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S 4000 fe sem

Manufactured by Hitachi
Sourced in Italy

The S-4000 FE-SEM is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. The S-4000 FE-SEM is designed for high-resolution imaging and analysis of a wide range of materials, including semiconductors, metals, ceramics, and biological samples. The instrument features a field emission electron gun, which provides high-brightness and high-resolution electron beams for imaging and analysis.

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8 protocols using s 4000 fe sem

1

Ultrastructural Bone Marrow Analysis

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Samples were fixed immediately upon recovery in 2.5% glutaraldehyde in PBS at 4°C for 48 h, then immersed in a 3% hydrogen peroxide solution for 48 h at room temperature (for bone marrow removal), and then rinsed with distilled water. Samples were then sonicated in a sonic device [13 ] in distilled water at room temperature, rinsed with distilled water, and dehydrated in acetone series. Samples were finally dried using a critical point dryer (Emitech K850, Emitech, Corato, Italy), mounted on aluminum stubs, platinum coated using an Emitech K 550 sputter coater (Emitech, Corato, Italy), and observed by a Hitachi FE SEM S 4000 operating at 7 kV. SEM micrographs were acquired with a DISS5 Digital Image Scanning System (point electronic, Germany).
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2

Scanning Electron Microscopy of Bone

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Samples were fixed immediately upon recovery in 2.5% glutaraldehyde in PBS at 4°C for 48 h; then, they were gently sonicated in an ultrasonic device (to remove excess of keratinizing squamous epithelium that would have prevented surface observation). Fifteen samples were prepared for SEM (as previously described for femur neck) and sputter coated with platinum using an Emitech K 550 sputter coater (Emitech, Corato, Italy). Observations were conducted by a Hitachi FE SEM S 4000 operating at 7 kV and by a Hitachi SU 3500 (Hitachi High-Technologies Europe GmbH, Mannheim, Germany), at 10 kV in SE mode.
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3

SEM Analysis of Sterilized Disc Surfaces

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Scanning electron microscopy (SEM) was performed to evaluate the surface structure of sterilized and control discs. Briefly, samples were fixed in 2.5% glutaraldehyde (Sigma-Aldrich, St. Louis, MO) and treated with 1% osmium tetroxide. They were washed and dehydrated in progressive EtOH solutions (25, 50, 75, 3× 100%). Samples were CO2 critical point dried (Autosamdri-815, Tousimis, Rockville, MD) and palladium gold sputtered (DeskV, Denton Vacuum, Moores-town, NJ). Images were collected using a Hitachi S-4000 FE-SEM at 10 kV at 300× and 6000× magnification.
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4

Scanning Electron Microscopy Sample Preparation

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Samples were fixed in 2.5% glutaraldehyde, washed in PBS, fixed in 1% osmium tetroxide solution, and progressively dehydrated in 25%, 50%, 75%, 85%, 95%, and 3x100% ethanol solutions. Samples were then critical point dried, sputter coated with gold/palladium, and imaged using a Hitachi S-4000 FE-SEM at 10 kV.
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5

Characterizing Nanomaterials via Microscopy

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Surfaces were characterized via atomic force microscopy (AFM; VEECO Dimension 3100) and scanning electron microscopy (SEM; Hitachi S-4000 FE-SEM). Samples were sputter coated with a thin layer of gold palladium (AU-PD) with a Denton DeskV Sputter coater prior to SEM imaging. AFM micrographs were analyzed with Gwyddion 2.31, open-source scanning probe microscopy software [46 ] which provided the average roughness values. Ten, two-dimensional average roughness (Ra) profiles were randomly chosen from each micrograph and averaged for the reported Ra values. Nanofiber and nanotube widths (or feature widths) were measured from the SEM micrographs with ImageJ [47 (link)]. These values were compared to the average width of cortical neurites as measured using a 40× fluorescent image of a neural culture.
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6

Laser Micro-Ablation of SDS-Decellularized Discs

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In order to further investigate the effect of SDS treatment on LMA size and geometry, a separate cohort of native and decellularized discs (via 1% SDS, agitation) were lyophilized and laser micro-ablated using a range of pulse durations (0.3, 0.25, 0.2, 0.15, 0.1, 0.05; resulting energies 86.4, 72.0, 57.6, 43.2, 28.8, 14.4 mJ) with a 1000 μm centerline separation. Four images were acquired from the top, middle, and bottom regions of ablated pores (total of n=12). Ablation diameter was measured within the Axiovision software as described in the previous section. Scanning electron microscopy (SEM) was performed to evaluate the cross sectional geometry of the ablated channels obtained from a 0.2 sec pulse duration. Freeze dried samples were CO2 critical point dried (Autosamdri-815, Tousimis, Rockville, MD) and palladium gold sputtered (DeskV, Denton Vacuum, Moorestown, NJ). Images were collected using a Hitachi S-4000 FESEM at 10 kV at 30x magnification.
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7

FE-SEM Imaging of Sample Surface

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The samples were mounted on a sample stub, coated with a thin layer of Au/Pd to make the sample surface conductive, followed by examination in SEI (Secondary Electron Imaging) mode. SEI records the topographical features of the sample surface (Lu et al., 2016 (link)). The representative photomicrographs were digitally captured using Hitachi S-4000 FE-SEM at 100X magnification.
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8

Scanning Electron Microscopy Sample Prep

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Samples were fixed in 2.5% glutaraldehyde, washed in PBS, fixed in 1% osmium tetroxide solution, and progressively dehydrated in 25%, 50%, 75%, 85%, 95%, and 3 × 100% ethanol solutions. Samples were then critical point dried, sputter coated with gold/palladium, and imaged using a Hitachi S-4000 FE-SEM at 10 kV.
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