240c elemental analyzer

All reagents are analytically pure grade in the experiment and are not further purified for use. Thermogravimetric analysis was measured on a NETZSCH STA 449 F5 Jupiter TGA analyzer (Selb, Germany) using an empty Al₂O₃ crucible as the standard. Measuring temperature ranges from 25 to 800 °C with a heating rate of 10 °C min⁻¹ under N₂ atmosphere. Powder X-ray diffraction patterns of the title complex were obtained using a Shimadzu XRD-6000 X-ray diffractometer (Kyoto, Japan) with Cu-Kα (λ = 1.5418 Å) radiation at room temperature and 2θ ranging from 5° to 50°. Perkin Elmer (Waltham, MA, USA) 240C elemental analyzer was used to obtain elemental analyses of complex 1. Infrared spectra were obtained on a Bruker VERTEX 80 spectrometer (Billerica, MA, USA) in the 4000–400 cm⁻¹ region. Fluorescence data were collected on the Perkin Elmer LS55 Fluorescence Spectrophotometer.

Using the Nexus 870 FT-IR spectrometer, IR spectroscopy was performed with KBr particles in the range of 400–4000 cm⁻¹. The elemental analyses of C, H, and N were recorded on a PerkinElmer 240C elemental analyzer. TGA was measured from 30 to 800 °C on a NETZSCH STA 449F3 analyzer at a heating rate of 5 °C min⁻¹ under a N₂ atmosphere. The ac magnetic susceptibility data were collected using a MPMS-XL7 Squid magnetometer (test conditions: H_ac = 5 Oe, H_dc = 0 Oe, frequencies ranging from 1 to 1488 Hz). The dc magnetic susceptibility data were measured in the temperature range of 1.8–300 K. The experimental susceptibilities were corrected for the diamagnetism of the samples as estimated from Pascal's tables^31d and the sample holder by a previous calibration. Pulsed-high-field magnetization measurements were performed at 1.9 K using a home-made pulsed field up to 30 T at the Wuhan National High Magnetic Field Center, P. R. China. The sweeping rate for the magnetic field was 5.0 kT s⁻¹ on an average. The low-field magnetization data (on SQUID) were used to calibrate the high-field magnetization curve, which is a standard way to process the high field magnetization data.^31e

All reagents and solvents employed for this synthesis were purchased from commercial sources and used as received without further purification. The elemental analyses (C, H, and N) were determined with a PerkinElmer 240C elemental analyzer. Infrared spectra were recorded with a Varian 640 FT-IR spectrometer over the range of 500–4000 cm⁻¹ with the use of KBr pellets as sample matrices. Powder X-ray diffraction (PXRD) data was collected using a Rigaku diffractometer with Cu Kα radiation. Thermogravimetric analysis (TGA) measurements were performed with a METTLER TOLEDO thermal analyzer at a heating rate of 5 °C min⁻¹ under a N₂ atmosphere. The morphology and structure of the sample was characterized via scanning electron microscopy (SEM, Nova Nano SEM 430) and high resolution transmission electron microscopy (HRTEM, JEOL 2010 at 200 kV). The specific surface area and pore structure of the sample was investigated with an automatic volumetric sorption analyzer (ASAP 2020 M) using N₂ as the adsorbate at −196 °C. X-ray photoelectron spectroscopy (XPS) was performed using an Escalab 250 with an Al Kα radiation. UV-Vis absorption spectra were recorded with the use of an SP-1900 UV-Vis spectrophotometer.