable complete cell detachment from substrate. All experiments were performed at 37°C using a temperature-controlled BioCell chamber (JPK Instruments, Berlin, Germany). Details about cell adhesion and elasticity measurements are reported in supporting information (File S1).
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6

Cell Mechanics Characterization with Photothermal Cantilevers

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The device combining the photothermal actuation of microcantilevers and optical microscopy was used as described15 (link). The device was supplemented with a z-piezo stage (CellHesion® module, JPK Instruments), which allowed precisely confining the cell between both cantilevers. The lower, slave cantilever bearing chip was fixed with vacuum grease onto a CNC milled peek wedge with a 10° angle and dimensions of 3.30 × 3.00 × 0.75 mm3 (W × L × H). The angled wedge allowed the readout laser to be reflected from the slave cantilever into the photodiode. The wedge was fixed with vacuum grease to a Petri dish. The device was combined with an inverted optical microscope (Zeiss, Axio Observer) equipped with a OrcaFlash 4.0 camera (Hamamatsu) and a 20x plan apochromat objective with a 0.8 NA (Zeiss). All experiments were conducted in a controlled environmental system16 (link) to maintain cell culture conditions, temperature control (37.0 °C), and pH adjustment using a humidified gas mixture based on synthetic air containing 5% CO2.
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7

Single-Cell Force Spectroscopy with AFM

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For SCFS both a NanoWizard II AFM equipped with the CellHesion module and a CellHesion 200 (both JPK Instruments) mounted on inverted microscopes (Observer. Z, Zeiss) were used. During SCFS cells were maintained at 37°C using a Petri dish heater (JPK Instruments) or temperature controlled (Life Imaging Services) incubator box. 200 μm long tip-less V-shaped silicon nitride cantilevers having nominal spring constants of 0.06 N/m (NP-0, Bruker) were used. Cantilever spring constants were determined using the equipartition theorem79 .
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8

Measuring Cell Height and Nuclear Compression

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An AFM (CellHesion module; JPK Instruments) mounted on an optical microscope (Olympus) was used to perform single cell height measurement (Fig EV1H) and nuclear compression (Fig EV2). Experiments were conducted at 37°C using the Petri Dish Heater system and DMEM medium buffered with 20 mM HEPES and complemented with 1% FBS. Tipless cantilevers (arrow‐TL1‐50) with a nominal force constant of 0.03 N/m were used and calibrated using the thermal noise method. To measure cell height, MRC‐5 was cultured on soft (1 kPa) and stiff (50 kPa) collagen‐coated substrate for 24 h. Following an approach on the adjacent surface, the cantilever was positioned over the cell to measure the height delta. For nuclear compression (Fig EV2), cells were plated on 35‐mm dish from ibidi (gridded surface). After positioning the cantilever above the nucleus, constant height mode was used (target height of 3 μm below the surface) and maintained for 120 min.
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9

Characterizing Pseudomonas fluorescens Biofilms

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Pseudomonas fluorescens NCIMB 9046 biofilms were prepared and their morphology characterised using confocal laser scanning microscopy, as described in Fig. 2. Insert Fig. 2 The biofilm was covered with tryptone soy medium during force measurements. A NanoWizard II atomic force microscope with CellHesion module (JPK Instruments) was used to generate approach and retraction force-distance curves for each probe type. For each probe two biofilms were tested, each at 6 different positions.
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