Xl30 esem feg environmental scanning electron microscope
The XL30 ESEM-FEG is an Environmental Scanning Electron Microscope manufactured by Philips. It is designed to observe samples in their natural state without the need for extensive sample preparation. The XL30 ESEM-FEG utilizes a field emission gun (FEG) as the source of electrons, providing high resolution imaging capabilities.
3 protocols using xl30 esem feg environmental scanning electron microscope
Characterizing Nanoparticle Formulations by DLS and Microscopy
Scanning Electron Microscopy of Biofilms
Characterization of Ni(II) Solutions
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