SEM images and EDX mapping analysis were obtained on the instrument of Leo 1550 Field Emission SEM carried with Bruker EDX detector. Rigaku X-Ray diffractometer and Bruker D8 General Area Detector Diffraction System were used to take XRD and 2D-XRD patterns, respectively. ATR-FTIR analysis was conducted on Thermo Scientific FTIR spectra. The chemistry information of SEI was tested on X-ray photoelectron spectroscopy SSX-100 (XPS). Galvanostatic lithium plating/plating and discharge/charge measurements were performed on Neware battery tester at room temperature. EIS was performed on Solartron from a frequency range from 50 HZ to 1 HZ at AC polarization of 10 mV. Cyclic voltammetry (used for characterizing the exchange current density) and Chronoamperometry test were performed on a CH 600E electrochemical workstation.
D8 general area detector diffraction system
Manufactured by Bruker
The D8 General Area Detector Diffraction System is a high-performance X-ray diffraction instrument designed for a wide range of applications. It features a large-area detector that allows for rapid data collection and analysis. The system is capable of providing detailed structural information about materials, making it a valuable tool for researchers and scientists working in the field of materials science and crystallography.
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2 protocols using d8 general area detector diffraction system
1
Comprehensive Characterization of Solid-Electrolyte Interphase
2
Multimodal Materials Characterization
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Field-emission SEM was carried out on the Zeiss Gemini 500 Scanning Electron Microscope. Linear sweep voltammetry and chronoamperometry were performed using a CH 600E electrochemical workstation. 2D XRD was performed on the Bruker D8 General Area Detector Diffraction System with a Cu Kα x-ray source.
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